HK1105020A1 - Method for calibrating the geometry of a multi-axis metrology system - Google Patents

Method for calibrating the geometry of a multi-axis metrology system

Info

Publication number
HK1105020A1
HK1105020A1 HK07113381.3A HK07113381A HK1105020A1 HK 1105020 A1 HK1105020 A1 HK 1105020A1 HK 07113381 A HK07113381 A HK 07113381A HK 1105020 A1 HK1105020 A1 HK 1105020A1
Authority
HK
Hong Kong
Prior art keywords
calibrating
geometry
metrology system
axis metrology
axis
Prior art date
Application number
HK07113381.3A
Other languages
English (en)
Inventor
Paul Murphy
Jon Fleig
Greg Forbes
Original Assignee
Qed Technologies International
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qed Technologies International filed Critical Qed Technologies International
Publication of HK1105020A1 publication Critical patent/HK1105020A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C9/00—Measuring inclination, e.g. by clinometers, by levels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/22—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring existing or desired position of tool or work
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/248—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods
    • B23Q17/2495—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interferometers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
HK07113381.3A 2003-12-22 2007-12-06 Method for calibrating the geometry of a multi-axis metrology system HK1105020A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/743,840 US7173691B2 (en) 2003-12-22 2003-12-22 Method for calibrating the geometry of a multi-axis metrology system
PCT/US2004/038902 WO2005065091A2 (en) 2003-12-22 2004-11-18 Method for calibrating the geometry of a multi-axis metrology system

Publications (1)

Publication Number Publication Date
HK1105020A1 true HK1105020A1 (en) 2008-02-01

Family

ID=34678709

Family Applications (1)

Application Number Title Priority Date Filing Date
HK07113381.3A HK1105020A1 (en) 2003-12-22 2007-12-06 Method for calibrating the geometry of a multi-axis metrology system

Country Status (7)

Country Link
US (1) US7173691B2 (ko)
EP (1) EP1734914B1 (ko)
JP (1) JP4732362B2 (ko)
KR (1) KR101119699B1 (ko)
CN (4) CN101975561B (ko)
HK (1) HK1105020A1 (ko)
WO (1) WO2005065091A2 (ko)

