GB2066590A - Test pin - Google Patents

Test pin Download PDF

Info

Publication number
GB2066590A
GB2066590A GB8035306A GB8035306A GB2066590A GB 2066590 A GB2066590 A GB 2066590A GB 8035306 A GB8035306 A GB 8035306A GB 8035306 A GB8035306 A GB 8035306A GB 2066590 A GB2066590 A GB 2066590A
Authority
GB
United Kingdom
Prior art keywords
plunger
spring
test pin
housing
insert
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB8035306A
Other versions
GB2066590B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of GB2066590A publication Critical patent/GB2066590A/en
Application granted granted Critical
Publication of GB2066590B publication Critical patent/GB2066590B/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Springs (AREA)

Abstract

A test pin (10) has a spring- loaded plunger (24) which is offset to one side to ensure electrical contact between it and a conductive housing (18). The means for providing the offset may comprise an upper portion (30) of a spring (28) bent to one side. <IMAGE>

Description

SPECIFICATION Test pin This invention relates to test pins useful, for example, in testing the electrical characteristics of printed circuit boards (PCB's).
Spring-loaded test pins are known in the art.
U.S. Patent 4,105,970 discloses a test pin assembly having a cylindrical plunger with a PCBcontacting crown, the plunger being slidably mounted within a tubular housing and spring biased. A problem that has been noted with such a construction is that occasionally there will be insufficient contact force between the lower portion of the plunger and the housing, resulting in lack of electrical contact between the PCB and the analyzing instrument.
It has been discovered that improved electrical contact can be provided for a test pin assembly by including means to bias the plunger, thereby improving electrical contact between the plunger and housing. In a preferred embodiment the upper portion of the spring that engages the plunger is tilted at an angie prior to its connection to the plunger in the assembly of the test pin and is offcenter.
Presently preferred embodiments of the invention will now be more particularly described by way of example and with reference to the accompanying drawings in which: Fig. 1 is a vertical sectional view, partially broken away, of a portion of a test pin assembly of the invention; and Fig. 2 is a side elevation view of the spring of one of the preferred embodiment.
There is shown in Fig. 1 portion 10 of an upper assembly of a test pin similar to that disclosed in U.S. Patent 4105970. Tubular housing 12 has dimple 14 for frictionally engaging insert 1 6, which has edge 1 8 of narrow diameter. Plunger 20 has pointed crown 22 on its upper end, iarge diameter portion 24 and tapered portion 26, which is biased against upper edge 1 8 by spring 28. Housing 12, insert 16, and plunger 20 are all made of hardened beryllium copper, plated with nickel and then gold. Spring 28 is made of stainless steel 5/1000 of an inch in diameter with a total of 31 turns. Spring 28 has two windings 30 at its upper end which are of a smaller diameter and frictionally engage stud 32 of plunger 20. Fig.
1 is diagrammatic in that the left-hand side of insert 1 6 is not shown forced against the inner surface of the left-hand wall of housing 12, but in reality it is so forced by dimple 14. Although not evident in Fig. 1, the upper end windings 30 are offset 450 to the right with respect to the rest of the spring (Fig. 2), thereby forcing portion 24 of plunger 20 against the inner surface of the righthand wall of insert 18.
Operation of test pins is well known in the art.
With the test pin of the present invention, accidental, occasional undesired open circuits to the test pin crown are prevented.
Improved contact results not only from the forcing of plunger portion 24 against insert 18, but as well because of an electrical path through stud 32, the spring turns gripping it, and the top largerdiameter spring turn diagrammatically shown touching insert 1 6.
In another embodiment, the spring is symmetrical about a single straight line axis, but the stud axis is not coaxial therewith.
1. A test pin comprising: a tubular shaped housing, a plunger with a contacting end that is slidably mounted within said housing, a spring carried in said housing for resiliently biasing said plunger away from said spring, and means to offset said plunger to one side, whereby electrical contact between said plunger and said housing is improved.
2. The test pin of claim 1 in which said offset means is an upper smaller diameter portion of said spring bent to one side, said upper portion engaging said plunger.
3. A test pin substantially as hereinbefore described with reference to the accompanying drawings.
**WARNING** end of DESC field may overlap start of CLMS **.

