GB2228141A - P-N-P Diamond transistor - Google Patents

P-N-P Diamond transistor Download PDF

Info

Publication number
GB2228141A
GB2228141A GB8912354A GB8912354A GB2228141A GB 2228141 A GB2228141 A GB 2228141A GB 8912354 A GB8912354 A GB 8912354A GB 8912354 A GB8912354 A GB 8912354A GB 2228141 A GB2228141 A GB 2228141A
Authority
GB
United Kingdom
Prior art keywords
transistor
type
substrate
diamond
regions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB8912354A
Other versions
GB8912354D0 (en
GB2228141B (en
Inventor
Christopher Mark Welbourn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gersan Ets
Original Assignee
Gersan Ets
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gersan Ets filed Critical Gersan Ets
Publication of GB8912354D0 publication Critical patent/GB8912354D0/en
Priority to KR1019910700819A priority Critical patent/KR0146039B1/en
Priority to JP2502686A priority patent/JP2557567B2/en
Priority to EP90902330A priority patent/EP0456682B1/en
Priority to DE69014861T priority patent/DE69014861T2/en
Priority to US07/721,558 priority patent/US5177585A/en
Priority to PCT/GB1990/000143 priority patent/WO1990009033A1/en
Priority to AU49619/90A priority patent/AU630663B2/en
Priority to CA002046284A priority patent/CA2046284C/en
Publication of GB2228141A publication Critical patent/GB2228141A/en
Application granted granted Critical
Publication of GB2228141B publication Critical patent/GB2228141B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/20Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/16Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
    • H01L29/1602Diamond
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/72Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/73Bipolar junction transistors
    • H01L29/735Lateral transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Bipolar Transistors (AREA)
  • Carbon And Carbon Compounds (AREA)

Abstract

A P-N-P diamond transistor (10) comprises a diamond substrate (12) having two p-type semiconducting regions (14) separated by an insulating region (16) with an n-type semiconducting layer (18) established by chemical vapour deposition. Preferably the p-type regions (14) are obtained by doping with boron and controlling the concentration of nitrogen impurities by the use of nitrogen getters. The n-type layer (18) preferably contains phosphorus. <IMAGE>

Description

P-N-P DIAMOND TRANSISTOR The present invention relates to a P-N-P diamond transistor and a method of manufacture thereof.
It is known that although most synthetic diamonds contain impurities such as nitrogen, such impurities do not result in semiconduction at normal temperatures and pressures. Formation of semiconducting diamond materials has been achieved by doping with boron at extremely high pressures. There has not, however. been any known proposal to form a P-N-P diamond transistor of simple construction and relatively straightforward manufacture. The present invention seeks to provide a transistor and a method of manufacture thereof which can meet these requirements.
According to a first aspect of the present invention there is provided a method of manufacturing a transistor comprising the steps of: providing a diamond substrate, doping two separate regions of the substrate with a p-type impurity to produce respective semiconducting regions. and using chemical vapour deposition to provide an n-type layer of semiconducting diamond. whereby a P-N-P transistor structure is obtained.
According to a second aspect of the present invention there is provided a transitor comprising; a diamond substrate having two p-type semiconducting regions separated by an insulating region, and an n-type semiconducting layer established by chemical vapour deposition, whereby a P-N-P structure is formed.
Beneficially the p-type regions contain boron.
Advantageously the n-type layer contains phosphorus.
Preferably, nitrogen getters are introduced in the reaction mass to control the nitrogen donor content of the substrate which in turn affects the number of uncompensated boron acceptors.
An embodiment of the present invention will now be described by way of example only and with reference to the accompanying drawing which is a diagrammatic illustration of a section through a transistor manufactured in accordance with the present invention.
As illustrated in the drawing, the transistor 10 comprises a diamond substrate 12 having two p-type semiconducting regions 14 separated by an insulating region 16. An n-type semiconducting layer 18 is established by chemical vapour deposition so as to contact the p-type regions 14 and form a P-N-P structure. Respective electrical contacts 20 are bonded to the p-type regions 14 and the n-type layer 18. Thus, a P-N-P diamond transistor is achieved.
Most synthetic diamonds contain nitrogen as impurities in the form of isolated nitrogen atoms substituting for carbon in the diamond lattice. Each nitrogen atom has one more electron than is necessary to satisfy the covalent bonding requirements of the diamond lattice so that there is a donor energy level in the band gap between the valence band and the conducting band. The position of the donor level is too deep in energy below the conduction band to give rise to n-type electrical semiconduction at realistic temperatures so the diamond remains an electrical insulator.
In general, synthetic diamonds (both self-nucleated diamond grit and larger, seed-grown diamonds grown by the temperature-gradient technique) have a cubo-octahedral morphology, often modified by minor #llOi and C113) facets. The concentration of isolated substitutional nitrogen is different in the different types of growth sector, being highest for #1l1i (i.e. octahedral) sectors, lower for {lOOl (i.e. cube) sectors, lower still for t113) (i.e.
trapezoidal) sectors and lowest for #11OJ (i.e.
dodecahedral) sectors. It has been found that the total amount of nitrogen in a synthtic diamond can be controlled by the incorporation of nitrogen getters into the synthesis capsule.
Provided that the total nitrogen concentration is sufficiently low, doping the synthesis capsule with a small amount of boron will produce p-type semiconducting diamond. Boron is taken up preferentially by t sectors, then by t11O} sectors and by a smaller amount by #1OOJ and 1113) sectors. However, the boron acceptor defects are usually compensated by nitrogen donor defects. P-type semiconduction results only from uncompensated boron defects, i.e. when the boron concentration is greater than the nitrogen concentration. It has been found that by controlling the amount of nitrogen getter and boron additive in the synthesis capsule, it is possible to grow diamonds with sectors of p-type semiconducting material between sectors of insulating material.
Although nitrogen defects do not produce n-type semiconduction at realistic temperatures, the incorporation of phosphorus atoms into diamond could lead to n-type semiconduction. In practice, attempts to produce n-type semiconducting diamond by doping a high-pressure synthesis capsule with phosphorus have been unsuccessful. This invention recognises that n-type semiconducting diamond can be obtained using the technique of chemical vapour depositon (CVD). Phosphorus may be used as the CVD dopant.
One embodiment of the invention has been described with reference to the accompanying drawing. However. it will be readily apparent to those skilled in the art, from a review of the above description, that various modifications may be made within the scope of the invention.

Claims (12)

CLAIMS:
1. A method of manufacturing a transistor comprising the steps of: providing a diamond substrate, doping two separate regions of the substrate with a p-type impurity to form respective semiconducting regions, and using chemical vapour deposition to provide an n-type layer of semiconducting diamond, whereby a P-N-P transistor structure is obtained.
2. A method as claimed in claim 1, wherein said n-type layer contains phosphorus.
3. A method as claimed in claim 1 or 2, wherein said p-type impurity is boron.
4. A method as claimed in any preceding claim, further including the step of introducing nitrogen getters to control the nitrogen donor content of the substrate so as to control the number of uncompensated boron acceptors
5. A method as claimed in claim 4, wherein said step of introducing nitrogen getters includes controlling the nitrogen donor content of the substrate such that the p-type semiconductor regions are separated by an insulating region.
6. A transistor comprising; a diamond substrate having two p-type semiconducting regions, and an n-type semiconducting layer established by chemical vapour deposition, whereby a P-N-P structure is formed.
7. A transistor as claimed in claim 6, wherein the n-type layer contains phosphorus.
8. A transistor as claimed in claim 6 or 7, wherein the p-type regions contain boron.
9. A transistor as claimed in any of claims 6-8, wherein the number of uncompensated boron acceptors in the substrate has been reduced by control of the nitrogen donor content of the substrate.
10. A transistor as claimed in claim 9, wherein the number of uncompensated boron acceptors in the substrate is such that the p-type semiconducting regions are separated by an insulating region.
11. A method of manufacturing a P-N-P transistor substantially as hereinbefore described with reference to the accompanying drawing.
12. A P-N-P transistor substantially as hereinbefore described with reference to and as illustrated in the accompanying drawing.
GB8912354A 1989-02-01 1989-05-30 P-n-p diamond transistor Expired - Fee Related GB2228141B (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
US07/721,558 US5177585A (en) 1989-02-01 1990-02-01 P-n-p diamond transistor
JP2502686A JP2557567B2 (en) 1989-02-01 1990-02-01 P-NP diamond transistor and method of manufacturing the same
EP90902330A EP0456682B1 (en) 1989-02-01 1990-02-01 P-n-p diamond transistor
DE69014861T DE69014861T2 (en) 1989-02-01 1990-02-01 P-N-P DIAMOND TRANSISTOR.
KR1019910700819A KR0146039B1 (en) 1989-02-01 1990-02-01 P-n-p diamond transistor
PCT/GB1990/000143 WO1990009033A1 (en) 1989-02-01 1990-02-01 P-n-p diamond transistor
AU49619/90A AU630663B2 (en) 1989-02-01 1990-02-01 P-n-p diamond transistor
CA002046284A CA2046284C (en) 1989-02-01 1990-02-01 P-n-p diamond transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB898902135A GB8902135D0 (en) 1989-02-01 1989-02-01 P-n-p diamond transistor

