HK1178689A1 - 用於像素中高動態範圍成像的系統和成像傳感器像素 - Google Patents
用於像素中高動態範圍成像的系統和成像傳感器像素Info
- Publication number
- HK1178689A1 HK1178689A1 HK13106243.7A HK13106243A HK1178689A1 HK 1178689 A1 HK1178689 A1 HK 1178689A1 HK 13106243 A HK13106243 A HK 13106243A HK 1178689 A1 HK1178689 A1 HK 1178689A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- pixel
- imaging
- dynamic range
- high dynamic
- imaging sensor
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
- H01L27/14616—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor characterised by the channel of the transistor, e.g. channel having a doping gradient
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/155,969 US8643132B2 (en) | 2011-06-08 | 2011-06-08 | In-pixel high dynamic range imaging |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1178689A1 true HK1178689A1 (zh) | 2013-09-13 |
Family
ID=47292445
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK13106243.7A HK1178689A1 (zh) | 2011-06-08 | 2013-05-27 | 用於像素中高動態範圍成像的系統和成像傳感器像素 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8643132B2 (zh) |
CN (1) | CN102820309B (zh) |
HK (1) | HK1178689A1 (zh) |
TW (1) | TWI504258B (zh) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013027524A1 (ja) * | 2011-08-24 | 2013-02-28 | シャープ株式会社 | 固体撮像素子 |
JP5814818B2 (ja) * | 2012-02-21 | 2015-11-17 | 株式会社日立製作所 | 固体撮像装置 |
US20140246561A1 (en) * | 2013-03-04 | 2014-09-04 | Omnivision Technologies, Inc. | High dynamic range pixel having a plurality of photodiodes with a single implant |
US9276031B2 (en) | 2013-03-04 | 2016-03-01 | Apple Inc. | Photodiode with different electric potential regions for image sensors |
US9741754B2 (en) | 2013-03-06 | 2017-08-22 | Apple Inc. | Charge transfer circuit with storage nodes in image sensors |
CN103440072A (zh) * | 2013-08-01 | 2013-12-11 | 合肥京东方光电科技有限公司 | 触摸点定位检测电路、光学式触摸屏及显示装置 |
US9473706B2 (en) * | 2013-12-09 | 2016-10-18 | Apple Inc. | Image sensor flicker detection |
US10285626B1 (en) | 2014-02-14 | 2019-05-14 | Apple Inc. | Activity identification using an optical heart rate monitor |
US9686485B2 (en) | 2014-05-30 | 2017-06-20 | Apple Inc. | Pixel binning in an image sensor |
CN104022133B (zh) * | 2014-06-10 | 2017-02-08 | 北京思比科微电子技术股份有限公司 | 漂浮节点具有可变电容的源像像素及图像传感器 |
CN104218073A (zh) * | 2014-09-22 | 2014-12-17 | 北京思比科微电子技术股份有限公司 | 高信号摆幅的图像传感器像素及其操作方法 |
US9406718B2 (en) * | 2014-09-29 | 2016-08-02 | Omnivision Technologies, Inc. | Image sensor pixel cell with non-destructive readout |
US9774802B2 (en) * | 2014-11-10 | 2017-09-26 | Raytheon Company | Method and apparatus for increasing pixel sensitivity and dynamic range |
US9456153B2 (en) * | 2015-01-18 | 2016-09-27 | Pixart Imaging (Penang) Sdn. Bhd. | Pixel image non-uniformity compensation method based on capacitance trimming and image sensor having pixels with variable capacitors for non-uniformity compensation |
FR3050596B1 (fr) * | 2016-04-26 | 2018-04-20 | New Imaging Technologies | Systeme imageur a deux capteurs |