Claims (3)

**WARNING** start of CLMS field may overlap end of DESC **. SPECIFICATION Test pin This invention relates to test pins useful, for example, in testing the electrical characteristics of printed circuit boards (PCB's). Spring-loaded test pins are known in the art. U.S. Patent 4,105,970 discloses a test pin assembly having a cylindrical plunger with a PCBcontacting crown, the plunger being slidably mounted within a tubular housing and spring biased. A problem that has been noted with such a construction is that occasionally there will be insufficient contact force between the lower portion of the plunger and the housing, resulting in lack of electrical contact between the PCB and the analyzing instrument. It has been discovered that improved electrical contact can be provided for a test pin assembly by including means to bias the plunger, thereby improving electrical contact between the plunger and housing. In a preferred embodiment the upper portion of the spring that engages the plunger is tilted at an angie prior to its connection to the plunger in the assembly of the test pin and is offcenter. Presently preferred embodiments of the invention will now be more particularly described by way of example and with reference to the accompanying drawings in which: Fig. 1 is a vertical sectional view, partially broken away, of a portion of a test pin assembly of the invention; and Fig. 2 is a side elevation view of the spring of one of the preferred embodiment. There is shown in Fig. 1 portion 10 of an upper assembly of a test pin similar to that disclosed in U.S. Patent 4105970. Tubular housing 12 has dimple 14 for frictionally engaging insert 1 6, which has edge 1 8 of narrow diameter. Plunger 20 has pointed crown 22 on its upper end, iarge diameter portion 24 and tapered portion 26, which is biased against upper edge 1 8 by spring 28. Housing 12, insert 16, and plunger 20 are all made of hardened beryllium copper, plated with nickel and then gold. Spring 28 is made of stainless steel 5/1000 of an inch in diameter with a total of 31 turns. Spring 28 has two windings 30 at its upper end which are of a smaller diameter and frictionally engage stud 32 of plunger 20. Fig. 1 is diagrammatic in that the left-hand side of insert 1 6 is not shown forced against the inner surface of the left-hand wall of housing 12, but in reality it is so forced by dimple 14. Although not evident in Fig. 1, the upper end windings 30 are offset 450 to the right with respect to the rest of the spring (Fig. 2), thereby forcing portion 24 of plunger 20 against the inner surface of the righthand wall of insert 18. Operation of test pins is well known in the art. With the test pin of the present invention, accidental, occasional undesired open circuits to the test pin crown are prevented. Improved contact results not only from the forcing of plunger portion 24 against insert 18, but as well because of an electrical path through stud 32, the spring turns gripping it, and the top largerdiameter spring turn diagrammatically shown touching insert 1 6. In another embodiment, the spring is symmetrical about a single straight line axis, but the stud axis is not coaxial therewith. CLAIMS
1. A test pin comprising: a tubular shaped housing, a plunger with a contacting end that is slidably mounted within said housing, a spring carried in said housing for resiliently biasing said plunger away from said spring, and means to offset said plunger to one side, whereby electrical contact between said plunger and said housing is improved.
2. The test pin of claim 1 in which said offset means is an upper smaller diameter portion of said spring bent to one side, said upper portion engaging said plunger.
3. A test pin substantially as hereinbefore described with reference to the accompanying drawings.
GB8035306A 1979-12-26 1980-11-03 Test pin Expired GB2066590B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10702779A 1979-12-26 1979-12-26

Publications (2)

Publication Number Publication Date
GB2066590A true GB2066590A (en) 1981-07-08
GB2066590B GB2066590B (en) 1984-02-15

Family

ID=22314479

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8035306A Expired GB2066590B (en) 1979-12-26 1980-11-03 Test pin

Country Status (5)

