HK1114417A1 - Dimension measuring instrument and height gauge comprising such an instrument - Google Patents

Dimension measuring instrument and height gauge comprising such an instrument

Info

Publication number
HK1114417A1
HK1114417A1 HK08104384.8A HK08104384A HK1114417A1 HK 1114417 A1 HK1114417 A1 HK 1114417A1 HK 08104384 A HK08104384 A HK 08104384A HK 1114417 A1 HK1114417 A1 HK 1114417A1
Authority
HK
Hong Kong
Prior art keywords
instrument
dimension measuring
height gauge
measuring instrument
gauge
Prior art date
Application number
HK08104384.8A
Other languages
English (en)
Inventor
Adriano Zanier
Original Assignee
Tesa Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tesa Sa filed Critical Tesa Sa
Publication of HK1114417A1 publication Critical patent/HK1114417A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
    • G01B5/061—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness height gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
HK08104384.8A 2006-04-19 2008-04-18 Dimension measuring instrument and height gauge comprising such an instrument HK1114417A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06112762A EP1847798B1 (fr) 2006-04-19 2006-04-19 Instrument de mesure de dimensions et colonne de mesure verticale comprenant un tel instrument

Publications (1)

Publication Number Publication Date
HK1114417A1 true HK1114417A1 (en) 2008-10-31

Family

ID=36571931

Family Applications (1)

Application Number Title Priority Date Filing Date
HK08104384.8A HK1114417A1 (en) 2006-04-19 2008-04-18 Dimension measuring instrument and height gauge comprising such an instrument

Country Status (6)

Country Link
US (1) US7434331B2 (xx)
EP (1) EP1847798B1 (xx)
JP (1) JP5414155B2 (xx)
CN (1) CN101059328B (xx)
DE (1) DE602006009625D1 (xx)
HK (1) HK1114417A1 (xx)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007119253A1 (en) * 2006-04-18 2007-10-25 Hexagon Metrology S.P.A. Horizontal-arm coordinate measuring machine
EP2251634B1 (fr) * 2009-05-13 2018-11-28 Tesa Sa Instrument de mesure de dimension consistant en une colonne de mesure verticale
CN103234505A (zh) * 2013-04-28 2013-08-07 苏州工业园区高登威科技有限公司 角度测量装置
RU2551487C1 (ru) * 2014-02-12 2015-05-27 Открытое акционерное общество "Научно-исследовательский машиностроительный институт" (ОАО "НИМИ) Способ измерения линейного размера детали
CN103940399A (zh) * 2014-04-29 2014-07-23 康代影像科技(苏州)有限公司 一种测量垂直度和水平度用治具
US9933248B2 (en) * 2016-07-20 2018-04-03 Tesa Sa Height gauge
WO2018076037A1 (en) * 2016-10-27 2018-05-03 Omicron Persei 8 Enterprises Pty Ltd As Trustee Of The Omicron Persei 8 Enterprises Trust An improved gauge system
US10274308B2 (en) 2017-04-18 2019-04-30 United Technologies Corporation Precision optical height gauge
CN108759620A (zh) * 2018-05-21 2018-11-06 中信戴卡股份有限公司 一种高度差检具
CN112033367B (zh) * 2020-09-02 2021-04-27 广东仲达房屋安全检测鉴定有限公司 一种建筑水平度以及垂直度测量装置
CN114871280B (zh) * 2021-05-31 2024-05-07 河南济源钢铁(集团)有限公司 一种高端弹簧钢轧制尺寸的检测组件
JP1717007S (ja) * 2021-10-14 2022-06-09 ハイトゲージ
JP1717008S (ja) * 2021-10-14 2022-06-09 ハイトゲージ

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH668123A5 (de) 1985-11-12 1988-11-30 Hans Meyer Geraet zur messung von hoehenabstaenden.
CH667726A5 (fr) * 1986-04-30 1988-10-31 Tesa Sa Dispositif de palpage pour un appareil autonome de mesure de grandeurs lineaires.
DE3719509A1 (de) * 1987-06-11 1988-12-22 Mauser Werke Oberndorf Hoehenmessgeraet
CH680385A5 (xx) * 1989-10-04 1992-08-14 Hans Meyer
CH687163A5 (fr) * 1992-07-16 1996-09-30 Tesa Sa Appareil de mesure de grandeurs linéaires.
US5979070A (en) * 1997-12-19 1999-11-09 Lau; Kam C. Method and apparatus for selectively locking a movement direction of a coordinate measurement probe
US6401352B1 (en) * 1999-10-01 2002-06-11 Mitutoyo Corporation Linear measuring machine
JP3423650B2 (ja) * 1999-10-01 2003-07-07 株式会社ミツトヨ 一次元測定機
DE69932054D1 (de) * 1999-10-30 2006-08-03 Schnyder & Cie Sa Koordinatenmessgerät mit Taststift
EP1319921B1 (fr) * 2001-12-12 2006-03-29 Tesa Sa Colonne de mesure d'une dimension longitudinale
EP1319924B2 (fr) 2001-12-12 2012-04-11 Tesa Sa Appareil de mesure d'altitude
US20060191154A1 (en) * 2004-08-27 2006-08-31 Thilo Kraemer Method for measuring the thickness and/or length of objects and devices for this purpose
EP1666832B1 (fr) * 2004-12-01 2012-08-29 Tesa Sa Tête de mesure orientable motorisée
DE202006006323U1 (de) * 2006-04-19 2006-06-22 Tesa Sa Vertikales Längenmessgerät

Also Published As

Publication number Publication date
JP2007286063A (ja) 2007-11-01
US20070245586A1 (en) 2007-10-25
CN101059328A (zh) 2007-10-24
EP1847798B1 (fr) 2009-10-07
DE602006009625D1 (de) 2009-11-19
US7434331B2 (en) 2008-10-14
EP1847798A1 (fr) 2007-10-24
CN101059328B (zh) 2011-07-27
JP5414155B2 (ja) 2014-02-12

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20150131