HK1002840A1 - Method and device for phase measuring - Google Patents

Method and device for phase measuring

Info

Publication number
HK1002840A1
HK1002840A1 HK98101903A HK98101903A HK1002840A1 HK 1002840 A1 HK1002840 A1 HK 1002840A1 HK 98101903 A HK98101903 A HK 98101903A HK 98101903 A HK98101903 A HK 98101903A HK 1002840 A1 HK1002840 A1 HK 1002840A1
Authority
HK
Hong Kong
Prior art keywords
phase measuring
measuring
phase
Prior art date
Application number
HK98101903A
Other languages
English (en)
Inventor
Albrecht Rothermel
Original Assignee
Thomson Brandt Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Brandt Gmbh filed Critical Thomson Brandt Gmbh
Publication of HK1002840A1 publication Critical patent/HK1002840A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Manipulation Of Pulses (AREA)
  • Measuring Phase Differences (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
HK98101903A 1992-04-08 1998-03-09 Method and device for phase measuring HK1002840A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4211701A DE4211701A1 (de) 1992-04-08 1992-04-08 Verfahren und Vorrichtung zur Phasenmessung

Publications (1)

Publication Number Publication Date
HK1002840A1 true HK1002840A1 (en) 1998-09-18

Family

ID=6456327

Family Applications (1)

Application Number Title Priority Date Filing Date
HK98101903A HK1002840A1 (en) 1992-04-08 1998-03-09 Method and device for phase measuring

Country Status (6)

Country Link
US (1) US5412311A (xx)
EP (1) EP0564923B1 (xx)
JP (1) JP3699488B2 (xx)
DE (2) DE4211701A1 (xx)
ES (1) ES2108775T3 (xx)
HK (1) HK1002840A1 (xx)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5592519A (en) * 1994-06-22 1997-01-07 Alcatel Network Systems, Inc. Dual frequency clock recovery using common multitap line
US5689530A (en) * 1994-06-22 1997-11-18 Alcatel Network Systems, Inc. Data recovery circuit with large retime margin
DE19503035C2 (de) * 1995-01-31 1998-09-17 Siemens Ag Verfahren und Anordnung zum Ermitteln der Phasendifferenz zwischen Taktsignalen in einer Kommunikationseinrichtung
US5812626A (en) * 1995-06-13 1998-09-22 Matsushita Electric Industrial Co., Ltd. Time counting circuit sampling circuit skew adjusting circuit and logic analyzing circuit
JP2859189B2 (ja) * 1995-12-27 1999-02-17 日本電気アイシーマイコンシステム株式会社 タイミングエラー検出回路
JP3572809B2 (ja) * 1996-06-17 2004-10-06 株式会社デンソー A/d変換器
US5930311A (en) * 1996-10-10 1999-07-27 Alcatel Usa Sourcing, L.P. Circuitry for retiming a received data signal
US5910742A (en) * 1997-06-16 1999-06-08 Cypress Semiconductor Corp. Circuit and method for data recovery
US6578155B1 (en) 2000-03-16 2003-06-10 International Business Machines Corporation Data processing system with adjustable clocks for partitioned synchronous interfaces
US7149145B2 (en) * 2004-07-19 2006-12-12 Micron Technology, Inc. Delay stage-interweaved analog DLL/PLL
US8022849B2 (en) * 2008-04-14 2011-09-20 Qualcomm, Incorporated Phase to digital converter in all digital phase locked loop
EP3196661B1 (en) * 2009-02-27 2021-04-21 Furuno Electric Co., Ltd. Frequency measuring device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3132069A1 (de) * 1981-08-13 1983-03-03 Anatolij Prokopevic Bykov Phasenmesseinrichtung
EP0225396B1 (de) * 1985-12-12 1990-09-26 Deutsche ITT Industries GmbH Digitale Phasenmesschaltung
JP2642421B2 (ja) * 1988-06-28 1997-08-20 富士通株式会社 デジタル位相差検出回路及び位相差検出方法
US4884020A (en) * 1988-07-22 1989-11-28 Orion Instruments, Inc. Phase detection system
DE3913872A1 (de) * 1989-04-27 1990-11-08 Wandel & Goltermann Verfahren zur messung grosser phasenhuebe an jittermodulierten signalen und anordnung zu dessen durchfuehrung
JP2868266B2 (ja) * 1990-01-25 1999-03-10 株式会社日本自動車部品総合研究所 信号位相差検出回路及び信号位相差検出方法
EP0467712B1 (en) * 1990-07-20 1998-04-29 Nec Corporation Phase demodulator for psk-modulated signals
DE4123388A1 (de) * 1991-07-15 1993-01-21 Thomson Brandt Gmbh Vorrichtung zur erzeugung von schwingungen und deren anwendung

Also Published As

Publication number Publication date
JP3699488B2 (ja) 2005-09-28
DE4211701A1 (de) 1993-10-14
JPH0651003A (ja) 1994-02-25
ES2108775T3 (es) 1998-01-01
US5412311A (en) 1995-05-02
EP0564923B1 (de) 1997-09-10
DE59307298D1 (de) 1997-10-16
EP0564923A2 (de) 1993-10-13
EP0564923A3 (en) 1994-09-07

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20060326