GB986380A - Apparatus for testing semi-conductor devices - Google Patents

Apparatus for testing semi-conductor devices

Info

Publication number
GB986380A
GB986380A GB2250?/62A GB225062A GB986380A GB 986380 A GB986380 A GB 986380A GB 225062 A GB225062 A GB 225062A GB 986380 A GB986380 A GB 986380A
Authority
GB
United Kingdom
Prior art keywords
transistor
resistors
metallic
disc
discs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2250?/62A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB986380A publication Critical patent/GB986380A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
GB2250?/62A 1961-06-13 1962-01-22 Apparatus for testing semi-conductor devices Expired GB986380A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH687861A CH385996A (de) 1961-06-13 1961-06-13 Reaktanzarme Messanordnung zur Bestimmung des Schaltverhaltens eines Halbleiterelementes

Publications (1)

Publication Number Publication Date
GB986380A true GB986380A (en) 1965-03-17

Family

ID=4316459

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2250?/62A Expired GB986380A (en) 1961-06-13 1962-01-22 Apparatus for testing semi-conductor devices

Country Status (2)

Country Link
CH (1) CH385996A (de)
GB (1) GB986380A (de)

Also Published As

Publication number Publication date
CH385996A (de) 1964-12-31

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