GB2602119B - A method of producing an electronic device precursor - Google Patents
A method of producing an electronic device precursor Download PDFInfo
- Publication number
- GB2602119B GB2602119B GB2020131.5A GB202020131A GB2602119B GB 2602119 B GB2602119 B GB 2602119B GB 202020131 A GB202020131 A GB 202020131A GB 2602119 B GB2602119 B GB 2602119B
- Authority
- GB
- United Kingdom
- Prior art keywords
- producing
- electronic device
- device precursor
- precursor
- electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000002243 precursor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/45—Ohmic electrodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0052—Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/072—Constructional adaptation of the sensor to specific applications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System
- H01L29/1606—Graphene
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/24—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only semiconductor materials not provided for in groups H01L29/16, H01L29/18, H01L29/20, H01L29/22
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66015—Multistep manufacturing processes of devices having a semiconductor body comprising semiconducting carbon, e.g. diamond, diamond-like carbon, graphene
- H01L29/66037—Multistep manufacturing processes of devices having a semiconductor body comprising semiconducting carbon, e.g. diamond, diamond-like carbon, graphene the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66015—Multistep manufacturing processes of devices having a semiconductor body comprising semiconducting carbon, e.g. diamond, diamond-like carbon, graphene
- H01L29/66037—Multistep manufacturing processes of devices having a semiconductor body comprising semiconducting carbon, e.g. diamond, diamond-like carbon, graphene the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66045—Field-effect transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
- H10N52/101—Semiconductor Hall-effect devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Carbon And Carbon Compounds (AREA)
- Formation Of Insulating Films (AREA)
- Thin Film Transistor (AREA)
Priority Applications (11)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2020131.5A GB2602119B (en) | 2020-12-18 | 2020-12-18 | A method of producing an electronic device precursor |
GBGB2107674.0A GB202107674D0 (en) | 2020-12-18 | 2021-05-28 | Hall sensor |
GB2109011.3A GB2602174B (en) | 2020-12-18 | 2021-06-23 | Hall sensor |
US18/258,174 US20240130248A1 (en) | 2020-12-18 | 2021-12-17 | Graphene hall sensor, fabrication and use thereof |
PCT/EP2021/086642 WO2022129606A1 (en) | 2020-12-18 | 2021-12-17 | Method of producing a graphene electronic device precursor |
KR1020237024543A KR20230118683A (en) | 2020-12-18 | 2021-12-17 | Methods for fabricating graphene electronic device precursors |
JP2023537063A JP2023553733A (en) | 2020-12-18 | 2021-12-17 | Method for producing electronic device precursor |
PCT/EP2021/086593 WO2022129570A1 (en) | 2020-12-18 | 2021-12-17 | Graphene hall sensor, fabrication and use thereof |
EP21840905.0A EP4264693A1 (en) | 2020-12-18 | 2021-12-17 | Method of producing a graphene electronic device precursor |
DE112021006520.3T DE112021006520T5 (en) | 2020-12-18 | 2021-12-17 | GRAPHENE HALL SENSOR, PRODUCTION AND USE THEREOF |
US18/268,567 US20240040937A1 (en) | 2020-12-18 | 2021-12-17 | Method of producing an electronic device precursor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2020131.5A GB2602119B (en) | 2020-12-18 | 2020-12-18 | A method of producing an electronic device precursor |
Publications (3)
Publication Number | Publication Date |
---|---|
GB202020131D0 GB202020131D0 (en) | 2021-02-03 |
GB2602119A GB2602119A (en) | 2022-06-22 |
GB2602119B true GB2602119B (en) | 2023-02-15 |
Family
ID=74221422
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2020131.5A Active GB2602119B (en) | 2020-12-18 | 2020-12-18 | A method of producing an electronic device precursor |
GBGB2107674.0A Ceased GB202107674D0 (en) | 2020-12-18 | 2021-05-28 | Hall sensor |
GB2109011.3A Active GB2602174B (en) | 2020-12-18 | 2021-06-23 | Hall sensor |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB2107674.0A Ceased GB202107674D0 (en) | 2020-12-18 | 2021-05-28 | Hall sensor |
GB2109011.3A Active GB2602174B (en) | 2020-12-18 | 2021-06-23 | Hall sensor |
Country Status (1)
Country | Link |
---|---|
GB (3) | GB2602119B (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB202115100D0 (en) * | 2021-10-21 | 2021-12-08 | Paragraf Ltd | Magnetoresistive sensor |
WO2023237561A1 (en) | 2022-06-08 | 2023-12-14 | Paragraf Limited | A thermally stable graphene-containing laminate |
CN116236206B (en) * | 2023-05-10 | 2023-08-11 | 苏州浪潮智能科技有限公司 | Nerve microelectrode and preparation method thereof |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103985762A (en) * | 2014-03-28 | 2014-08-13 | 中国电子科技集团公司第十三研究所 | Ultralow ohmic contact resistance graphene transistor and preparation method thereof |
-
2020
- 2020-12-18 GB GB2020131.5A patent/GB2602119B/en active Active
-
2021
- 2021-05-28 GB GBGB2107674.0A patent/GB202107674D0/en not_active Ceased
- 2021-06-23 GB GB2109011.3A patent/GB2602174B/en active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103985762A (en) * | 2014-03-28 | 2014-08-13 | 中国电子科技集团公司第十三研究所 | Ultralow ohmic contact resistance graphene transistor and preparation method thereof |
Non-Patent Citations (2)
Title |
---|
Carbon 139, 2018, Ciuk et al, "Thermally activated double-carrier transport in epitaxial graphene on vanadium-compensated 6H-SiC as revealed by Hall effect measurements", pages 776-781. * |
Journal of the Electron Devices Society, Volume 8, 2020, ASAD et al., "Dependence of High-Frequency Performance of Graphene Field-Effect Transistors", pages 457-464. * |
Also Published As
Publication number | Publication date |
---|---|
GB2602174B (en) | 2023-08-23 |
GB202020131D0 (en) | 2021-02-03 |
GB2602174A (en) | 2022-06-22 |
GB202107674D0 (en) | 2021-07-14 |
GB202109011D0 (en) | 2021-08-04 |
GB2602119A (en) | 2022-06-22 |
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