GB8629664D0 - Assembling & disassembling module library - Google Patents

Assembling & disassembling module library

Info

Publication number
GB8629664D0
GB8629664D0 GB868629664A GB8629664A GB8629664D0 GB 8629664 D0 GB8629664 D0 GB 8629664D0 GB 868629664 A GB868629664 A GB 868629664A GB 8629664 A GB8629664 A GB 8629664A GB 8629664 D0 GB8629664 D0 GB 8629664D0
Authority
GB
United Kingdom
Prior art keywords
assembling
module library
disassembling module
disassembling
library
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB868629664A
Other versions
GB2184555A (en
GB2184555B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Publication of GB8629664D0 publication Critical patent/GB8629664D0/en
Publication of GB2184555A publication Critical patent/GB2184555A/en
Application granted granted Critical
Publication of GB2184555B publication Critical patent/GB2184555B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
GB8629664A 1985-12-11 1986-12-11 Procedure for assembling or extending a module library for the generation of an in-circuit test program for printed circuit boards Expired - Fee Related GB2184555B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19853543699 DE3543699A1 (en) 1985-12-11 1985-12-11 METHOD FOR TESTING THE INDIVIDUAL COMPONENTS OF A CIRCUIT BOARD (IN-CIRCUIT TEST)

Publications (3)

Publication Number Publication Date
GB8629664D0 true GB8629664D0 (en) 1987-01-21
GB2184555A GB2184555A (en) 1987-06-24
GB2184555B GB2184555B (en) 1990-08-01

Family

ID=6288146

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8629664A Expired - Fee Related GB2184555B (en) 1985-12-11 1986-12-11 Procedure for assembling or extending a module library for the generation of an in-circuit test program for printed circuit boards

Country Status (2)

Country Link
DE (1) DE3543699A1 (en)
GB (1) GB2184555B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4309842C1 (en) * 1993-03-26 1994-06-16 Arnold Edv Gmbh IC circuit board testing system - uses comparison impedances obtained across test pins for fault-free circuit board during learning phase
FR2815414B1 (en) * 2000-10-17 2003-02-07 Larisys DEVICE AND METHOD FOR TESTING AN ELECTROMECHANICAL APPARATUS
DE102019121903A1 (en) * 2019-08-14 2021-02-18 Seg Automotive Germany Gmbh Method for producing an assembly with several semiconductor components, assembly and use of an assembly

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4000460A (en) * 1974-07-01 1976-12-28 Xerox Corporation Digital circuit module test system
US4125763A (en) * 1977-07-15 1978-11-14 Fluke Trendar Corporation Automatic tester for microprocessor board
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
US4339819A (en) * 1980-06-17 1982-07-13 Zehntel, Inc. Programmable sequence generator for in-circuit digital testing
GB2086061B (en) * 1980-10-13 1985-05-22 Marconi Instruments Ltd Automatic test systems
US4493045A (en) * 1981-10-19 1985-01-08 Fairchild Camera & Instrument Corp. Test vector indexing method and apparatus
WO1984002412A1 (en) * 1982-12-15 1984-06-21 Equipment Sales Company Inc High speed testing of complex circuits
US4588945A (en) * 1983-06-13 1986-05-13 Hewlett-Packard Company High throughput circuit tester and test technique avoiding overdriving damage

Also Published As

Publication number Publication date
GB2184555A (en) 1987-06-24
DE3543699C2 (en) 1989-02-23
DE3543699A1 (en) 1987-06-19
GB2184555B (en) 1990-08-01

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19921211