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US7445335B2 (en) * 2006-01-20 2008-11-04 Clarity Medical Systems, Inc. Sequential wavefront sensor
US8820929B2 (en) 2006-01-20 2014-09-02 Clarity Medical Systems, Inc. Real-time measurement/display/record/playback of wavefront data for use in vision correction procedures
US8777413B2 (en) 2006-01-20 2014-07-15 Clarity Medical Systems, Inc. Ophthalmic wavefront sensor operating in parallel sampling and lock-in detection mode
US9101292B2 (en) 2006-01-20 2015-08-11 Clarity Medical Systems, Inc. Apparatus and method for operating a real time large dipoter range sequential wavefront sensor
US8100530B2 (en) * 2006-01-20 2012-01-24 Clarity Medical Systems, Inc. Optimizing vision correction procedures
US8356900B2 (en) 2006-01-20 2013-01-22 Clarity Medical Systems, Inc. Large diopter range real time sequential wavefront sensor
US7912572B2 (en) * 2007-09-20 2011-03-22 General Electric Company Calibration assembly for an inspection system
JP5783899B2 (ja) 2008-04-08 2015-09-24 キューイーディー・テクノロジーズ・インターナショナル・インコーポレーテッド 近ゼロサブ開口測定のスティッチング
US8207697B1 (en) 2008-09-18 2012-06-26 Daniel Reed Positioning work stop
US8401692B2 (en) 2010-09-09 2013-03-19 Flow International Corporation System and method for tool testing and alignment
CN102322817B (zh) * 2011-06-13 2013-06-19 中国科学院长春光学精密机械与物理研究所 一种使用菲索干涉仪检测被测元件的快速自动调整的方法
CN102305606A (zh) * 2011-07-21 2012-01-04 中信重工机械股份有限公司 一种同轴度检测大直径圆柱面的方法
TWI470184B (zh) * 2011-08-20 2015-01-21 Tonta Electro Optical Co Ltd 表面輪廓偵測裝置及其對位方法以及全口徑量測資料的擷取方法
DE102012205599A1 (de) * 2012-04-04 2013-10-10 Carl Zeiss Industrielle Messtechnik Gmbh Reduzieren von Fehlern einer Drehvorrichtung bei der Bestimmung von Koordinaten eines Werkstücks oder bei der Bearbeitung eines Werkstücks
KR101369178B1 (ko) * 2012-05-31 2014-03-04 주식회사화신 페달의 변위 측정장치
US9857780B1 (en) 2013-03-15 2018-01-02 Daniel Reed Positioning work stop
DE102013216093B4 (de) * 2013-08-14 2016-06-02 Carl Zeiss Industrielle Messtechnik Gmbh Reduzieren von Fehlern einer Drehvorrichtung, insbesondere für die Bestimmung von Koordinaten eines Werkstücks oder die Bearbeitung eines Werkstücks
DE102013219389A1 (de) * 2013-09-26 2015-03-26 Carl Zeiss Industrielle Messtechnik Gmbh Reduzierung von Fehlern einer Drehvorrichtung, die bei der Bestimmung von Koordinaten eines Werkstücks oder bei der Bearbeitung eines Werkstücks verwendet wird
JP6306724B2 (ja) * 2014-01-09 2018-04-04 ザイゴ コーポレーションＺｙｇｏ Ｃｏｒｐｏｒａｔｉｏｎ 非球面およびその他の非平坦面のトポグラフィの測定
US9956658B1 (en) 2015-03-20 2018-05-01 Daniel Reed Positioning work stop
CN105215479B (zh) * 2015-10-27 2018-01-12 湖北三峡职业技术学院 一种数控插齿机同步旋转轴误差补偿方法
EP3190379A1 (de) 2016-01-08 2017-07-12 SwissOptic AG Interferometrisches stitching-verfahren
DE102016210966A1 (de) * 2016-06-20 2017-12-21 Micro-Epsilon Optronic Gmbh Verfahren und Vorrichtung zur Vermessung einer gekrümmten Wellenfront mit mindestens einem Wellenfrontsensor
CN106826402B (zh) * 2016-07-25 2018-04-20 中国科学院长春光学精密机械与物理研究所 一种磁流变抛光轮对非球面光学元件进行对准加工方法
CN106767553B (zh) * 2016-11-24 2019-04-26 上海暄泓科学仪器有限公司 一种多光谱校准装置
TWI633522B (zh) * 2017-06-02 2018-08-21 國家中山科學研究院 Measuring and correcting compensation system and method for machine tool
EP3667443A1 (en) * 2018-12-14 2020-06-17 Agie Charmilles SA Method for the correction of axis motions
KR101993372B1 (ko) * 2019-03-22 2019-06-26 주식회사 삼승엔지니어링 검사용 다축 스테이지
CN109916304B (zh) * 2019-04-01 2021-02-02 易思维（杭州）科技有限公司 镜面/类镜面物体三维测量系统标定方法
KR102185141B1 (ko) * 2019-09-17 2020-12-01 이민열 툴 프리세터
US11442427B2 (en) * 2019-12-25 2022-09-13 National Chung-Shan Institute Of Science And Technology Multiaxis machining device and compensation method thereof
CN114812441B (zh) * 2022-02-22 2023-02-17 天津大学 一种齿轮相位角自补偿方法

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Also Published As

Publication number Publication date
EP1734914A4 (en) 2012-11-07
CN100520288C (zh) 2009-07-29
CN101975561B (zh) 2012-05-30
WO2005065091A3 (en) 2006-12-28
WO2005065091A2 (en) 2005-07-21
EP1734914B1 (en) 2015-04-29
CN102519399A (zh) 2012-06-27
CN102519399B (zh) 2015-05-20
CN101975561A (zh) 2011-02-16
US20050134851A1 (en) 2005-06-23
KR20060113967A (ko) 2006-11-03
CN101539413B (zh) 2011-05-04
JP4732362B2 (ja) 2011-07-27
JP2007515641A (ja) 2007-06-14
CN101539413A (zh) 2009-09-23
US7173691B2 (en) 2007-02-06
EP1734914A2 (en) 2006-12-27
CN101044370A (zh) 2007-09-26
KR101119699B1 (ko) 2012-03-19

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