HK1005001A1 - System and method for inspecting semiconducter wafers - Google Patents

System and method for inspecting semiconducter wafers

Info

Publication number
HK1005001A1
HK1005001A1 HK98104149A HK98104149A HK1005001A1 HK 1005001 A1 HK1005001 A1 HK 1005001A1 HK 98104149 A HK98104149 A HK 98104149A HK 98104149 A HK98104149 A HK 98104149A HK 1005001 A1 HK1005001 A1 HK 1005001A1
Authority
HK
Hong Kong
Prior art keywords
disc
semiconducter
inspecting
wafers
light reflection
Prior art date
Application number
HK98104149A
Other languages
English (en)
Inventor
Ernst Biedermann
Matthias Grieshop
El Mekki Manfred Ben
Kenneth Weisheit
Thomas Griebsch
Gerhard Ross
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of HK1005001A1 publication Critical patent/HK1005001A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/265—Contactless testing
    • G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK98104149A 1994-04-20 1998-05-13 System and method for inspecting semiconducter wafers HK1005001A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4413831A DE4413831C2 (de) 1994-04-20 1994-04-20 Verfahren zur Kontrolle von Halbleiterscheiben

Publications (1)

Publication Number Publication Date
HK1005001A1 true HK1005001A1 (en) 1998-12-18

Family

ID=6516016

Family Applications (1)

Application Number Title Priority Date Filing Date
HK98104149A HK1005001A1 (en) 1994-04-20 1998-05-13 System and method for inspecting semiconducter wafers

Country Status (7)

Country Link
US (1) US5742395A (xx)
EP (1) EP0678911B1 (xx)
JP (1) JP3577133B2 (xx)
KR (1) KR100333238B1 (xx)
AT (1) ATE212751T1 (xx)
DE (2) DE4413831C2 (xx)
HK (1) HK1005001A1 (xx)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6411377B1 (en) 1991-04-02 2002-06-25 Hitachi, Ltd. Optical apparatus for defect and particle size inspection
DE59608537D1 (de) * 1995-10-25 2002-02-07 Infineon Technologies Ag Verfahren zur Kontrolle von Scheiben
GB9613685D0 (en) * 1996-06-28 1996-08-28 Crosfield Electronics Ltd An illumination unit
US5965446A (en) * 1996-10-24 1999-10-12 Hamamatsu Photonics K.K. Method for placing fluorescent single molecules on surface of substrate and method for visualizing structural defect of surface of substrate
JP3981696B2 (ja) * 1998-07-28 2007-09-26 株式会社日立製作所 欠陥検査装置およびその方法
JP3904565B2 (ja) * 1998-07-28 2007-04-11 株式会社日立製作所 欠陥検査装置およびその方法
JP3566589B2 (ja) * 1998-07-28 2004-09-15 株式会社日立製作所 欠陥検査装置およびその方法
JP3904581B2 (ja) * 1998-07-28 2007-04-11 株式会社日立製作所 欠陥検査装置およびその方法
US7173648B1 (en) * 2000-04-21 2007-02-06 Advanced Micro Devices, Inc. System and method for visually monitoring a semiconductor processing system
KR100839915B1 (ko) * 2006-04-11 2008-06-19 아주하이텍(주) 광학 검사 시스템
US8726837B2 (en) * 2008-06-23 2014-05-20 Applied Materials, Inc. Semiconductor process chamber vision and monitoring system
US9110131B2 (en) * 2010-04-13 2015-08-18 Cascade Microtech, Inc. Method and device for contacting a row of contact areas with probe tips
CN110854035A (zh) * 2019-11-27 2020-02-28 上海华力微电子有限公司 晶圆边缘缺陷的检测方法及装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3337251A1 (de) * 1983-10-13 1985-04-25 Gerd Dipl.-Phys. Dr. 8520 Erlangen Häusler Optisches abtastverfahren zur dreidimensionalen vermessung von objekten
DE3484982D1 (de) * 1983-11-26 1991-10-02 Toshiba Kawasaki Kk Apparat zum nachweis von oberflaechenfehlern.
US4740708A (en) * 1987-01-06 1988-04-26 International Business Machines Corporation Semiconductor wafer surface inspection apparatus and method
JPH0682102B2 (ja) * 1987-02-27 1994-10-19 三菱電機株式会社 パターン欠陥検査装置及びパターン欠陥検査方法
JPH0671038B2 (ja) * 1987-03-31 1994-09-07 株式会社東芝 結晶欠陥認識処理方法
JP2604607B2 (ja) * 1987-12-09 1997-04-30 三井金属鉱業株式会社 欠陥分布測定法および装置
US5091963A (en) * 1988-05-02 1992-02-25 The Standard Oil Company Method and apparatus for inspecting surfaces for contrast variations
DE4003983C1 (en) * 1990-02-09 1991-08-29 Abos Automation, Bildverarbeitung, Optische Systeme Gmbh, 8057 Eching, De Automated monitoring of space=shape data for mfg. semiconductors - compares image signals for defined illumination angle range with master signals, to determine defects
DE4032327A1 (de) * 1990-10-11 1992-04-16 Abos Automation Bildverarbeitu Verfahren und vorrichtung zur automatisierten ueberwachung der herstellung von halbleiterbauteilen
JP2981941B2 (ja) * 1991-12-02 1999-11-22 株式会社新川 ボンデイングワイヤ検査装置
JPH06137839A (ja) * 1992-02-18 1994-05-20 Nec Corp リード曲り測定装置

Also Published As

Publication number Publication date
EP0678911A3 (de) 1996-04-17
ATE212751T1 (de) 2002-02-15
US5742395A (en) 1998-04-21
DE59510019D1 (de) 2002-03-14
KR950034646A (ko) 1995-12-28
DE4413831C2 (de) 2000-05-31
EP0678911A2 (de) 1995-10-25
EP0678911B1 (de) 2002-01-30
JP3577133B2 (ja) 2004-10-13
JPH07294449A (ja) 1995-11-10
KR100333238B1 (ko) 2002-09-27
DE4413831A1 (de) 1995-10-26

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20060420