GB2242750B - Method of testing for withstand voltage in inspection of circuit boards - Google Patents

Method of testing for withstand voltage in inspection of circuit boards

Info

Publication number
GB2242750B
GB2242750B GB9104718A GB9104718A GB2242750B GB 2242750 B GB2242750 B GB 2242750B GB 9104718 A GB9104718 A GB 9104718A GB 9104718 A GB9104718 A GB 9104718A GB 2242750 B GB2242750 B GB 2242750B
Authority
GB
United Kingdom
Prior art keywords
inspection
testing
circuit boards
withstand voltage
withstand
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9104718A
Other versions
GB9104718D0 (en
GB2242750A (en
Inventor
Koji Okawa
Michihiko Yoshioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Cable Industries Ltd
Original Assignee
Mitsubishi Cable Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Cable Industries Ltd filed Critical Mitsubishi Cable Industries Ltd
Publication of GB9104718D0 publication Critical patent/GB9104718D0/en
Publication of GB2242750A publication Critical patent/GB2242750A/en
Application granted granted Critical
Publication of GB2242750B publication Critical patent/GB2242750B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/129—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Relating To Insulation (AREA)
GB9104718A 1990-03-06 1991-03-06 Method of testing for withstand voltage in inspection of circuit boards Expired - Fee Related GB2242750B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5428690A JPH0614092B2 (en) 1990-03-06 1990-03-06 Withstanding voltage test method for product inspection of circuit boards for hybrid integrated circuits

Publications (3)

Publication Number Publication Date
GB9104718D0 GB9104718D0 (en) 1991-04-17
GB2242750A GB2242750A (en) 1991-10-09
GB2242750B true GB2242750B (en) 1994-03-30

Family

ID=12966321

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9104718A Expired - Fee Related GB2242750B (en) 1990-03-06 1991-03-06 Method of testing for withstand voltage in inspection of circuit boards

Country Status (2)

Country Link
JP (1) JPH0614092B2 (en)
GB (1) GB2242750B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010032457A (en) * 2008-07-31 2010-02-12 Hioki Ee Corp Insulation inspecting apparatus and technique
CN107907817B (en) * 2017-10-12 2020-09-11 中车青岛四方机车车辆股份有限公司 Experimental device and experimental method for evaluating quality of circuit board in composite environment
CN107884701B (en) * 2017-10-12 2020-06-16 中车青岛四方机车车辆股份有限公司 Experimental device and experimental method for circuit board to withstand overvoltage damage
CN107907755B (en) * 2017-10-12 2020-09-11 中车青岛四方机车车辆股份有限公司 Experimental device and experimental method for electric field damage resistance of circuit board
CN107907818B (en) * 2017-10-12 2020-07-31 中车青岛四方机车车辆股份有限公司 Experimental device and experimental method for detecting circuit board under multi-field effect

Also Published As

Publication number Publication date
GB9104718D0 (en) 1991-04-17
JPH03255966A (en) 1991-11-14
GB2242750A (en) 1991-10-09
JPH0614092B2 (en) 1994-02-23

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19980306