GB8703350D0 - Testing memory - Google Patents

Testing memory

Info

Publication number
GB8703350D0
GB8703350D0 GB878703350A GB8703350A GB8703350D0 GB 8703350 D0 GB8703350 D0 GB 8703350D0 GB 878703350 A GB878703350 A GB 878703350A GB 8703350 A GB8703350 A GB 8703350A GB 8703350 D0 GB8703350 D0 GB 8703350D0
Authority
GB
United Kingdom
Prior art keywords
testing memory
testing
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB878703350A
Other versions
GB2191008B (en
GB2191008A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Publication of GB8703350D0 publication Critical patent/GB8703350D0/en
Publication of GB2191008A publication Critical patent/GB2191008A/en
Application granted granted Critical
Publication of GB2191008B publication Critical patent/GB2191008B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]
GB8703350A 1986-05-30 1987-02-13 Method of testing a memory Expired GB2191008B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868613154A GB8613154D0 (en) 1986-05-30 1986-05-30 Testing memory

Publications (3)

Publication Number Publication Date
GB8703350D0 true GB8703350D0 (en) 1987-03-18
GB2191008A GB2191008A (en) 1987-12-02
GB2191008B GB2191008B (en) 1989-12-13

Family

ID=10598675

Family Applications (2)

Application Number Title Priority Date Filing Date
GB868613154A Pending GB8613154D0 (en) 1986-05-30 1986-05-30 Testing memory
GB8703350A Expired GB2191008B (en) 1986-05-30 1987-02-13 Method of testing a memory

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB868613154A Pending GB8613154D0 (en) 1986-05-30 1986-05-30 Testing memory

Country Status (1)

Country Link
GB (2) GB8613154D0 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5173906A (en) * 1990-08-31 1992-12-22 Dreibelbis Jeffrey H Built-in self test for integrated circuits
EP0727785B1 (en) * 1995-01-23 1997-06-11 International Business Machines Corporation Enhanced self-test of memories

Also Published As

Publication number Publication date
GB2191008B (en) 1989-12-13
GB8613154D0 (en) 1986-07-02
GB2191008A (en) 1987-12-02

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20040213