GB8630974D0 - Testing electrical chip - Google Patents

Testing electrical chip

Info

Publication number
GB8630974D0
GB8630974D0 GB868630974A GB8630974A GB8630974D0 GB 8630974 D0 GB8630974 D0 GB 8630974D0 GB 868630974 A GB868630974 A GB 868630974A GB 8630974 A GB8630974 A GB 8630974A GB 8630974 D0 GB8630974 D0 GB 8630974D0
Authority
GB
United Kingdom
Prior art keywords
testing electrical
electrical chip
chip
testing
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB868630974A
Other versions
GB2185327A (en
GB2185327B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jones R H
Original Assignee
Jones R H
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jones R H filed Critical Jones R H
Publication of GB8630974D0 publication Critical patent/GB8630974D0/en
Publication of GB2185327A publication Critical patent/GB2185327A/en
Application granted granted Critical
Publication of GB2185327B publication Critical patent/GB2185327B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
GB8630974A 1986-01-13 1986-12-29 A method of testing an electrical chip Expired - Lifetime GB2185327B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868600711A GB8600711D0 (en) 1986-01-13 1986-01-13 Testing electrical chip

Publications (3)

Publication Number Publication Date
GB8630974D0 true GB8630974D0 (en) 1987-02-04
GB2185327A GB2185327A (en) 1987-07-15
GB2185327B GB2185327B (en) 1990-05-30

Family

ID=10591293

Family Applications (2)

Application Number Title Priority Date Filing Date
GB868600711A Pending GB8600711D0 (en) 1986-01-13 1986-01-13 Testing electrical chip
GB8630974A Expired - Lifetime GB2185327B (en) 1986-01-13 1986-12-29 A method of testing an electrical chip

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB868600711A Pending GB8600711D0 (en) 1986-01-13 1986-01-13 Testing electrical chip

Country Status (1)

Country Link
GB (2) GB8600711D0 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4053833A (en) * 1974-02-12 1977-10-11 Westinghouse Electric Corporation Contactless test method for integrated circuits
EP0081295A1 (en) * 1981-11-12 1983-06-15 Hughes Aircraft Company Intelligent probe for fast microcircuit internal node testing
DE3235449A1 (en) * 1982-09-24 1984-03-29 Siemens AG, 1000 Berlin und 8000 München FLYING-SPOT SCANNER FOR LIGHT MICROSCOPIC EXAMINATIONS IN A RASTER ELECTRON MICROSCOPE AND METHOD FOR ITS OPERATION
US4588950A (en) * 1983-11-15 1986-05-13 Data Probe Corporation Test system for VLSI digital circuit and method of testing

Also Published As

Publication number Publication date
GB2185327A (en) 1987-07-15
GB8600711D0 (en) 1986-02-19
GB2185327B (en) 1990-05-30

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19921229