GB856137A - Improvements relating to production of silicon - Google Patents
Improvements relating to production of siliconInfo
- Publication number
- GB856137A GB856137A GB18965/56A GB1896556A GB856137A GB 856137 A GB856137 A GB 856137A GB 18965/56 A GB18965/56 A GB 18965/56A GB 1896556 A GB1896556 A GB 1896556A GB 856137 A GB856137 A GB 856137A
- Authority
- GB
- United Kingdom
- Prior art keywords
- silicon
- temperature
- effected
- crystallisation
- recrystallisation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/02—Silicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02576—N-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Abstract
Silicon is prepared by the thermal decomposition of recrystallised silicon tetraiodide. Recrystallisation may be effected by partial crystallisation of a melt, by zone refining, or by partial crystallisation from solution. Solvents specified are heptane, octane, nonane, decane, undecane, dodecane and tridecane; alkyl substituted cyclohexanes, cycloheptanes and cyclooctanes; carbon tetrachloride, methylene dichloride, ethylene dichloride and 1-chlorooctane; carbon disulphide; and benzene, toluene, monochlorobenzene, dichlorobenzene, naphthalene and phenylethane. Recrystallisation may be repeated one or more times. An equimolecular proportion of solvent may be employed. After crystallisation from solution, the crystals are preferably heated in vacuo at a temperature below the b.p. to remove residual solvents. The recrystallised silicon tetrachloride may be fractionally distilled. Distillation may be effected in a 12 plate quartz column or a 30 plate pyrex column at atmospheric pressure and at a temperature of 295 DEG C. and a middle fraction decomposed. Decomposition may be effected at a temperature of 800-1,300 DEG C., e.g. 1,000 DEG C., at a pressure of 0.5-10 up to 100 mm. or more of mercury, and in contact with quartz or tantalum. The silicon tetraiodide to be decomposed may be prepared by passing vaporous iodine diluted with nitrogen over powdered silicon containing less than 5% of impurity heated to a temperature of 450-900 DEG C., preferably 600-800 DEG C. Specification 843,467 is referred to.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US856137XA | 1955-06-27 | 1955-06-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB856137A true GB856137A (en) | 1960-12-14 |
Family
ID=22192782
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB18965/56A Expired GB856137A (en) | 1955-06-27 | 1956-06-19 | Improvements relating to production of silicon |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR1154281A (en) |
GB (1) | GB856137A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1772429A1 (en) * | 2004-06-22 | 2007-04-11 | Shin-Etsu Film Co., Ltd. | Method for producing polycrystalline silicon and polycrystalline silicon for solar cell produced by the method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3006737A (en) * | 1959-06-02 | 1961-10-31 | Guy H Moates | Apparatus for continuous preparation of ultrapure silicon |
-
1956
- 1956-06-19 GB GB18965/56A patent/GB856137A/en not_active Expired
- 1956-06-26 FR FR1154281D patent/FR1154281A/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1772429A1 (en) * | 2004-06-22 | 2007-04-11 | Shin-Etsu Film Co., Ltd. | Method for producing polycrystalline silicon and polycrystalline silicon for solar cell produced by the method |
EP1772429A4 (en) * | 2004-06-22 | 2010-01-06 | Shin Etsu Film Co Ltd | Method for producing polycrystalline silicon and polycrystalline silicon for solar cell produced by the method |
US7732012B2 (en) | 2004-06-22 | 2010-06-08 | Shin-Etsu Film Co., Ltd | Method for manufacturing polycrystalline silicon, and polycrystalline silicon for solar cells manufactured by the method |
Also Published As
Publication number | Publication date |
---|---|
FR1154281A (en) | 1958-04-04 |
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