GB862542A - X-ray apparatus for chemical analysis - Google Patents

X-ray apparatus for chemical analysis

Info

Publication number
GB862542A
GB862542A GB17576/57A GB1757657A GB862542A GB 862542 A GB862542 A GB 862542A GB 17576/57 A GB17576/57 A GB 17576/57A GB 1757657 A GB1757657 A GB 1757657A GB 862542 A GB862542 A GB 862542A
Authority
GB
United Kingdom
Prior art keywords
radiation
chamber
substance
june
counter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB17576/57A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electrical Industries Ltd
Original Assignee
Philips Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electrical Industries Ltd filed Critical Philips Electrical Industries Ltd
Publication of GB862542A publication Critical patent/GB862542A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/202—Sources of radiation isotopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/502—Detectors ionisation chamber

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

862,542. X-ray analysis. PHILIPS ELECTRICAL INDUSTRIES Ltd. June 3, 1957 [June 1, 1956], No. 17576/57. Class 40(3) [Also in Group XL(a)] In an apparatus for detecting the presence in a substance of elements in the second period of the Periodic Table by exposing the substance to X-rays and detecting the secondary X-radiation, the radiation is detected by an ionization chamber 19 in open communication with a chamber 15 containing the X- ray apparatus 7 and the substance 8 being examined. In the apparatus shown in Fig. 1, the secondary X-radiation is reflected by a gypsum crystal 10 through a slit 12 adjustable therewith, the softer radiation being mostly absorbed in the chamber 15, the harder radiation passing mostly through the chamber 19 and the medium radiation being mostly absorbed in the chamber 10 to produce ionization which is measured by a counter. In the apparatus shown in Fig. 4 secondary X-radiation from a source 51 is received by a counter comprising a metal cylinder 54 and an anode wire 56 carried by a bar 60 adjustable by a motor 64 which also controls the gas pressure in the apparatus.
GB17576/57A 1956-06-01 1957-06-03 X-ray apparatus for chemical analysis Expired GB862542A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US862542XA 1956-06-01 1956-06-01

Publications (1)

Publication Number Publication Date
GB862542A true GB862542A (en) 1961-03-15

Family

ID=22197294

Family Applications (1)

Application Number Title Priority Date Filing Date
GB17576/57A Expired GB862542A (en) 1956-06-01 1957-06-03 X-ray apparatus for chemical analysis

Country Status (1)

Country Link
GB (1) GB862542A (en)

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