GB8600711D0 - Testing electrical chip - Google Patents

Testing electrical chip

Info

Publication number
GB8600711D0
GB8600711D0 GB868600711A GB8600711A GB8600711D0 GB 8600711 D0 GB8600711 D0 GB 8600711D0 GB 868600711 A GB868600711 A GB 868600711A GB 8600711 A GB8600711 A GB 8600711A GB 8600711 D0 GB8600711 D0 GB 8600711D0
Authority
GB
United Kingdom
Prior art keywords
testing electrical
electrical chip
chip
testing
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GB868600711A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jones R H
Original Assignee
Jones R H
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jones R H filed Critical Jones R H
Priority to GB868600711A priority Critical patent/GB8600711D0/en
Publication of GB8600711D0 publication Critical patent/GB8600711D0/en
Priority to GB8630974A priority patent/GB2185327B/en
Pending legal-status Critical Current

Links

GB868600711A 1986-01-13 1986-01-13 Testing electrical chip Pending GB8600711D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB868600711A GB8600711D0 (en) 1986-01-13 1986-01-13 Testing electrical chip
GB8630974A GB2185327B (en) 1986-01-13 1986-12-29 A method of testing an electrical chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868600711A GB8600711D0 (en) 1986-01-13 1986-01-13 Testing electrical chip

Publications (1)

Publication Number Publication Date
GB8600711D0 true GB8600711D0 (en) 1986-02-19

Family

ID=10591293

Family Applications (2)

Application Number Title Priority Date Filing Date
GB868600711A Pending GB8600711D0 (en) 1986-01-13 1986-01-13 Testing electrical chip
GB8630974A Expired - Lifetime GB2185327B (en) 1986-01-13 1986-12-29 A method of testing an electrical chip

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB8630974A Expired - Lifetime GB2185327B (en) 1986-01-13 1986-12-29 A method of testing an electrical chip

Country Status (1)

Country Link
GB (2) GB8600711D0 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4053833A (en) * 1974-02-12 1977-10-11 Westinghouse Electric Corporation Contactless test method for integrated circuits
EP0081295A1 (en) * 1981-11-12 1983-06-15 Hughes Aircraft Company Intelligent probe for fast microcircuit internal node testing
DE3235449A1 (en) * 1982-09-24 1984-03-29 Siemens AG, 1000 Berlin und 8000 München FLYING-SPOT SCANNER FOR LIGHT MICROSCOPIC EXAMINATIONS IN A RASTER ELECTRON MICROSCOPE AND METHOD FOR ITS OPERATION
US4588950A (en) * 1983-11-15 1986-05-13 Data Probe Corporation Test system for VLSI digital circuit and method of testing

Also Published As

Publication number Publication date
GB2185327A (en) 1987-07-15
GB8630974D0 (en) 1987-02-04
GB2185327B (en) 1990-05-30

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