GB600234A - Improvements in or relating to interferometric gauges for linear dimensions - Google Patents

Improvements in or relating to interferometric gauges for linear dimensions

Info

Publication number
GB600234A
GB600234A GB32197/45A GB3219745A GB600234A GB 600234 A GB600234 A GB 600234A GB 32197/45 A GB32197/45 A GB 32197/45A GB 3219745 A GB3219745 A GB 3219745A GB 600234 A GB600234 A GB 600234A
Authority
GB
United Kingdom
Prior art keywords
gauge
flat
holder
flats
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB32197/45A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bendix Aviation Corp
Original Assignee
Bendix Aviation Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bendix Aviation Corp filed Critical Bendix Aviation Corp
Publication of GB600234A publication Critical patent/GB600234A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02049Interferometers characterised by particular mechanical design details
    • G01B9/0205Interferometers characterised by particular mechanical design details of probe head
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056Passive reduction of errors
    • G01B9/02057Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

600,234. Interferometers. BENDIX AVIATION CORPORATION. Nov. 28, 1945, No. 32197. Convention date, Dec. 16, 1944. [Class 97 (i)] [Also in Group XIX] An interferometric gauge, more particularly for internal gauging, comprises two optical flats 19, 21, to which are attached, respectively, calliper arms 76, 77, and a viewing system so arranged that the light reflected from the adjacent surfaces of the optical flats may be viewed in the eyepiece. The lower flat 21 is mounted in a holder 22 hinged to a base 17 by flexible metal plates 23, 24 clamped to the base by blocks 25, 26 and screws (Fig. 4). The upper flat 19 in a holder 44 is similarly hinged to a yoke member 41 clamped to the base 17. The yoke may be adjusted vertically by bolts 61, 62. A levelling optical flat 69 is adjustably mounted in the base 17 below the gauging flat 21. The upper and lower surfaces of the lower gauge flat 21 are formed at a small angle to allow interference fringes between the gauging flats and the levelling flat 69 and lower gauge flat 21 to be viewed separately by a slight adjustment of a support 10 for the viewing system. The calliper arms 76, 77 are rigidly attached to the carriers for the gauge flats, their free ends being provided with jewel points. The arm 77 is formed integral with the carrier 22 and is provided with a longitudinal slot in which the arm 76 is movable. The arm 76 is provided with a dovetail extension 83 held in position by cap screws 84 which bear against the carrier 44. In operation a plane table 18 is provided with a standard gauge fixture 100 with platform 104 on which rest two optical flats 105, 106 separated by standard blocks of the required size. The gauge 116 which is to be measured is placed in a suitable holder 117 seated on a mounting surface 101 which may be-levelled by screws 133, 134, 135. The holder is provided with eccentric buttons 125, 126, 127 rotation nf which moves the holder 117 to locate the gauge ring 116 with respect to the gauge arms. The difference in the number of fringes compared with the standard gives a measure of the diameter. A light source 1, comprising a gaseous tube connected to a transformer 2, is mounted in the end of a cylinder 11 adjustably supported by a bracket 12 carried by a crossbar 13. A lens 14 and inclined mirror 15 are arranged at the opposite end of the cylinder. The whole instrument may be housed in an airconditioned and temperature-controlled chamber of the type described in Specification 598,282.
GB32197/45A 1944-12-16 1945-11-28 Improvements in or relating to interferometric gauges for linear dimensions Expired GB600234A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US600234XA 1944-12-16 1944-12-16

Publications (1)

Publication Number Publication Date
GB600234A true GB600234A (en) 1948-04-02

Family

ID=22026834

Family Applications (1)

Application Number Title Priority Date Filing Date
GB32197/45A Expired GB600234A (en) 1944-12-16 1945-11-28 Improvements in or relating to interferometric gauges for linear dimensions

Country Status (1)

Country Link
GB (1) GB600234A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006107928A3 (en) * 2005-04-06 2008-02-28 Dimensional Photonics Internat Multiple channel interferometric surface contour measurement system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006107928A3 (en) * 2005-04-06 2008-02-28 Dimensional Photonics Internat Multiple channel interferometric surface contour measurement system
US7751063B2 (en) 2005-04-06 2010-07-06 Dimensional Photonics International, Inc. Multiple channel interferometric surface contour measurement system
EP2657761A3 (en) * 2005-04-06 2013-12-25 Dimensional Photonics International, Inc. Multiple channel interferometric surface contour measurement system

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