HK1131255A1 - - Google Patents

Info

Publication number
HK1131255A1
HK1131255A1 HK09109063.4A HK09109063A HK1131255A1 HK 1131255 A1 HK1131255 A1 HK 1131255A1 HK 09109063 A HK09109063 A HK 09109063A HK 1131255 A1 HK1131255 A1 HK 1131255A1
Authority
HK
Hong Kong
Application number
HK09109063.4A
Inventor
J Daniel Geist
Jeffrey Diep
Peter Williams
Charles W Perkins
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of HK1131255A1 publication Critical patent/HK1131255A1/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/30—Static spectrometers using magnetic analysers, e.g. Dempster spectrometer

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
HK09109063.4A 2006-02-15 2009-09-30 HK1131255A1 (xx)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/354,410 US7459677B2 (en) 2006-02-15 2006-02-15 Mass spectrometer for trace gas leak detection with suppression of undesired ions
PCT/US2007/003379 WO2007097919A2 (en) 2006-02-15 2007-02-08 Mass spectrometer for trace gas leak detection with suppression of undesired ions

Publications (1)

Publication Number Publication Date
HK1131255A1 true HK1131255A1 (xx) 2010-01-15

Family

ID=38294256

Family Applications (1)

Application Number Title Priority Date Filing Date
HK09109063.4A HK1131255A1 (xx) 2006-02-15 2009-09-30

Country Status (7)

Country Link
US (1) US7459677B2 (xx)
EP (1) EP1994545B1 (xx)
JP (1) JP2009527097A (xx)
CN (1) CN101405829B (xx)
HK (1) HK1131255A1 (xx)
MX (1) MX2008010498A (xx)
WO (1) WO2007097919A2 (xx)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7855361B2 (en) * 2008-05-30 2010-12-21 Varian, Inc. Detection of positive and negative ions
US8555704B2 (en) * 2008-10-20 2013-10-15 Agilent Technologies, Inc. Calibration systems and methods for tracer gas leak detection
FR2943173B1 (fr) * 2009-03-11 2016-03-18 Alcatel Lucent Cellule d'ionisation pour spectrometre de masse et detecteur de fuites correspondant
US8756978B2 (en) * 2010-04-09 2014-06-24 Inficon Gmbh Leak detector with optical tracer gas detection
RU2517985C2 (ru) * 2010-04-19 2014-06-10 ООО "Политест" Узел регистрации ионного тока в масс-спектрометрическом течеискателе
CN101866811B (zh) * 2010-05-28 2011-09-28 中国航天科技集团公司第五研究院第五一〇研究所 一种小型磁偏转质谱计离子源
US8692186B2 (en) 2010-08-10 2014-04-08 Wilco Ag Method and apparatus for leak testing containers
CN103123290B (zh) * 2012-12-28 2016-06-15 浙江跃岭股份有限公司 一种检测轮毂气密性的设备及其应用方法
WO2014164198A1 (en) * 2013-03-11 2014-10-09 David Rafferty Automatic gain control with defocusing lens
US8969794B2 (en) 2013-03-15 2015-03-03 1St Detect Corporation Mass dependent automatic gain control for mass spectrometer
CN108109898B (zh) * 2017-12-20 2020-02-21 南京华东电子真空材料有限公司 一种选择性抽气的溅射离子泵
GB2569800B (en) * 2017-12-22 2022-09-07 Thermo Fisher Scient Bremen Gmbh Method and device for crosstalk compensation

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3355587A (en) * 1951-01-28 1967-11-28 Jenckel Ludolf Gas analysis apparatus comprising plural ionization chambers with different ionizing electron beam energy levels in the chambers
US3247373A (en) * 1962-12-18 1966-04-19 Gca Corp Mass spectrometer leak detector with means for controlling the ion source output
GB1082820A (en) 1963-12-20 1967-09-13 Nat Res Corp Improved mass spectrometer
DE1648648C3 (de) 1967-04-12 1980-01-24 Arthur Pfeiffer-Hochvakuumtechnik Gmbh, 6330 Wetzlar Anordnung zur Lecksuche nach dem Massenspektrometer-Prinzip
US3591827A (en) 1967-11-29 1971-07-06 Andar Iti Inc Ion-pumped mass spectrometer leak detector apparatus and method and ion pump therefor
US3581195A (en) * 1968-06-10 1971-05-25 Varian Associates Detection of vacuum leaks by gas ionization method and apparatus providing decreased vacuum recovery time
US3690151A (en) 1968-07-25 1972-09-12 Norton Co Leak detector
US4499752A (en) 1983-06-22 1985-02-19 Varian Associates, Inc. Counterflow leak detector with cold trap
US4735084A (en) 1985-10-01 1988-04-05 Varian Associates, Inc. Method and apparatus for gross leak detection
FR2604522B1 (fr) 1986-09-26 1989-06-16 Cit Alcatel Installation de detection de fuite a gaz traceur et procede d'utilisation
US4845360A (en) 1987-12-10 1989-07-04 Varian Associates, Inc. Counterflow leak detector with high and low sensitivity operating modes
US5340983A (en) * 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
US5625141A (en) 1993-06-29 1997-04-29 Varian Associates, Inc. Sealed parts leak testing method and apparatus for helium spectrometer leak detection
DE4326265A1 (de) 1993-08-05 1995-02-09 Leybold Ag Testgasdetektor, vorzugsweise für Lecksuchgeräte, sowie Verfahren zum Betrieb eines Testgasdetektors dieser Art
US5451781A (en) * 1994-10-28 1995-09-19 Regents Of The University Of California Mini ion trap mass spectrometer
US5506412A (en) 1994-12-16 1996-04-09 Buttrill, Jr.; Sidney E. Means for reducing the contamination of mass spectrometer leak detection ion sources
DE19504278A1 (de) * 1995-02-09 1996-08-14 Leybold Ag Testgas-Lecksuchgerät
FR2734633B1 (fr) 1995-05-24 1997-06-20 Cit Alcatel Installation pour detecter la presence d'helium dans un circuit de fluide
US5600136A (en) * 1995-06-07 1997-02-04 Varian Associates, Inc. Single potential ion source
DE69617417T2 (de) * 1996-08-30 2002-08-08 Varian, Inc. Einfach-Potential Ionenquelle
FR2761776B1 (fr) 1997-04-03 1999-07-23 Alsthom Cge Alcatel Detecteur de fuite a gaz traceur
US6286362B1 (en) 1999-03-31 2001-09-11 Applied Materials, Inc. Dual mode leak detector
US6781117B1 (en) * 2002-05-30 2004-08-24 Ross C Willoughby Efficient direct current collision and reaction cell
CN2549462Y (zh) * 2002-07-08 2003-05-07 郭跃辉 一种宽量程氦质谱检漏仪
EP1602119A4 (en) * 2003-03-03 2010-05-12 Univ Brigham Young NOVEL ELECTROIONISATION SOURCE TO ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

Also Published As

Publication number Publication date
CN101405829B (zh) 2010-06-02
CN101405829A (zh) 2009-04-08
US7459677B2 (en) 2008-12-02
WO2007097919A2 (en) 2007-08-30
EP1994545A2 (en) 2008-11-26
JP2009527097A (ja) 2009-07-23
EP1994545B1 (en) 2014-04-16
MX2008010498A (es) 2008-10-17
WO2007097919A3 (en) 2008-07-24
US20070187586A1 (en) 2007-08-16

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20150208