HK1202620A1 - 系統及其方法 - Google Patents

系統及其方法

Info

Publication number
HK1202620A1
HK1202620A1 HK15102891.9A HK15102891A HK1202620A1 HK 1202620 A1 HK1202620 A1 HK 1202620A1 HK 15102891 A HK15102891 A HK 15102891A HK 1202620 A1 HK1202620 A1 HK 1202620A1
Authority
HK
Hong Kong
Prior art keywords
corresponding method
Prior art date
Application number
HK15102891.9A
Other languages
English (en)
Inventor
張麗陳志强黃清萍金鑫孫運達沈樂趙驥
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of HK1202620A1 publication Critical patent/HK1202620A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/226—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/08—Means for conveying samples received
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G06T11/005—Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10072—Tomographic images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pulmonology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
HK15102891.9A 2013-12-26 2015-03-23 系統及其方法 HK1202620A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310739803.4A CN104374783B (zh) 2013-12-26 2013-12-26 Ct系统及其方法

Publications (1)

Publication Number Publication Date
HK1202620A1 true HK1202620A1 (zh) 2015-10-02

Family

ID=52465144

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15102891.9A HK1202620A1 (zh) 2013-12-26 2015-03-23 系統及其方法

Country Status (13)

Country Link
US (1) US9746579B2 (zh)
EP (1) EP2889649B1 (zh)
JP (1) JP6305544B2 (zh)
CN (1) CN104374783B (zh)
AU (1) AU2014373004B2 (zh)
BR (1) BR112016014808B1 (zh)
CA (1) CA2935086C (zh)
ES (1) ES2749729T3 (zh)
HK (1) HK1202620A1 (zh)
IL (1) IL246344B (zh)
MY (1) MY187042A (zh)
SG (1) SG11201605156WA (zh)
WO (1) WO2015096784A1 (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104749648A (zh) 2013-12-27 2015-07-01 清华大学 多能谱静态ct设备
WO2017011057A2 (en) * 2015-04-27 2017-01-19 GREEN, Christopher, K. Four plane x-ray inspection system
CN106526686B (zh) * 2016-12-07 2019-05-07 同方威视技术股份有限公司 螺旋ct设备和三维图像重建方法
CN107450091B (zh) * 2017-07-25 2020-01-03 苏州德锐特成像技术有限公司 一种基于面阵相机芯片的电离辐射计量方法和装置
CN109343135B (zh) * 2018-10-31 2020-10-09 北京纳米维景科技有限公司 一种多级能量型静态安检ct系统及成像方法
AU2019373486A1 (en) * 2018-10-31 2021-06-17 Nanovision Technology (Beijing) Co., Ltd. Multi-energy static security ct system and imaging method
JP7266479B2 (ja) * 2019-07-04 2023-04-28 日本信号株式会社 検査装置
CN110706790B (zh) * 2019-09-29 2023-10-31 东软医疗系统股份有限公司 数据传输方法、装置及设备
CN113238298B (zh) * 2021-07-09 2022-03-04 同方威视技术股份有限公司 检查系统及方法
CN116095932B (zh) * 2021-11-05 2024-05-24 同方威视技术股份有限公司 成像系统中光机出束控制方法、装置、ct成像系统

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JPS62235633A (ja) * 1986-04-07 1987-10-15 Hitachi Medical Corp 画像出力装置
DE19749783A1 (de) * 1997-11-11 1999-05-12 Manfred Dr Ing Pfeiler Vorrichtung zur Stückgut-Röntgencomputertomographie
JP2000235007A (ja) 1999-02-15 2000-08-29 Hitachi Engineering & Services Co Ltd Ｘ線ｃｔスキャナ装置およびｘ線貨物検査方法
US7103137B2 (en) * 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
US7116751B2 (en) * 2003-04-02 2006-10-03 Reveal Imaging Technologies, Inc. System and method for resolving threats in automated explosives detection in baggage and other parcels
WO2005119297A2 (en) * 2004-05-27 2005-12-15 L-3 Communications Security And Detection Systems, Inc. Contraband detection systems using a large-angle cone beam ct system
CN100541187C (zh) * 2004-11-26 2009-09-16 同方威视技术股份有限公司 一种可ct断层扫描的集装箱检查系统
US7233644B1 (en) * 2004-11-30 2007-06-19 Ge Homeland Protection, Inc. Computed tomographic scanner using rastered x-ray tubes
JP4170305B2 (ja) * 2005-04-05 2008-10-22 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー 放射線撮影装置
KR101034753B1 (ko) * 2006-08-11 2011-05-17 아메리칸 사이언스 앤 엔지니어링, 인크. 동시에 발생하며 근접한 투과 및 후방 산란 영상화를 이용한 엑스레이 검사
US7616731B2 (en) * 2006-08-30 2009-11-10 General Electric Company Acquisition and reconstruction of projection data using a stationary CT geometry
GB0706089D0 (en) * 2007-03-29 2007-10-31 Durham Scient Crystals Ltd X-ray imaging of materials
CN101772324B (zh) * 2007-08-06 2012-01-11 株式会社日立医药 X射线ct装置
CN101470082B (zh) * 2007-12-27 2011-03-30 同方威视技术股份有限公司 物品检测装置及其检测方法
EP2265938A1 (de) * 2008-04-18 2010-12-29 Smiths Heimann Verfahren und vorrichtung zur detektion eines bestimmten materials in einem objekt mittels elektromagnetischer strahlen
CN201540263U (zh) * 2009-06-30 2010-08-04 同方威视技术股份有限公司 物品检查系统、dr成像装置和ct成像装置
CN102175697B (zh) * 2009-06-30 2014-05-14 同方威视技术股份有限公司 物品检查系统
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CN102379716A (zh) * 2011-08-24 2012-03-21 苏州生物医学工程技术研究所 一种静态ct扫描仪系统及其扫描方法
JP2013144038A (ja) * 2012-01-16 2013-07-25 Toshiba Corp Ｘ線ｃｔ装置
CN203705363U (zh) * 2013-12-26 2014-07-09 清华大学 Ct系统

Also Published As

Publication number Publication date
AU2014373004B2 (en) 2017-06-22
BR112016014808B1 (pt) 2020-11-10
AU2014373004A1 (en) 2016-07-14
EP2889649B1 (en) 2019-09-18
JP2017501414A (ja) 2017-01-12
IL246344B (en) 2021-05-31
CA2935086A1 (en) 2015-07-02
US20150185355A1 (en) 2015-07-02
CN104374783A (zh) 2015-02-25
EP2889649A1 (en) 2015-07-01
US9746579B2 (en) 2017-08-29
ES2749729T3 (es) 2020-03-23
MY187042A (en) 2021-08-27
WO2015096784A1 (zh) 2015-07-02
JP6305544B2 (ja) 2018-04-04
IL246344A0 (en) 2016-08-31
BR112016014808A2 (zh) 2018-07-17
CA2935086C (en) 2020-03-31
CN104374783B (zh) 2017-06-16
SG11201605156WA (en) 2016-07-28

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