Country Link
JP (1) JPS5953507B2 (en)
CA (1) CA1162243A (en)
DE (1) DE3038937A1 (en)
FR (1) FR2472773B1 (en)
GB (1) GB2066590B (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2166913A (en) * 1984-11-13 1986-05-14 Tektronix Inc Impedance matched test probe
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
FR2614105A1 (en) * 1987-04-16 1988-10-21 Teradyne Inc APPARATUS AND PROBE FOR TESTING PRINTED CIRCUIT BOARDS
FR2621701A1 (en) * 1987-10-09 1989-04-14 Feinmetall Gmbh Contact device for test equipment
US5189364A (en) * 1990-07-30 1993-02-23 Nhk Spring Co., Ltd. Contact probe
US5200695A (en) * 1990-07-30 1993-04-06 Nhk Spring Co., Ltd. Contact probe
US5254939A (en) * 1992-03-20 1993-10-19 Xandex, Inc. Probe card system
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
GB2346446A (en) * 1999-02-03 2000-08-09 Ando Electric Electro-optic probe
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
US20160041055A1 (en) * 2014-08-05 2016-02-11 Cory Z. Bousquet Small form factor pressure sensor
US10323998B2 (en) 2017-06-30 2019-06-18 Sensata Technologies, Inc. Fluid pressure sensor
US10488289B2 (en) 2016-04-11 2019-11-26 Sensata Technologies, Inc. Pressure sensors with plugs for cold weather protection and methods for manufacturing the plugs
US10545064B2 (en) 2017-05-04 2020-01-28 Sensata Technologies, Inc. Integrated pressure and temperature sensor
US10557770B2 (en) 2017-09-14 2020-02-11 Sensata Technologies, Inc. Pressure sensor with improved strain gauge
US10724907B2 (en) 2017-07-12 2020-07-28 Sensata Technologies, Inc. Pressure sensor element with glass barrier material configured for increased capacitive response
US10871413B2 (en) 2016-04-20 2020-12-22 Sensata Technologies, Inc. Method of manufacturing a pressure sensor

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3225907A1 (en) * 1982-07-10 1984-01-12 Feinmetall Gmbh, 7033 Herrenberg Elastic contact module for measuring and testing purposes
DE3410093A1 (en) * 1984-03-20 1985-10-03 Feinmetall Gmbh, 7033 Herrenberg Spring contact pin and a method for its production
DE3424210A1 (en) * 1984-06-30 1986-01-09 Feinmetall Gmbh, 7033 Herrenberg Contact element for a test adaptor
JPS6179273U (en) * 1984-10-29 1986-05-27
DE3441480A1 (en) * 1984-11-13 1986-05-15 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH, 6384 Schmitten CONTACT PEN
DE3500227A1 (en) * 1985-01-05 1986-07-10 Riba-Prüftechnik GmbH, 7801 Schallstadt Probe needle
EP0292590A1 (en) * 1987-05-26 1988-11-30 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Contact device for testing equipment
DE3920850A1 (en) * 1989-06-24 1991-01-10 Feinmetall Gmbh SPRING CONTACT PIN
JPH0531656U (en) * 1991-10-14 1993-04-27 フランスベツド株式会社 Bed device
DE19511565A1 (en) * 1995-03-29 1996-10-02 Atg Test Systems Gmbh Test adapter
US5801544A (en) * 1997-01-16 1998-09-01 Delaware Capital Formation, Inc. Spring probe and method for biasing
US5781023A (en) * 1997-01-31 1998-07-14 Delware Capital Formation, Inc. Hollow plunger test probe
DE19811795C1 (en) * 1998-03-18 1999-09-02 Atg Test Systems Gmbh Needle for test adapter for populated or unpopulated circuit boards
JP5486760B2 (en) * 2006-07-04 2014-05-07 株式会社エンプラス Contact pin and socket for electrical parts
DE102012101929B4 (en) * 2012-03-07 2015-02-19 Federnfabrik Dietz Gmbh Spring sleeve, spring pin and method and apparatus for producing a spring sleeve and a spring pin
JP6201138B2 (en) * 2013-07-18 2017-09-27 株式会社トキワ Cosmetic container

