GB2169087B - Testing electronic circuit assemblies including crystal oscillators - Google Patents
Testing electronic circuit assemblies including crystal oscillatorsInfo
- Publication number
- GB2169087B GB2169087B GB08530302A GB8530302A GB2169087B GB 2169087 B GB2169087 B GB 2169087B GB 08530302 A GB08530302 A GB 08530302A GB 8530302 A GB8530302 A GB 8530302A GB 2169087 B GB2169087 B GB 2169087B
- Authority
- GB
- United Kingdom
- Prior art keywords
- electronic circuit
- assemblies including
- crystal oscillators
- circuit assemblies
- testing electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31915—In-circuit Testers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB848432305A GB8432305D0 (en) | 1984-12-20 | 1984-12-20 | Crystal oscillator overdrive |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8530302D0 GB8530302D0 (en) | 1986-01-22 |
GB2169087A GB2169087A (en) | 1986-07-02 |
GB2169087B true GB2169087B (en) | 1988-04-27 |
Family
ID=10571542
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB848432305A Pending GB8432305D0 (en) | 1984-12-20 | 1984-12-20 | Crystal oscillator overdrive |
GB08530302A Expired GB2169087B (en) | 1984-12-20 | 1985-12-09 | Testing electronic circuit assemblies including crystal oscillators |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB848432305A Pending GB8432305D0 (en) | 1984-12-20 | 1984-12-20 | Crystal oscillator overdrive |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB8432305D0 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108957288A (en) * | 2018-06-11 | 2018-12-07 | 南京尤尼泰信息科技有限公司 | A kind of test substrate suitable for plurality of specifications crystal oscillator |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4100634A1 (en) * | 1991-01-11 | 1992-07-16 | Adaptronic Ag | TEST DEVICE |
CN114563649B (en) * | 2022-03-29 | 2024-06-21 | 布勒莱宝光学设备(北京)有限公司 | Crystal oscillator probe performance detecting system |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3492572A (en) * | 1966-10-10 | 1970-01-27 | Ibm | Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits |
GB1369435A (en) * | 1970-10-30 | 1974-10-09 | Secr Defence | Piezoelectric transducer testing system |
US4012625A (en) * | 1975-09-05 | 1977-03-15 | Honeywell Information Systems, Inc. | Non-logic printed wiring board test system |
DE2917126C2 (en) * | 1979-04-27 | 1983-01-27 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Method for testing an integrated circuit and arrangement for carrying out the method |
US4555783A (en) * | 1982-04-30 | 1985-11-26 | Genrad, Inc. | Method of computerized in-circuit testing of electrical components and the like with automatic spurious signal suppression |
-
1984
- 1984-12-20 GB GB848432305A patent/GB8432305D0/en active Pending
-
1985
- 1985-12-09 GB GB08530302A patent/GB2169087B/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108957288A (en) * | 2018-06-11 | 2018-12-07 | 南京尤尼泰信息科技有限公司 | A kind of test substrate suitable for plurality of specifications crystal oscillator |
CN108957288B (en) * | 2018-06-11 | 2023-10-13 | 南京尤尼泰信息科技有限公司 | Test substrate suitable for multiple specification crystal oscillator |
Also Published As
Publication number | Publication date |
---|---|
GB2169087A (en) | 1986-07-02 |
GB8530302D0 (en) | 1986-01-22 |
GB8432305D0 (en) | 1985-01-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |