GB945101A - An improved semiconductor device with a tunnel diode junction - Google Patents

An improved semiconductor device with a tunnel diode junction

Info

Publication number
GB945101A
GB945101A GB2676761A GB2676761A GB945101A GB 945101 A GB945101 A GB 945101A GB 2676761 A GB2676761 A GB 2676761A GB 2676761 A GB2676761 A GB 2676761A GB 945101 A GB945101 A GB 945101A
Authority
GB
United Kingdom
Prior art keywords
range
tunnel diode
junction
semi
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2676761A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Publication of GB945101A publication Critical patent/GB945101A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/36Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the concentration or distribution of impurities in the bulk material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/88Tunnel-effect diodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

945,101. Semi-conductor devices. NIPPON ELECTRIC CO. Ltd. July 24, 1961 [Aug. 25, 1960], No. 26767/61. Heading H1K. A tunnel diode and a Zener diode are formed on a single semi-conductor crystal wafer so as to be in series and in back-to-back relationship with each other. The characteristic of such a device is shown in Fig. 5 and it is stated that the negative resistance range c occurs over a higher and narrower voltage range than for a single tunnel diode and that the device has a very high forward resistance in the voltage range a below the negative resistance range. It is assumed that the reverse resistance of the Zener diode takes preference over the range a, that its Zener breakdown governs range b, and that the tunnel diode mechanism is operative over ranges c and d. An N-type germanium crystal 11 (specific resistance less than 0.05 ohm. cm.) has alloyed thereto a ball of indium containing up to 5% of arsenic to form an N+ layer 12. Part of the surface of layer 12 and crystal 11 is then etched using hydrochloric acid and balls of indium containing up to 0.5% of gallium are alloyed to the etched surfaces to form a P+ N+ junction 13 and a PN junction 14. In an alternative construction (Fig. 3, not shown), a P-type semi-conductor wafer is used, the PN junction then taking the form PN+.
GB2676761A 1960-08-25 1961-07-24 An improved semiconductor device with a tunnel diode junction Expired GB945101A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3618560 1960-08-25

Publications (1)

Publication Number Publication Date
GB945101A true GB945101A (en) 1963-12-23

Family

ID=12462657

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2676761A Expired GB945101A (en) 1960-08-25 1961-07-24 An improved semiconductor device with a tunnel diode junction

Country Status (1)

Country Link
GB (1) GB945101A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3358158A (en) * 1961-02-06 1967-12-12 Gen Electric Semiconductor devices

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3358158A (en) * 1961-02-06 1967-12-12 Gen Electric Semiconductor devices

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