GB635989A - Improvements in and relating to electron optical instruments - Google Patents
Improvements in and relating to electron optical instrumentsInfo
- Publication number
- GB635989A GB635989A GB33344/46A GB3334446A GB635989A GB 635989 A GB635989 A GB 635989A GB 33344/46 A GB33344/46 A GB 33344/46A GB 3334446 A GB3334446 A GB 3334446A GB 635989 A GB635989 A GB 635989A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- frame
- scale
- point
- reference point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/224—Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor, e.g. cameras, TV-cameras, photographic equipment, exposure control; Optical subsystems specially adapted therefor, e.g. microscopes for observing image on luminescent screen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/295—Electron or ion diffraction tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
635,989. Measures of length. BRITISH THOMSON-HOUSTON CO., Ltd. Nov. 9, 1946, No. 33344. Convention date, Nov. 10, 1945. [Class 106 (ii)] [Also in Group XL (a)] An electron optical instrument has an evacuated envelope for producing a beam of electrons, means for supporting a specimen to be examined in the path of the beam, a reference point located on the envelope and means for measuring the distance between the reference point and the point of incidence of the beam on the specimen comprising a scale associated with the reference point, optical means for observing the point of incidence and an indicator movable over the scale and mechanically connected with the optical means. In the construction shown in Figs. 1 and 2 the specimen is supported within the tube on a member 7 and its position is adjusted through three perpendicular directions and two axes of rotation by a manipulator as described in Specification 618,657, [Group XL (c)]. The electron beam from the gun 2 after reflection from or refraction through the specimen forms a diffraction pattern on the fluorescent screen 9, a permanent record being obtained by lowering a photographic plate 10 from a magazine 11 into the paths of the beam. A removable sliding frame 15 is attached by hangers 14 to a tubular scale bearing rod 13 fixed to the upper side of the specimen chamber 6 parallel to the axis of the tube. A telescope 16 for observing the point of impact of the electron beam on the specimen, which may be coated with fluorescent material, is supported on the frame 15 by a rod 17 having a support 18 bearing upon a plate 19 fixed to the specimen chamber 6. Angular adjustment of the frame 15 and telescope. 16 is effected at 20 and 21 respectively. The position of the frame 15, relative to the scale 22 on the rod 13 is observed by a sighting vane 24 of circular spring material located in an aperture 23 in the frame 15.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US627856A US2439644A (en) | 1945-11-10 | 1945-11-10 | Indexing telescope for electron diffraction instruments |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB635989A true GB635989A (en) | 1950-04-19 |
Family
ID=24516428
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB33344/46A Expired GB635989A (en) | 1945-11-10 | 1946-11-09 | Improvements in and relating to electron optical instruments |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US2439644A (en) |
| GB (1) | GB635989A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL76352C (en) * | 1947-11-15 | |||
| US3209146A (en) * | 1961-12-09 | 1965-09-28 | Akashi Seisakusho Kk | Apparatus for adjusting position of a sample for electron probe x-ray microanalyzer |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1590451A (en) * | 1920-12-13 | 1926-06-29 | Westinghouse Electric & Mfg Co | Crest volt meter |
| US1646819A (en) * | 1925-09-14 | 1927-10-25 | Hutchinson Scale Company | Indicator device for instruments |
| US1729106A (en) * | 1926-02-27 | 1929-09-24 | Nathan A Hallwood | Weight-indicating mechanism for scales |
| CH119513A (en) * | 1926-06-11 | 1927-03-16 | J Waelly | Pointers for all types of measuring instruments where precise reading is required. |
| US2003387A (en) * | 1931-05-01 | 1935-06-04 | Spencer Lens Co | Microscope |
| US1971277A (en) * | 1931-06-26 | 1934-08-21 | Gen Electric | Device for analyzing the structure of matter |
| US2058968A (en) * | 1934-09-19 | 1936-10-27 | Montgomery Ward & Co Inc | Gun sight |
| US2301303A (en) * | 1940-02-17 | 1942-11-10 | Rca Corp | Shielded electronic microscope |
| US2295791A (en) * | 1941-11-01 | 1942-09-15 | J G Mcneil | Gun sight |
-
1945
- 1945-11-10 US US627856A patent/US2439644A/en not_active Expired - Lifetime
-
1946
- 1946-11-09 GB GB33344/46A patent/GB635989A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| US2439644A (en) | 1948-04-13 |
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