GB2002169A - Apparatus for sample analysis - Google Patents

Apparatus for sample analysis

Info

Publication number
GB2002169A
GB2002169A GB7831824A GB7831824A GB2002169A GB 2002169 A GB2002169 A GB 2002169A GB 7831824 A GB7831824 A GB 7831824A GB 7831824 A GB7831824 A GB 7831824A GB 2002169 A GB2002169 A GB 2002169A
Authority
GB
United Kingdom
Prior art keywords
sample
microscope
laser beam
axis
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB7831824A
Other versions
GB2002169B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Balzers und Leybold Deutschland Holding AG
Original Assignee
Leybold Heraeus GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19772734918 external-priority patent/DE2734918A1/en
Priority claimed from DE2739828A external-priority patent/DE2739828C2/en
Application filed by Leybold Heraeus GmbH filed Critical Leybold Heraeus GmbH
Publication of GB2002169A publication Critical patent/GB2002169A/en
Application granted granted Critical
Publication of GB2002169B publication Critical patent/GB2002169B/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

An apparatus for analysing samples by bombarding a sample with electromagnetic radiation, preferably a pulsed laser beam, followed by analysis of the ions produced by the sample in a time of flight mass spectrometer 11. A microscope 5 serves both for collimating the laser beam and for observing the sample 6. An ion optics system 8, 9, 10 is mounted adjacent to a sample illuminating system 18 to 24 and the two systems can be moved together perpendicular to the axis of the ion optics system for selectively aligning the one system or the other with the axis 17 of the microscope 5 and the mass spectrometer 11. <IMAGE>
GB7831824A 1977-08-03 1978-08-01 Apparatus for sample analysis Expired GB2002169B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19772734918 DE2734918A1 (en) 1977-08-03 1977-08-03 Sample analyser using time-of-flight mass spectrometer - using pulsed laser beam to ionise sample adjacent to ion optics system
DE2739828A DE2739828C2 (en) 1977-09-03 1977-09-03 Device for analyzing samples

Publications (2)

Publication Number Publication Date
GB2002169A true GB2002169A (en) 1979-02-14
GB2002169B GB2002169B (en) 1982-01-06

Family

ID=25772453

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7831824A Expired GB2002169B (en) 1977-08-03 1978-08-01 Apparatus for sample analysis

Country Status (2)

Country Link
FR (1) FR2399660A1 (en)
GB (1) GB2002169B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0284683A2 (en) * 1987-03-30 1988-10-05 FISONS plc Apparatus for surface analysis
GB2416242A (en) * 2004-07-15 2006-01-18 Jeol Ltd A valve for isolating an orthogonal acceleration TOF mass analyser

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2162207B (en) * 1984-07-26 1989-05-10 Japan Res Dev Corp Semiconductor crystal growth apparatus
EP0995086B1 (en) * 1998-05-09 2007-11-14 Renishaw plc Electron microscope and spectroscopy system
US6885445B2 (en) 1998-05-09 2005-04-26 Renishaw Plc Electron microscope and spectroscopy system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2141387C3 (en) * 1971-08-18 1975-12-11 Ernst Dr. 8000 Muenchen Remy Process for the evaporation, destruction, excitation and / or ionization of sample material limited to micro-areas as well as arrangement for carrying out the process

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0284683A2 (en) * 1987-03-30 1988-10-05 FISONS plc Apparatus for surface analysis
US4829178A (en) * 1987-03-30 1989-05-09 Vg Instruments Group Limited Apparatus for surface analysis
EP0284683A3 (en) * 1987-03-30 1990-03-07 FISONS plc Apparatus for surface analysis
GB2416242A (en) * 2004-07-15 2006-01-18 Jeol Ltd A valve for isolating an orthogonal acceleration TOF mass analyser

Also Published As

Publication number Publication date
FR2399660A1 (en) 1979-03-02
GB2002169B (en) 1982-01-06
FR2399660B1 (en) 1983-10-07

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Legal Events

Date Code Title Description
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19960801