GB2504928A - Diamond attenuated total reflectance spectrum artefact correction - Google Patents

Diamond attenuated total reflectance spectrum artefact correction Download PDF

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Publication number
GB2504928A
GB2504928A GB1213997.8A GB201213997A GB2504928A GB 2504928 A GB2504928 A GB 2504928A GB 201213997 A GB201213997 A GB 201213997A GB 2504928 A GB2504928 A GB 2504928A
Authority
GB
United Kingdom
Prior art keywords
spectral data
spectrum
artefact
diamond
atr
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB1213997.8A
Other languages
English (en)
Other versions
GB201213997D0 (en
Inventor
Robert Alan Hoult
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer UK Ltd
Original Assignee
PerkinElmer UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer UK Ltd filed Critical PerkinElmer UK Ltd
Priority to GB1213997.8A priority Critical patent/GB2504928A/en
Publication of GB201213997D0 publication Critical patent/GB201213997D0/en
Priority to EP13742672.2A priority patent/EP2880422A1/en
Priority to US14/420,101 priority patent/US10018561B2/en
Priority to PCT/GB2013/000320 priority patent/WO2014023924A1/en
Priority to JP2015525931A priority patent/JP6210462B2/ja
Priority to CA2878884A priority patent/CA2878884C/en
Publication of GB2504928A publication Critical patent/GB2504928A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/121—Correction signals
    • G01N2201/1218—Correction signals for pressure variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination
    • G01N2201/12784—Base line obtained from computation, histogram

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
GB1213997.8A 2012-08-06 2012-08-06 Diamond attenuated total reflectance spectrum artefact correction Withdrawn GB2504928A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GB1213997.8A GB2504928A (en) 2012-08-06 2012-08-06 Diamond attenuated total reflectance spectrum artefact correction
EP13742672.2A EP2880422A1 (en) 2012-08-06 2013-07-23 Diamond atr artefact correction
US14/420,101 US10018561B2 (en) 2012-08-06 2013-07-23 Diamond ATR artefact correction
PCT/GB2013/000320 WO2014023924A1 (en) 2012-08-06 2013-07-23 Diamond atr artefact correction
JP2015525931A JP6210462B2 (ja) 2012-08-06 2013-07-23 ダイヤモンドａｔｒアーチファクト補正
CA2878884A CA2878884C (en) 2012-08-06 2013-07-23 Diamond atr artefact correction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1213997.8A GB2504928A (en) 2012-08-06 2012-08-06 Diamond attenuated total reflectance spectrum artefact correction

Publications (2)

Publication Number Publication Date
GB201213997D0 GB201213997D0 (en) 2012-09-19
GB2504928A true GB2504928A (en) 2014-02-19

Family

ID=46934948

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1213997.8A Withdrawn GB2504928A (en) 2012-08-06 2012-08-06 Diamond attenuated total reflectance spectrum artefact correction

Country Status (6)

Country Link
US (1) US10018561B2 (https=)
EP (1) EP2880422A1 (https=)
JP (1) JP6210462B2 (https=)
CA (1) CA2878884C (https=)
GB (1) GB2504928A (https=)
WO (1) WO2014023924A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102277902B1 (ko) * 2014-09-05 2021-07-15 삼성전자주식회사 피검체 접촉압력 측정기와 그 제조 및 측정방법
CN113970531B (zh) * 2020-07-24 2025-02-11 中国石油化工股份有限公司 一种校正光谱的方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1550854A2 (en) * 2003-12-30 2005-07-06 Rohm And Haas Company Method for diagnosing and identifying contaminants
US20110070602A1 (en) * 2009-09-22 2011-03-24 Bp Corporation North America Inc. Methods and Apparatuses for Measuring Biological Processes Using Mid-Infrared Spectroscopy
EP2395332A1 (en) * 2010-06-10 2011-12-14 Yokogawa Electric Corporation Spectroscopic analyzer and spectroscopic analysis method

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3146700A1 (de) * 1981-11-25 1983-07-07 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und vorrichtung zur detektion thermooptischer signale
US5579462A (en) * 1994-11-03 1996-11-26 Bio-Rad Laboratories User interface for spectrometer
EP0982584B1 (en) * 1998-08-28 2006-02-08 Perkin-Elmer Limited Spectrometer accessory for carrying out attenuated total reflectance measurements
JP2001091452A (ja) * 1999-09-27 2001-04-06 Shimadzu Corp Ａｔｒマッピング測定装置
GB0320925D0 (en) * 2003-09-06 2003-10-08 Smiths Group Plc Spectrometer apparatus
US20070170362A1 (en) * 2006-01-25 2007-07-26 The Regents Of The University Of California Method and apparatus for internal reflection imaging
DE102006036808A1 (de) * 2006-08-07 2008-02-14 Bruker Optik Gmbh Strukturierter ATR-Kristall aus Diamant
JP4784755B2 (ja) * 2006-09-14 2011-10-05 株式会社島津製作所 Ａｔｒ自動密着装置
JP2008209371A (ja) * 2007-02-28 2008-09-11 Toppan Printing Co Ltd 赤外分光分析用加圧セル
JP2009002703A (ja) * 2007-06-19 2009-01-08 Shimadzu Corp ダイヤモンド検査装置
JP5576696B2 (ja) * 2010-04-14 2014-08-20 日本分光株式会社 紫外線硬化樹脂の物性測定装置
WO2013175312A1 (en) * 2012-05-23 2013-11-28 Glaxosmithkline Biologicals Sa Method for determining a concentration of a polysorbate species in a mixture

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1550854A2 (en) * 2003-12-30 2005-07-06 Rohm And Haas Company Method for diagnosing and identifying contaminants
US20110070602A1 (en) * 2009-09-22 2011-03-24 Bp Corporation North America Inc. Methods and Apparatuses for Measuring Biological Processes Using Mid-Infrared Spectroscopy
EP2395332A1 (en) * 2010-06-10 2011-12-14 Yokogawa Electric Corporation Spectroscopic analyzer and spectroscopic analysis method

Also Published As

Publication number Publication date
GB201213997D0 (en) 2012-09-19
CA2878884C (en) 2020-09-29
WO2014023924A1 (en) 2014-02-13
JP2015528563A (ja) 2015-09-28
CA2878884A1 (en) 2014-02-13
US10018561B2 (en) 2018-07-10
JP6210462B2 (ja) 2017-10-11
EP2880422A1 (en) 2015-06-10
US20150177142A1 (en) 2015-06-25

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Legal Events

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WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)