HK1175238A1 - Device and method for scanning ray bundles for backscatter imaging - Google Patents

Device and method for scanning ray bundles for backscatter imaging

Info

Publication number
HK1175238A1
HK1175238A1 HK12112967.0A HK12112967A HK1175238A1 HK 1175238 A1 HK1175238 A1 HK 1175238A1 HK 12112967 A HK12112967 A HK 12112967A HK 1175238 A1 HK1175238 A1 HK 1175238A1
Authority
HK
Hong Kong
Prior art keywords
ray bundles
scanning ray
backscatter imaging
backscatter
imaging
Prior art date
Application number
HK12112967.0A
Other languages
English (en)
Chinese (zh)
Inventor
麗涂 超唐 樂金穎康曹 碩丁光偉 陳志强李元景趙自然劉以農吳萬龍張
Original Assignee
同方威視技術股份有限公司
清華大學
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 同方威視技術股份有限公司, 清華大學 filed Critical 同方威視技術股份有限公司
Publication of HK1175238A1 publication Critical patent/HK1175238A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3301—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts beam is modified for scan, e.g. moving collimator

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Measurement Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
HK12112967.0A 2010-12-31 2012-12-14 Device and method for scanning ray bundles for backscatter imaging HK1175238A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201010624252.3A CN102565110B (zh) 2010-12-31 2010-12-31 一种背散射成像用射线束的扫描装置和方法

Publications (1)

Publication Number Publication Date
HK1175238A1 true HK1175238A1 (en) 2013-06-28

Family

ID=45638240

Family Applications (1)

Application Number Title Priority Date Filing Date
HK12112967.0A HK1175238A1 (en) 2010-12-31 2012-12-14 Device and method for scanning ray bundles for backscatter imaging

Country Status (13)

Country Link
US (1) US8983033B2 (ru)
EP (1) EP2573551B1 (ru)
JP (1) JP5696226B2 (ru)
KR (2) KR20140052932A (ru)
CN (1) CN102565110B (ru)
AU (1) AU2011349928B2 (ru)
BR (1) BR112013016361B1 (ru)
CA (1) CA2823121C (ru)
CL (1) CL2013001524A1 (ru)
HK (1) HK1175238A1 (ru)
RU (1) RU2532495C1 (ru)
UA (1) UA106938C2 (ru)
WO (1) WO2012088810A1 (ru)

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CN103776847B (zh) * 2012-10-24 2016-04-27 清华大学 射线发射装置和成像系统
CN103901491B (zh) 2012-12-27 2017-10-17 同方威视技术股份有限公司 人体背散射安检系统
CN103901487B (zh) * 2012-12-27 2017-11-21 同方威视技术股份有限公司 人体背散射安检系统及其方法
CN103901494B (zh) * 2012-12-27 2017-08-29 同方威视技术股份有限公司 人体背散射安检系统及其方法
CN104345350A (zh) 2013-07-23 2015-02-11 清华大学 人体安全检查方法和人体安全检查系统
CN104898173B (zh) * 2014-03-07 2018-03-23 北京君和信达科技有限公司 一种飞点形成装置及设计方法
TR201808932T4 (tr) * 2014-03-07 2018-07-23 Powerscan Co Ltd Uçan nokta şekillendirme aparatı.
CN104764759B (zh) * 2015-04-01 2017-11-21 中国原子能科学研究院 一种用于x射线背散射成像系统的跳线飞点扫描装置
CN105445303B (zh) * 2015-12-29 2019-02-19 清华大学 手持式背散射成像仪及其成像方法
US10714227B2 (en) * 2016-06-06 2020-07-14 Georgetown Rail Equipment Company Rotating radiation shutter collimator
CN108072891B (zh) * 2016-11-15 2024-02-27 台山核电合营有限公司 Ams探测器校验装置
CN106841249A (zh) * 2017-04-12 2017-06-13 北京君和信达科技有限公司 透射式辐射成像系统
CN107068225B (zh) * 2017-04-13 2023-09-22 云南电网有限责任公司电力科学研究院 一种x射线无损移动检测平台射线屏蔽装置
US10748740B2 (en) 2018-08-21 2020-08-18 Fei Company X-ray and particle shield for improved vacuum conductivity
CN113884520A (zh) * 2021-09-24 2022-01-04 中国原子能科学研究院 一种用于中子散射测试样品的储存测试装置
US11972920B2 (en) 2021-11-23 2024-04-30 Fei Company Vacuum compatible X-ray shield

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US4745631A (en) * 1982-12-27 1988-05-17 North American Philips Corp. Flying spot generator
DE3886334D1 (de) * 1987-10-05 1994-01-27 Philips Patentverwaltung Anordnung zur Untersuchung eines Körpers mit einer Strahlenquelle.
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US6272206B1 (en) * 1999-11-03 2001-08-07 Perkinelmer Detection Systems, Inc. Rotatable cylinder dual beam modulator
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
CN2645079Y (zh) * 2003-08-22 2004-09-29 貊大卫 一种反散射式x射线扫描仪
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CN101644687A (zh) * 2008-08-05 2010-02-10 同方威视技术股份有限公司 背散射成像用射线束扫描方法和装置
CN202013328U (zh) * 2010-12-31 2011-10-19 同方威视技术股份有限公司 一种背散射成像用射线束的扫描装置

Also Published As

Publication number Publication date
JP5696226B2 (ja) 2015-04-08
KR20150048916A (ko) 2015-05-07
BR112013016361B1 (pt) 2020-03-31
CN102565110B (zh) 2015-04-01
US20120170716A1 (en) 2012-07-05
EP2573551B1 (en) 2019-11-13
CN102565110A (zh) 2012-07-11
JP2014500507A (ja) 2014-01-09
CA2823121C (en) 2017-08-22
WO2012088810A1 (zh) 2012-07-05
KR101608884B1 (ko) 2016-04-04
RU2532495C1 (ru) 2014-11-10
US8983033B2 (en) 2015-03-17
CA2823121A1 (en) 2012-07-05
CL2013001524A1 (es) 2014-04-11
EP2573551A1 (en) 2013-03-27
UA106938C2 (uk) 2014-10-27
AU2011349928B2 (en) 2014-09-04
EP2573551A4 (en) 2014-04-23
BR112013016361A2 (pt) 2019-01-08
KR20140052932A (ko) 2014-05-07

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20211226