CN109716525B (zh) | 2016-09-23 | 2020-06-09 | 苹果公司 | 堆叠式背面照明spad阵列 |
CN108024075B (zh) * | 2016-10-28 | 2019-10-11 | 原相科技股份有限公司 | 全局快门高动态范围像素及影像传感器 |
US10656251B1 (en) | 2017-01-25 | 2020-05-19 | Apple Inc. | Signal acquisition in a SPAD detector |
WO2018140522A2 (en) | 2017-01-25 | 2018-08-02 | Apple Inc. | Spad detector having modulated sensitivity |
US10962628B1 (en) | 2017-01-26 | 2021-03-30 | Apple Inc. | Spatial temporal weighting in a SPAD detector |
CN107147856B (zh) * | 2017-03-30 | 2019-11-22 | 深圳大学 | 一种像素单元及其去噪方法、动态视觉传感器、成像装置 |
JPWO2018185587A1 (ja) * | 2017-04-03 | 2020-02-13 | 株式会社半導体エネルギー研究所 | 撮像装置および電子機器 |
US10622538B2 (en) | 2017-07-18 | 2020-04-14 | Apple Inc. | Techniques for providing a haptic output and sensing a haptic input using a piezoelectric body |
US10440301B2 (en) | 2017-09-08 | 2019-10-08 | Apple Inc. | Image capture device, pixel, and method providing improved phase detection auto-focus performance |
US11011560B2 (en) * | 2017-12-26 | 2021-05-18 | Alexander Krymski | Image sensors, methods, and high dynamic range pixels with variable capacitance |
US10283558B1 (en) * | 2018-05-07 | 2019-05-07 | Omnivision Technologies, Inc. | Floating diffusion of image sensor with low leakage current |
US10848693B2 (en) | 2018-07-18 | 2020-11-24 | Apple Inc. | Image flare detection using asymmetric pixels |
US11019294B2 (en) | 2018-07-18 | 2021-05-25 | Apple Inc. | Seamless readout mode transitions in image sensors |
CN110233979B (zh) * | 2019-06-06 | 2021-11-19 | 锐芯微电子股份有限公司 | 图像传感器及其读出电路、像素结构 |
CN110769172A (zh) * | 2019-09-29 | 2020-02-07 | 炬佑智能科技(苏州)有限公司 | 一种cmos图像传感器像素电路及像素矩阵 |
US11563910B2 (en) | 2020-08-04 | 2023-01-24 | Apple Inc. | Image capture devices having phase detection auto-focus pixels |
CN114641981A (zh) * | 2020-12-15 | 2022-06-17 | 深圳市大疆创新科技有限公司 | 图像传感器及其控制方法、图像处理器、成像装置 |
US11546532B1 (en) | 2021-03-16 | 2023-01-03 | Apple Inc. | Dynamic correlated double sampling for noise rejection in image sensors |
US11742365B2 (en) | 2021-07-12 | 2023-08-29 | Omnivision Technologies, Inc. | High dynamic range image sensor having reduced crosstalk and jaggy |
KR20230041388A (ko) | 2021-09-17 | 2023-03-24 | 삼성전자주식회사 | 단위 픽셀, 이미지 센서 및 차량 |
US12069384B2 (en) | 2021-09-23 | 2024-08-20 | Apple Inc. | Image capture devices having phase detection auto-focus pixels |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2755135B2 (ja) * | 1993-11-25 | 1998-05-20 | 日本電気株式会社 | 可変容量装置および該可変容量装置を有する半導体集積回路装置 |
US6850278B1 (en) * | 1998-11-27 | 2005-02-01 | Canon Kabushiki Kaisha | Solid-state image pickup apparatus |
US6791383B2 (en) * | 2002-10-07 | 2004-09-14 | Texas Instruments Incorporated | Reduced gate leakage current in thin gate dielectric CMOS integrated circuits |
US7075049B2 (en) * | 2003-06-11 | 2006-07-11 | Micron Technology, Inc. | Dual conversion gain imagers |
