HK1116245A1 - Device for optically measuring shapes of objects and surfaces - Google Patents

Device for optically measuring shapes of objects and surfaces

Info

Publication number
HK1116245A1
HK1116245A1 HK08106490.4A HK08106490A HK1116245A1 HK 1116245 A1 HK1116245 A1 HK 1116245A1 HK 08106490 A HK08106490 A HK 08106490A HK 1116245 A1 HK1116245 A1 HK 1116245A1
Authority
HK
Hong Kong
Prior art keywords
objects
optically measuring
measuring shapes
shapes
optically
Prior art date
Application number
HK08106490.4A
Other languages
English (en)
Inventor
Christoph Wagner
Original Assignee
Obe Ohnmacht & Baumgartner Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE200510013614 external-priority patent/DE102005013614A1/de
Application filed by Obe Ohnmacht & Baumgartner Gmbh filed Critical Obe Ohnmacht & Baumgartner Gmbh
Publication of HK1116245A1 publication Critical patent/HK1116245A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8812—Diffuse illumination, e.g. "sky"

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
HK08106490.4A 2005-03-24 2008-06-12 Device for optically measuring shapes of objects and surfaces HK1116245A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE200510013614 DE102005013614A1 (de) 2005-03-24 2005-03-24 Vorrichtung zur optischen Formerfassung von Gegenständen und Oberflächen
DE102005021896 2005-05-06
PCT/EP2006/002678 WO2006100077A1 (de) 2005-03-24 2006-03-23 Vorrichtung zur optischen formerfassung von gegenständen und oberflächen

Publications (1)

Publication Number Publication Date
HK1116245A1 true HK1116245A1 (en) 2008-12-19

Family

ID=36579152

Family Applications (1)

Application Number Title Priority Date Filing Date
HK08106490.4A HK1116245A1 (en) 2005-03-24 2008-06-12 Device for optically measuring shapes of objects and surfaces

Country Status (4)

Country Link
US (1) US7808644B2 (xx)
EP (1) EP1864081B1 (xx)
HK (1) HK1116245A1 (xx)
WO (1) WO2006100077A1 (xx)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008022292B4 (de) 2008-04-28 2014-07-10 OBE OHNMACHT & BAUMGäRTNER GMBH & CO. KG Vorrichtung und Verfahren zur Formerfassung und/oder zur Bestimmung des diffusen und/oder des gerichteten Reflexionsanteils eines Objekts
DE102008027393A1 (de) * 2008-06-06 2009-12-10 Isra Vision Ag Optische Überwachungseinrichtung
KR101067189B1 (ko) * 2009-09-07 2011-09-22 삼성전기주식회사 생체인증 장치
FR2951563A1 (fr) * 2009-10-16 2011-04-22 Logiparts Sa Procede et installation d'analyse de parametres geometriques d'un objet
DE102011001289B4 (de) * 2011-03-15 2013-05-29 Alfavision Gmbh & Co. Kg Vorrichtung zur optischen Erfassung von Prüfobjekten
DE102011117894A1 (de) 2011-11-04 2013-05-08 OBE OHNMACHT & BAUMGäRTNER GMBH & CO. KG Vorrichtung und Verfahren zur optischen Formerfassung von bewegten Gegenständen
EP2608174B1 (de) * 2011-12-20 2016-10-19 Siemens Schweiz AG Verfahren zur Erkennung eines Störobjektes in einem Streuvolumen eines optischen Brandmelders und optischer Brandmelder
FI125320B (en) 2012-01-05 2015-08-31 Helmee Imaging Oy ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS
US9291877B2 (en) 2012-11-15 2016-03-22 Og Technologies, Inc. Method and apparatus for uniformly focused ring light
JP6198312B2 (ja) * 2013-09-30 2017-09-20 Ｊｕｋｉオートメーションシステムズ株式会社 ３次元測定装置、３次元測定方法および基板の製造方法
US10378892B2 (en) * 2014-04-21 2019-08-13 Lockheed Martin Corporation System and method for inspecting surface flushness
MX364011B (es) * 2014-05-05 2019-04-11 Arconic Inc Aparato y metodo de medicion de soldadura.
DE102016106535B4 (de) * 2016-04-08 2019-03-07 Carl Zeiss Ag Vorrichtung und Verfahren zum Vermessen einer Flächentopografie
EP3236198B1 (de) 2016-04-18 2021-03-10 VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH Schaltbare linienbeleuchtung
US10921118B2 (en) 2016-07-27 2021-02-16 Vehicle Service Group, Llc Hybrid 3D optical scanning system
AT521004B1 (de) * 2017-11-30 2022-10-15 Henn Gmbh & Co Kg Verfahren zur Positionierung von Messstellen an einem bewegten Gegenstand
DE102017221649A1 (de) 2017-12-01 2019-06-06 Volkswagen Aktiengesellschaft Prüfverfahren zur Detektion von Oberflächenfehlern auf matten und glänzenden Flächen und zugehörige Vorrichtung sowie Prüfanordnung zwischen Vorrichtung und Bauteil
WO2019147390A2 (en) 2018-01-26 2019-08-01 Vehicle Hail Scan Systems, Llc Vehicle surface scanning system
US11574395B2 (en) 2020-11-25 2023-02-07 Vehicle Service Group, Llc Damage detection using machine learning

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60159637A (ja) * 1984-01-31 1985-08-21 Kirin Brewery Co Ltd 欠陥検出方法および装置
JPH02216134A (ja) 1989-02-17 1990-08-29 Hajime Sangyo Kk 撮影装置
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
DE4413832C2 (de) 1994-04-20 2000-05-31 Siemens Ag Vorrichtungen zur Kontrolle von Halbleiterscheiben
US5598265A (en) * 1995-04-06 1997-01-28 Zygo Corporation Method for profiling an object surface using a large equivalent wavelength and system therefor
GB9515311D0 (en) * 1995-07-26 1995-09-20 3D Scanners Ltd Stripe scanners and methods of scanning
JPH0961363A (ja) * 1995-08-29 1997-03-07 Bridgestone Sports Co Ltd ゴルフボールの外観検査方法及び該検査方法に用いる照明装置
DE19643287A1 (de) * 1996-10-21 1998-04-23 Leica Ag Verfahren und Vorrichtung zur Kalibrierung von Entfernungsmeßgeräten
GB9826802D0 (en) * 1998-12-04 1999-01-27 Vdrs Limited Vehicle inspection system
FR2806478B1 (fr) * 2000-03-14 2002-05-10 Optomachines Dispositif et procede de controle optique de pieces de vaisselle comme des assiettes emaillees ou tout produit ceramique emaille
DE10217068B4 (de) 2002-04-17 2005-09-15 Michael Dr.-Ing. Gandyra Verfahren zum optischen Messen der Form reflektierender und streuender Freiformflächen
EP1567827B1 (de) * 2002-11-29 2012-07-25 OBE Ohnmacht & Baumgärtner GmbH & Co. KG Verfahren und vorrichtung zur optischen formvermessung und/oder beurteilung
DE10312051A1 (de) * 2003-03-18 2004-09-30 Vitronic Dr.-Ing. Stein Bildverarbeitungssysteme Gmbh Mantelflächensensor sowie Abbildungsoptik hierfür

Also Published As

Publication number Publication date
EP1864081A1 (de) 2007-12-12
US20080137088A1 (en) 2008-06-12
EP1864081B1 (de) 2014-05-07
WO2006100077A1 (de) 2006-09-28
US7808644B2 (en) 2010-10-05

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