GB8530302D0 - Testing electronic circuit assemblies - Google Patents

Testing electronic circuit assemblies

Info

Publication number
GB8530302D0
GB8530302D0 GB858530302A GB8530302A GB8530302D0 GB 8530302 D0 GB8530302 D0 GB 8530302D0 GB 858530302 A GB858530302 A GB 858530302A GB 8530302 A GB8530302 A GB 8530302A GB 8530302 D0 GB8530302 D0 GB 8530302D0
Authority
GB
United Kingdom
Prior art keywords
electronic circuit
circuit assemblies
testing electronic
testing
assemblies
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB858530302A
Other versions
GB2169087B (en
GB2169087A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Publication of GB8530302D0 publication Critical patent/GB8530302D0/en
Publication of GB2169087A publication Critical patent/GB2169087A/en
Application granted granted Critical
Publication of GB2169087B publication Critical patent/GB2169087B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2843—In-circuit-testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
GB08530302A 1984-12-20 1985-12-09 Testing electronic circuit assemblies including crystal oscillators Expired GB2169087B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB848432305A GB8432305D0 (en) 1984-12-20 1984-12-20 Crystal oscillator overdrive

Publications (3)

Publication Number Publication Date
GB8530302D0 true GB8530302D0 (en) 1986-01-22
GB2169087A GB2169087A (en) 1986-07-02
GB2169087B GB2169087B (en) 1988-04-27

Family

ID=10571542

Family Applications (2)

Application Number Title Priority Date Filing Date
GB848432305A Pending GB8432305D0 (en) 1984-12-20 1984-12-20 Crystal oscillator overdrive
GB08530302A Expired GB2169087B (en) 1984-12-20 1985-12-09 Testing electronic circuit assemblies including crystal oscillators

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB848432305A Pending GB8432305D0 (en) 1984-12-20 1984-12-20 Crystal oscillator overdrive

Country Status (1)

Country Link
GB (2) GB8432305D0 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4100634A1 (en) * 1991-01-11 1992-07-16 Adaptronic Ag TEST DEVICE
CN108957288B (en) * 2018-06-11 2023-10-13 南京尤尼泰信息科技有限公司 Test substrate suitable for multiple specification crystal oscillator
CN114563649B (en) * 2022-03-29 2024-06-21 布勒莱宝光学设备（北京）有限公司 Crystal oscillator probe performance detecting system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3492572A (en) * 1966-10-10 1970-01-27 Ibm Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits
GB1369435A (en) * 1970-10-30 1974-10-09 Secr Defence Piezoelectric transducer testing system
US4012625A (en) * 1975-09-05 1977-03-15 Honeywell Information Systems, Inc. Non-logic printed wiring board test system
DE2917126C2 (en) * 1979-04-27 1983-01-27 Philips Patentverwaltung Gmbh, 2000 Hamburg Method for testing an integrated circuit and arrangement for carrying out the method
US4555783A (en) * 1982-04-30 1985-11-26 Genrad, Inc. Method of computerized in-circuit testing of electrical components and the like with automatic spurious signal suppression

Also Published As

Publication number Publication date
GB2169087B (en) 1988-04-27
GB8432305D0 (en) 1985-01-30
GB2169087A (en) 1986-07-02

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee