GB2184555B - Procedure for assembling or extending a module library for the generation of an in-circuit test program for printed circuit boards - Google Patents

Procedure for assembling or extending a module library for the generation of an in-circuit test program for printed circuit boards

Info

Publication number
GB2184555B
GB2184555B GB8629664A GB8629664A GB2184555B GB 2184555 B GB2184555 B GB 2184555B GB 8629664 A GB8629664 A GB 8629664A GB 8629664 A GB8629664 A GB 8629664A GB 2184555 B GB2184555 B GB 2184555B
Authority
GB
United Kingdom
Prior art keywords
assembling
procedure
generation
extending
test program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB8629664A
Other versions
GB8629664D0 (en
GB2184555A (en
Inventor
Hans-Joachim Beese
Lothar Tschimpke
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Publication of GB8629664D0 publication Critical patent/GB8629664D0/en
Publication of GB2184555A publication Critical patent/GB2184555A/en
Application granted granted Critical
Publication of GB2184555B publication Critical patent/GB2184555B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
GB8629664A 1985-12-11 1986-12-11 Procedure for assembling or extending a module library for the generation of an in-circuit test program for printed circuit boards Expired - Fee Related GB2184555B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19853543699 DE3543699A1 (en) 1985-12-11 1985-12-11 METHOD FOR TESTING THE INDIVIDUAL COMPONENTS OF A CIRCUIT BOARD (IN-CIRCUIT TEST)

Publications (3)

Publication Number Publication Date
GB8629664D0 GB8629664D0 (en) 1987-01-21
GB2184555A GB2184555A (en) 1987-06-24
GB2184555B true GB2184555B (en) 1990-08-01

Family

ID=6288146

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8629664A Expired - Fee Related GB2184555B (en) 1985-12-11 1986-12-11 Procedure for assembling or extending a module library for the generation of an in-circuit test program for printed circuit boards

Country Status (2)

Country Link
DE (1) DE3543699A1 (en)
GB (1) GB2184555B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4309842C1 (en) * 1993-03-26 1994-06-16 Arnold Edv Gmbh IC circuit board testing system - uses comparison impedances obtained across test pins for fault-free circuit board during learning phase
FR2815414B1 (en) * 2000-10-17 2003-02-07 Larisys DEVICE AND METHOD FOR TESTING AN ELECTROMECHANICAL APPARATUS
DE102019121903A1 (en) * 2019-08-14 2021-02-18 Seg Automotive Germany Gmbh Method for producing an assembly with several semiconductor components, assembly and use of an assembly

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1498125A (en) * 1974-07-01 1978-01-18 Xerox Corp Digital circuit module test system
GB2001178A (en) * 1977-07-15 1979-01-24 Fluke Trendar Programmable circuit system tester
GB2019014A (en) * 1978-04-13 1979-10-24 Ncr Co Testing apparatus for testing printed circuit boards
EP0042222A2 (en) * 1980-06-17 1981-12-23 Zehntel, Inc. Programmable sequence generator for in-circuit digital tester
GB2086061A (en) * 1980-10-13 1982-05-06 Marconi Instruments Ltd Automatic test systems
EP0077736A2 (en) * 1981-10-19 1983-04-27 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Test vector indexing method and apparatus
WO1984002412A1 (en) * 1982-12-15 1984-06-21 Equipment Sales Company Inc High speed testing of complex circuits
EP0128774A2 (en) * 1983-06-13 1984-12-19 Hewlett-Packard Company High throughput circuit tester and test technique avoiding overdriving damage

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1498125A (en) * 1974-07-01 1978-01-18 Xerox Corp Digital circuit module test system
GB2001178A (en) * 1977-07-15 1979-01-24 Fluke Trendar Programmable circuit system tester
GB2019014A (en) * 1978-04-13 1979-10-24 Ncr Co Testing apparatus for testing printed circuit boards
EP0042222A2 (en) * 1980-06-17 1981-12-23 Zehntel, Inc. Programmable sequence generator for in-circuit digital tester
GB2086061A (en) * 1980-10-13 1982-05-06 Marconi Instruments Ltd Automatic test systems
EP0077736A2 (en) * 1981-10-19 1983-04-27 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Test vector indexing method and apparatus
WO1984002412A1 (en) * 1982-12-15 1984-06-21 Equipment Sales Company Inc High speed testing of complex circuits
EP0128774A2 (en) * 1983-06-13 1984-12-19 Hewlett-Packard Company High throughput circuit tester and test technique avoiding overdriving damage

Also Published As

Publication number Publication date
GB8629664D0 (en) 1987-01-21
GB2184555A (en) 1987-06-24
DE3543699A1 (en) 1987-06-19
DE3543699C2 (en) 1989-02-23

Similar Documents

Publication Publication Date Title
GB2242081B (en) A probe useful for testing printed circuit boards
DE3175044D1 (en) Test apparatus for testing runs of a circuit board with at least one test head comprising a plurality of flexible contacts
DE3565036D1 (en) Mechanical and electrical assembling device for highly integrated electronic computer circuit boards
GB8319790D0 (en) Checking connections of printed circuit board
AR242330A1 (en) Arrangement for modifying electrical printed circuit boards
JPS53116477A (en) Mounting tool and cable assembly for testing printed circuit board
HK18697A (en) Adapter for a device for testing printed circuit boards
GB8430270D0 (en) Printed circuit board test fixture
EP0213446A3 (en) Connector for printed circuit boards
GB2156532B (en) Apparatus for testing a printed circuit board
DE3469472D1 (en) Connection device for testing a printed circuit
GB8729387D0 (en) Printed circuit board & method for inspecting printed circuit boards for missing/misplaced components
KR860004568A (en) Apparatus for placing electronic and electrical components on a board
GB2046141B (en) Inserting assembly for automatically inserting parallel lead electronic components into openings in a printed circuit board
GB2184555B (en) Procedure for assembling or extending a module library for the generation of an in-circuit test program for printed circuit boards
GB2150468B (en) Inserting electronic components into printed circuit boards
DE3461237D1 (en) Test-lead point for a testing apparatus for examining printed-circuit boards
GB2159345B (en) An assembly for releasably securing an electronic component to a printed circuit board
GB2097938B (en) Bending test for flexi-rigid printed circuit boards
GB8408917D0 (en) Printed circuit board testers
GB8401973D0 (en) Circuit board testing
GB8603291D0 (en) Fixing printed circuit board on worktable
DE3562827D1 (en) Electronic circuit for measuring very weak signals superposed on a high potential
GB2215064B (en) Testing printed circuit boards
GB8612929D0 (en) Testing printed circuit board

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19921211