GB2088058B - Measuring ccoating thickness - Google Patents

Measuring ccoating thickness

Info

Publication number
GB2088058B
GB2088058B GB8135283A GB8135283A GB2088058B GB 2088058 B GB2088058 B GB 2088058B GB 8135283 A GB8135283 A GB 8135283A GB 8135283 A GB8135283 A GB 8135283A GB 2088058 B GB2088058 B GB 2088058B
Authority
GB
United Kingdom
Prior art keywords
ccoating
measuring
thickness
measuring ccoating
ccoating thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8135283A
Other languages
English (en)
Other versions
GB2088058A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Balzers und Leybold Deutschland Holding AG
Original Assignee
Leybold Heraeus GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leybold Heraeus GmbH filed Critical Leybold Heraeus GmbH
Publication of GB2088058A publication Critical patent/GB2088058A/en
Application granted granted Critical
Publication of GB2088058B publication Critical patent/GB2088058B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/063—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using piezoelectric resonators
    • G01B7/066—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using piezoelectric resonators for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
GB8135283A 1980-11-24 1981-11-23 Measuring ccoating thickness Expired GB2088058B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT571080A AT382963B (de) 1980-11-24 1980-11-24 Messverfahren zur bestimmung der dicke duenner schichten

Publications (2)

Publication Number Publication Date
GB2088058A GB2088058A (en) 1982-06-03
GB2088058B true GB2088058B (en) 1984-09-05

Family

ID=3578812

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8135283A Expired GB2088058B (en) 1980-11-24 1981-11-23 Measuring ccoating thickness

Country Status (4)

Country Link
AT (1) AT382963B (enExample)
DE (1) DE3145309A1 (enExample)
FR (1) FR2494840A1 (enExample)
GB (1) GB2088058B (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3700366A1 (de) * 1987-01-08 1988-07-21 Leybold Ag Einrichtung zum ermitteln der jeweiligen dicke von sich veraendernden material-schichten auf einem substrat waehrend des beschichtungsvorgangs
EP0284678B1 (en) * 1987-03-31 1992-06-03 Benjamin Gavish A device and method for monitoring small displacements of a peak in a frequency spectrum
DE3920052A1 (de) * 1989-06-20 1991-01-10 Peter Dipl Ing Berg Messsystem zur bestimmung von traeger masse sowie daraus resultierender physikalischer eigenschaften mit hilfe eines auch in betriebsfaellen hoher und/oder variabler daempfung arbeitenden oszillators
US5112642A (en) * 1990-03-30 1992-05-12 Leybold Inficon, Inc. Measuring and controlling deposition on a piezoelectric monitor crystal
US6370955B1 (en) * 1999-06-15 2002-04-16 Massachusetts Institute Of Technology High-temperature balance
RU2194248C2 (ru) * 1999-10-25 2002-12-10 Закрытое акционерное общество "КОМПОМАШ-ТЭК" Способ определения толщины покрытия детали
JP2005049236A (ja) * 2003-07-29 2005-02-24 Kansai Paint Co Ltd 電着特性測定装置と評価方法及び管理方法
RU2257510C1 (ru) * 2004-03-01 2005-07-27 Шухостанов Владимир Кистуевич Способ определения толщины слоя парафинов на внутренней стороне нефте- и газопроводов
DE102006006172B3 (de) * 2006-02-10 2007-09-27 Carl Zeiss Ag Schichtdickenmessgerät insbesondere für Beschichtungsanlagen und Beschichtungsanlage mit einem solchen Schichtdickenmessgerät
CN116121686B (zh) * 2022-11-24 2023-08-04 广东粤水电新能源装备有限公司 一种基于大数据的风电塔自动喷锌系统

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
HU167641B (enExample) * 1974-02-07 1975-11-28
HU170602B (enExample) * 1975-05-05 1977-07-28

Also Published As

Publication number Publication date
ATA571080A (de) 1986-09-15
FR2494840A1 (fr) 1982-05-28
AT382963B (de) 1987-05-11
DE3145309A1 (de) 1982-06-16
FR2494840B1 (enExample) 1984-03-23
GB2088058A (en) 1982-06-03

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19921123