US6780666B1 (en) * | 2003-08-07 | 2004-08-24 | Micron Technology, Inc. | Imager photo diode capacitor structure with reduced process variation sensitivity |
US7939873B2 (en) * | 2004-07-30 | 2011-05-10 | Semiconductor Energy Laboratory Co., Ltd. | Capacitor element and semiconductor device |
US20060103749A1 (en) | 2004-11-12 | 2006-05-18 | Xinping He | Image sensor and pixel that has switchable capacitance at the floating node |
JP5369505B2 (ja) * | 2008-06-09 | 2013-12-18 | ソニー株式会社 | 固体撮像装置、及び電子機器 |
EP2133918B1 (en) * | 2008-06-09 | 2015-01-28 | Sony Corporation | Solid-state imaging device, drive method thereof and electronic apparatus |
JP5369779B2 (ja) * | 2009-03-12 | 2013-12-18 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法および電子機器 |
-
2011
- 2011-06-08 US US13/155,969 patent/US8643132B2/en active Active
- 2011-12-06 TW TW100144933A patent/TWI504258B/zh active
-
2012
- 2012-05-29 CN CN201210171149.7A patent/CN102820309B/zh active Active
-
2013
- 2013-05-27 HK HK13106243.7A patent/HK1178689A1/zh unknown
Also Published As
Publication number | Publication date |
---|---|
CN102820309B (zh) | 2015-06-10 |
CN102820309A (zh) | 2012-12-12 |
TW201251454A (en) | 2012-12-16 |
US8643132B2 (en) | 2014-02-04 |
US20120313197A1 (en) | 2012-12-13 |
TWI504258B (zh) | 2015-10-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
HK1178689A1 (zh) | 用於像素中高動態範圍成像的系統和成像傳感器像素 | |
HK1207473A1 (zh) | 用於高動態範圍圖像傳感器的圖像傳感器像素 | |
IL236895B (en) | A digital imaging system in a low light environment with a monochromatic sensor with a wide dynamic range | |
EP2833623A4 (en) | IMAGE SENSOR, IMAGING METHOD AND DEVICE | |
IL212289A0 (en) | A detector pixel signal readout circuit and an imaging method thereof | |
HK1186572A1 (zh) | 圖像傳感器像素及其操作方法以及圖像傳感器 | |
EP2835965A4 (en) | IMAGING DEVICE AND IMAGE SENSOR | |
EP2752876A4 (en) | UNIT SPIXEL AND LIGHT RECEIVING ELEMENT FOR A PICTOR SENSOR | |
PL3627490T3 (pl) | Generowanie i przetwarzanie sygnału obrazu o wysokim zakresie dynamiki | |
EG27135A (en) | Using seismic sensor transfer functions for high fidelity seismic imaging | |
EP2590408A4 (en) | METHOD AND APPARATUS FOR IMAGE CALIBRATION | |
EP2533072A4 (en) | Pixel type two-dimensional image detector | |
EP2643680A4 (en) | OPTICAL SENSOR AND IMAGING DEVICE | |
EP2614527A4 (en) | IMAGE SENSOR AND IMAGE SENSOR | |
EP2569615A4 (en) | IMAGING WITH A WIDE DYNAMIC RANGE | |
LU91745B1 (en) | Range image pixel matching method | |
EP2642245A4 (en) | IMAGE CAPTURE DEVICE AND DISTANCE MEASUREMENT METHOD | |
EP2752877A4 (en) | UNIT SPIXEL AND LIGHT RECEIVING ELEMENT FOR A PICTOR SENSOR | |
EP2589217A4 (en) | HIGH DYNAMIC RANGE IMAGE SENSOR WITH PIXEL-INTEGRATED MEMORY | |
GB201021144D0 (en) | Improved image sensor arrangement | |
EP2770732A4 (en) | SOLID BODY SENSOR AND CAMERA SYSTEM | |
EP2681716A4 (en) | COLOR CALIBRATION METHOD FOR IMAGE CAPTURE DEVICE | |
HK1187412A1 (zh) | 具有圖像採集率優化的成像設備 | |
EP2629330A4 (en) | DISTANCE SENSOR AND DISTANCE IMAGE SENSOR | |
EP2434761A4 (en) | IMAGE CAPTURE DEVICE |