GB2244864B - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
GB2244864B
GB2244864B GB9111855A GB9111855A GB2244864B GB 2244864 B GB2244864 B GB 2244864B GB 9111855 A GB9111855 A GB 9111855A GB 9111855 A GB9111855 A GB 9111855A GB 2244864 B GB2244864 B GB 2244864B
Authority
GB
United Kingdom
Prior art keywords
semiconductor device
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9111855A
Other versions
GB9111855D0 (en
GB2244864A (en
Inventor
Tutomu Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alps Alpine Co Ltd
Original Assignee
Alps Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co Ltd filed Critical Alps Electric Co Ltd
Publication of GB9111855D0 publication Critical patent/GB9111855D0/en
Publication of GB2244864A publication Critical patent/GB2244864A/en
Application granted granted Critical
Publication of GB2244864B publication Critical patent/GB2244864B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02—Bonding areas ; Manufacturing methods related thereto
    • H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02—Bonding areas; Manufacturing methods related thereto
    • H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554—External layer
    • H01L2224/0555—Shape
    • H01L2224/05552—Shape in top view
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02—Bonding areas; Manufacturing methods related thereto
    • H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554—External layer
    • H01L2224/0555—Shape
    • H01L2224/05552—Shape in top view
    • H01L2224/05554—Shape in top view being square
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01033—Arsenic [As]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01082—Lead [Pb]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB9111855A 1990-06-05 1991-06-03 Semiconductor device Expired - Fee Related GB2244864B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2146790A JPH0439950A (en) 1990-06-05 1990-06-05 Semiconductor device

Publications (3)

Publication Number Publication Date
GB9111855D0 GB9111855D0 (en) 1991-07-24
GB2244864A GB2244864A (en) 1991-12-11
GB2244864B true GB2244864B (en) 1995-01-18

Family

ID=15415599

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9111855A Expired - Fee Related GB2244864B (en) 1990-06-05 1991-06-03 Semiconductor device

Country Status (2)

Country Link
JP (1) JPH0439950A (en)
GB (1) GB2244864B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3022819B2 (en) * 1997-08-27 2000-03-21 日本電気アイシーマイコンシステム株式会社 Semiconductor integrated circuit device
ATE541312T1 (en) * 2004-05-28 2012-01-15 Nxp Bv CHIP WITH TWO GROUPS OF CHIP CONTACTS
JP4745007B2 (en) * 2005-09-29 2011-08-10 三洋電機株式会社 Semiconductor device and manufacturing method thereof
JP5242063B2 (en) * 2006-03-22 2013-07-24 株式会社フジクラ Wiring board manufacturing method
JP5005113B2 (en) * 2009-04-15 2012-08-22 オリンパスメディカルシステムズ株式会社 Semiconductor device and endoscope

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2177253A (en) * 1985-06-28 1987-01-14 Gen Electric Co Plc Electrical interconnection arrangement
WO1989011659A1 (en) * 1988-05-16 1989-11-30 Leedy Glen J Novel method of making, testing and test device for integrated circuits
EP0401848A2 (en) * 1989-06-09 1990-12-12 Kabushiki Kaisha Toshiba Tape carrier and test method therefor
EP0457013A2 (en) * 1990-04-16 1991-11-21 National Semiconductor Corporation Ferroelectric capacitor test structure for chip die

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62274632A (en) * 1986-05-22 1987-11-28 Hitachi Ltd Small substrate for inspection and usage thereof
JPH0281454A (en) * 1988-09-19 1990-03-22 Hitachi Ltd Semiconductor integrated circuit device and method of testing the same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2177253A (en) * 1985-06-28 1987-01-14 Gen Electric Co Plc Electrical interconnection arrangement
WO1989011659A1 (en) * 1988-05-16 1989-11-30 Leedy Glen J Novel method of making, testing and test device for integrated circuits
EP0401848A2 (en) * 1989-06-09 1990-12-12 Kabushiki Kaisha Toshiba Tape carrier and test method therefor
EP0457013A2 (en) * 1990-04-16 1991-11-21 National Semiconductor Corporation Ferroelectric capacitor test structure for chip die

Also Published As

Publication number Publication date
GB9111855D0 (en) 1991-07-24
GB2244864A (en) 1991-12-11
JPH0439950A (en) 1992-02-10

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19950603