Publications (3)

Publication Number Publication Date
GB8912354D0 GB8912354D0 (en) 1989-07-12
GB2228141A true GB2228141A (en) 1990-08-15
GB2228141B GB2228141B (en) 1992-11-18

Family

ID=10650914

Family Applications (2)

Application Number Title Priority Date Filing Date
GB898902135A Pending GB8902135D0 (en) 1989-02-01 1989-02-01 P-n-p diamond transistor
GB8912354A Expired - Fee Related GB2228141B (en) 1989-02-01 1989-05-30 P-n-p diamond transistor

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB898902135A Pending GB8902135D0 (en) 1989-02-01 1989-02-01 P-n-p diamond transistor

Country Status (2)

Country Link
KR (1) KR0146039B1 (en)
GB (2) GB8902135D0 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2252202A (en) * 1991-01-28 1992-07-29 Kobe Steel Ltd Semiconducting polycrystalline diamond electronic devices employing an insulating diamond layer
GB2317399A (en) * 1996-09-03 1998-03-25 Nat Inst Res Inorganic Mat Phosphorus-doped diamond

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2252202A (en) * 1991-01-28 1992-07-29 Kobe Steel Ltd Semiconducting polycrystalline diamond electronic devices employing an insulating diamond layer
GB2252202B (en) * 1991-01-28 1994-12-14 Kobe Steel Ltd Semiconducting polycrystalline diamond electronic devices employing an insulating diamond layer and method of making same
GB2317399A (en) * 1996-09-03 1998-03-25 Nat Inst Res Inorganic Mat Phosphorus-doped diamond
US5961717A (en) * 1996-09-03 1999-10-05 National Institute For Research In Inorganic Materials Synthesis of phosphorus-doped diamond
GB2317399B (en) * 1996-09-03 2000-05-10 Nat Inst Res Inorganic Mat Synthesis of phosphorus-doped diamond

Also Published As

Publication number Publication date
GB8902135D0 (en) 1989-03-22
GB8912354D0 (en) 1989-07-12
KR0146039B1 (en) 1998-11-02
KR920702015A (en) 1992-08-12
GB2228141B (en) 1992-11-18

Similar Documents

Publication Publication Date Title
US8097524B2 (en) Lightly doped silicon carbide wafer and use thereof in high power devices
JP3650727B2 (en) Silicon carbide manufacturing method
KR100940863B1 (en) Strained transistor integration for cmos
CN100580951C (en) Semiconductor device and manufacturing method thereof
JPH0697666B2 (en) Semiconductor device structure using multi-level epitaxial structure and manufacturing method thereof
US20060289873A1 (en) Semiconductor devices and methods of making same
KR970053503A (en) Semiconductor device having a gate electrode and a shallow impurity region that eliminates short circuit between source and drain regions and process for manufacturing same
CN1732556A (en) Method of forming a thick strained silicon layer and semiconductor structures incorporating a thick strained silicon layer
Davis Epitaxial growth and doping of and device development in monocyrstalline β-SiC semiconductor thin films
EP3141635B1 (en) Semiconductor substrate, epitaxial wafer, and method for manufacturing epitaxial wafer
US6744079B2 (en) Optimized blocking impurity placement for SiGe HBTs
US5177585A (en) P-n-p diamond transistor
US3765960A (en) Method for minimizing autodoping in epitaxial deposition
GB2228141A (en) P-N-P Diamond transistor
JPS6270295A (en) Production of n-type semiconductive diamond film
US4939102A (en) Method of growing III-V semiconductor layers with high effective hole concentration
CN103443902A (en) Semiconductor device and method for growing semiconductor crystal
CN107492570B (en) Composite current spreading layer and manufacturing method thereof
JPH07105353B2 (en) Semiconductor diamond and method for manufacturing the same
JP2645439B2 (en) Semiconductor diamond and its manufacturing method
JP6578994B2 (en) Semiconductor substrate composed of silicon carbide and method of manufacturing the same
CN111293037A (en) P-type SiC epitaxy and growth method thereof
KR930002319B1 (en) Transistor manufacturing method
JPH0777205B2 (en) Semiconductor diamond and method for manufacturing the same
JPH02244677A (en) Diamond semiconductor device

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20060530