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3435168A (en) * 1968-03-28 1969-03-25 Pylon Co Inc Electrical contact
DE1765461B2 (en) * 1968-05-22 1976-12-16 Bossert, Anneliese, 7530 Pforzheim SPRING CONTACT
CH589947A5 (en) * 1974-02-13 1977-07-29 Ingun Ag Test pin for printed circuit boards - with spring loaded shank in barrel and test end with conical hollow for boards test point
US4050762A (en) * 1976-11-10 1977-09-27 Everett/Charles, Inc. Telescoping spring probe having separate wiper contact member
US4105970A (en) * 1976-12-27 1978-08-08 Teradyne, Inc. Test pin

Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4740746A (en) * 1984-11-13 1988-04-26 Tektronix, Inc. Controlled impedance microcircuit probe
GB2166913A (en) * 1984-11-13 1986-05-14 Tektronix Inc Impedance matched test probe
FR2614105A1 (en) * 1987-04-16 1988-10-21 Teradyne Inc APPARATUS AND PROBE FOR TESTING PRINTED CIRCUIT BOARDS
FR2621701A1 (en) * 1987-10-09 1989-04-14 Feinmetall Gmbh Contact device for test equipment
US5189364A (en) * 1990-07-30 1993-02-23 Nhk Spring Co., Ltd. Contact probe
US5200695A (en) * 1990-07-30 1993-04-06 Nhk Spring Co., Ltd. Contact probe
US5254939A (en) * 1992-03-20 1993-10-19 Xandex, Inc. Probe card system
US5506498A (en) * 1992-03-20 1996-04-09 Xandex, Inc. Probe card system and method
US6107813A (en) * 1994-04-11 2000-08-22 Xandex, Inc. Probe card changer system and method
US5528158A (en) * 1994-04-11 1996-06-18 Xandex, Inc. Probe card changer system and method
US6288531B1 (en) 1999-02-03 2001-09-11 Ando Electric Co., Ltd. Probe for electro-optic sampling oscilloscope
GB2346446B (en) * 1999-02-03 2001-06-27 Ando Electric Probe for electro-optic sampling oscilloscope
GB2346446A (en) * 1999-02-03 2000-08-09 Ando Electric Electro-optic probe
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
US20160041055A1 (en) * 2014-08-05 2016-02-11 Cory Z. Bousquet Small form factor pressure sensor
US9568388B2 (en) * 2014-08-05 2017-02-14 Sensata Technologies, Inc. Small form factor pressure sensor
US10488289B2 (en) 2016-04-11 2019-11-26 Sensata Technologies, Inc. Pressure sensors with plugs for cold weather protection and methods for manufacturing the plugs
US10871413B2 (en) 2016-04-20 2020-12-22 Sensata Technologies, Inc. Method of manufacturing a pressure sensor
US10545064B2 (en) 2017-05-04 2020-01-28 Sensata Technologies, Inc. Integrated pressure and temperature sensor
US11105698B2 (en) 2017-05-04 2021-08-31 Sensata Technologies, Inc. Method of assembling a sensing device having a double clinch seal
US10323998B2 (en) 2017-06-30 2019-06-18 Sensata Technologies, Inc. Fluid pressure sensor
US10969288B2 (en) 2017-06-30 2021-04-06 Sensata Technologies, Inc. Fluid pressure sensor
US10724907B2 (en) 2017-07-12 2020-07-28 Sensata Technologies, Inc. Pressure sensor element with glass barrier material configured for increased capacitive response
US10557770B2 (en) 2017-09-14 2020-02-11 Sensata Technologies, Inc. Pressure sensor with improved strain gauge

Also Published As

Publication number Publication date
DE3038937A1 (en) 1981-07-02
CA1162243A (en) 1984-02-14
JPS5953507B2 (en) 1984-12-25
GB2066590B (en) 1984-02-15
FR2472773A1 (en) 1981-07-03
JPS5694272A (en) 1981-07-30
FR2472773B1 (en) 1985-07-19

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee