GB1530947A - Reflectance measuring method - Google Patents

Reflectance measuring method

Info

Publication number
GB1530947A
GB1530947A GB41548/76A GB4154876A GB1530947A GB 1530947 A GB1530947 A GB 1530947A GB 41548/76 A GB41548/76 A GB 41548/76A GB 4154876 A GB4154876 A GB 4154876A GB 1530947 A GB1530947 A GB 1530947A
Authority
GB
United Kingdom
Prior art keywords
sample
reflectance
output
oct
calculated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB41548/76A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1530947A publication Critical patent/GB1530947A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/52—Measurement of colour; Colour measuring devices, e.g. colorimeters using colour charts
    • G01J3/524—Calibration of colorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4742—Details of optical heads therefor, e.g. using optical fibres comprising optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
GB41548/76A 1975-10-10 1976-10-06 Reflectance measuring method Expired GB1530947A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/621,334 US4029419A (en) 1975-10-10 1975-10-10 Textile color analyzer calibration

Publications (1)

Publication Number Publication Date
GB1530947A true GB1530947A (en) 1978-11-01

Family

ID=24489743

Family Applications (1)

Application Number Title Priority Date Filing Date
GB41548/76A Expired GB1530947A (en) 1975-10-10 1976-10-06 Reflectance measuring method

Country Status (7)

Country Link
US (1) US4029419A (US20050065096A1-20050324-C00069.png)
JP (1) JPS5247788A (US20050065096A1-20050324-C00069.png)
CA (1) CA1059338A (US20050065096A1-20050324-C00069.png)
DE (1) DE2638398A1 (US20050065096A1-20050324-C00069.png)
FR (1) FR2327524A1 (US20050065096A1-20050324-C00069.png)
GB (1) GB1530947A (US20050065096A1-20050324-C00069.png)
IT (1) IT1077026B (US20050065096A1-20050324-C00069.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3036934A1 (de) * 1980-09-30 1982-05-13 Siemens AG, 1000 Berlin und 8000 München Zweistrahl-wechsellicht-kolorimeter
DE3339435A1 (de) * 1982-11-01 1984-05-03 Sentrol Systems Ltd., Downsview, Ontario Farbueberwachungsgeraet fuer eine laufende materialbahn
US4455090A (en) * 1979-07-26 1984-06-19 The Wiggins Teape Group Limited Apparatus for measuring surface reflectance characteristics

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JPS5249873A (en) * 1975-10-17 1977-04-21 Oki Electric Ind Co Ltd Chromaticity gradient analitical apparatus
DE2726606A1 (de) * 1977-06-13 1978-12-21 Max Planck Gesellschaft Medizinisches spektralfotometer
DE2954734C2 (de) * 1978-01-25 1995-10-19 Kyoto Daiichi Kagaku Kk Verfahren zur photometrischen Auswertung eines mit einer Flüssigkeit getränkten Teststreifens und Vorrichtung zur Durchführung des Verfahrens
JPS591977B2 (ja) * 1978-01-25 1984-01-14 株式会社京都第一科学 呈色試験紙を用いた分析方法
US4199816A (en) * 1978-06-28 1980-04-22 Humphrey Instruments, Inc. Optical calibration apparatus and procedure
US4259020A (en) * 1978-10-30 1981-03-31 Genevieve I. Hanscom Automatic calibration control for color grading apparatus
US4290699A (en) * 1979-04-04 1981-09-22 Idelson Elbert M Color synthesizing
JPS55138620A (en) * 1979-04-17 1980-10-29 Nippon Denshiyoku Kogyo Kk Photometric device
US4291975A (en) * 1979-10-03 1981-09-29 Scientific Gem Identification, Inc. Apparatus for determining the color characteristics of a gem
US4303611A (en) * 1980-08-11 1981-12-01 Eastman Kodak Company Analyzer apparatus featuring a simplified incubator
US4439038A (en) * 1981-03-03 1984-03-27 Sentrol Systems Ltd. Method and apparatus for measuring and controlling the color of a moving web
JPS598470A (ja) * 1982-07-06 1984-01-17 Matsushita Electric Ind Co Ltd 色分解光学系
CH651664A5 (fr) * 1982-10-14 1985-09-30 Nestle Sa Procede et appareil de mesure de la brillance d'une couleur.
JPS5970530A (ja) * 1982-10-15 1984-04-21 Matsushita Electric Works Ltd 樹脂フイルムの連続被覆装置
JPS5970529A (ja) * 1982-10-15 1984-04-21 Matsushita Electric Works Ltd 樹脂フイルムの連続被覆装置
JPS5970531A (ja) * 1982-10-15 1984-04-21 Matsushita Electric Works Ltd 樹脂フイルムの連続被覆装置
US5231595A (en) * 1983-06-06 1993-07-27 Minolta Camera Kabushiki Kaisha Pyrometer
US4602160A (en) * 1983-09-28 1986-07-22 Sentrol Systems Ltd. Infrared constituent analyzer and control system
US4566798A (en) * 1983-11-10 1986-01-28 Eastman Kodak Company Method for calibrating a reflectometer containing black and white references displaced from the sample position
JP2524691B2 (ja) * 1984-02-21 1996-08-14 住友化学工業株式会社 着色結果の予測方法
DE3407754A1 (de) * 1984-03-02 1985-09-12 Boehringer Mannheim Gmbh, 6800 Mannheim Geraet zur bestimmung des diffusen reflexionsvermoegens einer probenflaeche kleiner abmessungen
US4755058A (en) * 1984-06-19 1988-07-05 Miles Laboratories, Inc. Device and method for measuring light diffusely reflected from a nonuniform specimen
JPS6144533U (ja) * 1984-08-28 1986-03-24 横河電機株式会社 紙の光学的特性測定装置
JPS6165328U (US20050065096A1-20050324-C00069.png) * 1984-10-03 1986-05-06
US4931929A (en) * 1985-01-22 1990-06-05 Search & Source, Incorporated Design component selection computer with specification of product characteristics and of color by machine readable device
US4657398A (en) * 1985-06-10 1987-04-14 Miles Laboratories, Inc. Simultaneous multiple wavelength photometer
WO1987006011A1 (en) * 1986-03-24 1987-10-08 University Of Queensland Monitoring the presence of materials
US4884221A (en) * 1986-04-14 1989-11-28 Minolta Camera Kabushiki Kaisha Color measuring apparatus
DE3617869A1 (de) * 1986-05-27 1987-12-03 Hoesch Stahl Ag Spektralanalysenvorrichtung an einem konverter
US4729657A (en) * 1986-06-23 1988-03-08 Miles Laboratories, Inc. Method of calibrating reflectance measuring devices
DE3622043A1 (de) * 1986-07-01 1988-01-14 Georg Thoma Vorrichtung zur farbmessung
US4812412A (en) * 1987-02-26 1989-03-14 Health Research Inc. Standard specimen and method of making and using same
JPS63155032U (US20050065096A1-20050324-C00069.png) * 1987-03-31 1988-10-12
US4767933A (en) * 1987-07-21 1988-08-30 Storage Technology Corporation Optical ribbon edge sensor having means for adjusting the switch sensitivity to the selected ink color
JPH01253634A (ja) * 1988-04-01 1989-10-09 Fuji Photo Film Co Ltd 反射濃度測定装置
JPH073365B2 (ja) * 1988-06-08 1995-01-18 大日本クスリーン製造株式会社 顕微分光装置
US5077806A (en) * 1989-06-01 1991-12-31 Accuron Corporation Machine vision analysis apparatus
US5073857A (en) * 1989-06-01 1991-12-17 Accuron Corporation Method and apparatus for cell analysis
US5117101A (en) * 1990-08-13 1992-05-26 Technostics Corporation Tristimulus color recognition system with means for compensating for variations in light source color
US5319437A (en) * 1991-07-26 1994-06-07 Kollmorgen Corporation Handheld portable spectrophotometer
WO1994001755A1 (en) * 1992-07-02 1994-01-20 Michael Fredrick Feasey Method and calibration device for calibrating computer monitors used in the printing and textile industries
JPH0772012A (ja) * 1993-09-06 1995-03-17 Minolta Co Ltd 測色装置
FI935180A0 (fi) * 1993-11-22 1993-11-22 Rautaruukki Oy Konstruktion hos ett kalibreringsstycke, foerfarande foer utforming av den samma och kalibreringsfoerfarande
AU1551595A (en) * 1993-12-29 1995-07-17 Milliken Research Corporation Method and apparatus for determining directional variation of shade of pile and napped materials
US5654799A (en) * 1995-05-05 1997-08-05 Measurex Corporation Method and apparatus for measuring and controlling the surface characteristics of sheet materials such as paper
CA2179338C (en) * 1995-08-07 2000-04-25 Gordon Albert Thomas Apparatus and method for spectroscopic product recognition and identification
US5701173A (en) * 1996-02-20 1997-12-23 National Research Council Of Canada Method and apparatus for reducing the unwanted effects of noise present in a three dimensional color imaging system
US6459425B1 (en) 1997-08-25 2002-10-01 Richard A. Holub System for automatic color calibration
US5694215A (en) * 1996-03-04 1997-12-02 Carver; David R. Optical array and processing electronics and method therefor for use in spectroscopy
US5774209A (en) * 1996-10-08 1998-06-30 Spectronic Instruments, Inc. Transmittance cell for spectrophotometer
US5991046A (en) * 1998-07-14 1999-11-23 Valmet Automation Inc. Method and apparatus for optically measuring properties of a moving web
US6704108B2 (en) 2000-05-08 2004-03-09 Norbert Lauinger 3D grating optical sensor comprising a diffusion plate for conducting chromatometry with color constancy performance
CN1202414C (zh) * 2000-07-28 2005-05-18 大塚电子株式会社 自动光学测量方法
DE10043113C2 (de) 2000-08-31 2002-12-19 Pe Diagnostik Gmbh Verfahren zur Verbesserung der Messgenauigkeit bei Sensoren, insbesondere Bio-Sensoren, die Fluoreszenzstrahlung auswerten
US6842654B2 (en) * 2000-10-05 2005-01-11 Ewarna.Com International Holdings Limited System, and method for online color algorithm exchange
US8564780B2 (en) * 2003-01-16 2013-10-22 Jordan Valley Semiconductors Ltd. Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces
US20080246951A1 (en) * 2007-04-09 2008-10-09 Phillip Walsh Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work-pieces
US7126131B2 (en) * 2003-01-16 2006-10-24 Metrosol, Inc. Broad band referencing reflectometer
DE10330641A1 (de) * 2003-07-07 2005-02-03 Basf Coatings Ag Hochgenauer Remissionssensor zur Nassmessung von Lacken und Pigmentpasten
WO2005050150A1 (en) * 2003-11-10 2005-06-02 Ciba Specialty Chemicals Holding Inc. Process for matching a target color
DE102004048102A1 (de) * 2004-04-30 2006-04-20 Carl Zeiss Jena Gmbh Spektrometrischer Messkopf und Verfahren zu dessen Rekalibrierung
EP1615017A1 (en) * 2004-07-08 2006-01-11 Yokohama Electronic Communications & Solutions Co., Ltd. Colorimetry device
US7663097B2 (en) * 2004-08-11 2010-02-16 Metrosol, Inc. Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement
US7399975B2 (en) * 2004-08-11 2008-07-15 Metrosol, Inc. Method and apparatus for performing highly accurate thin film measurements
US7804059B2 (en) * 2004-08-11 2010-09-28 Jordan Valley Semiconductors Ltd. Method and apparatus for accurate calibration of VUV reflectometer
US7282703B2 (en) * 2004-08-11 2007-10-16 Metrosol, Inc. Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement
US7511265B2 (en) 2004-08-11 2009-03-31 Metrosol, Inc. Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement
WO2007130295A2 (en) * 2006-05-05 2007-11-15 Metrosol, Inc. Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement
US20080129986A1 (en) * 2006-11-30 2008-06-05 Phillip Walsh Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientations
US20090219537A1 (en) 2008-02-28 2009-09-03 Phillip Walsh Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths
US8153987B2 (en) * 2009-05-22 2012-04-10 Jordan Valley Semiconductors Ltd. Automated calibration methodology for VUV metrology system
JP5540354B2 (ja) * 2010-04-30 2014-07-02 独立行政法人 宇宙航空研究開発機構 校正機能を備えた反射率及び反射濃度の計測方法及びそれを実施するシステム
US8867041B2 (en) 2011-01-18 2014-10-21 Jordan Valley Semiconductor Ltd Optical vacuum ultra-violet wavelength nanoimprint metrology
US8565379B2 (en) 2011-03-14 2013-10-22 Jordan Valley Semiconductors Ltd. Combining X-ray and VUV analysis of thin film layers
ITMI20112154A1 (it) * 2011-11-25 2013-05-26 Dromont S P A Apparato e metodo di compensazione della riflessione speculare per uno spettrofotometro, nonche' sistema di misurazione del colore comprendente lo stesso apparato
CN107037007A (zh) * 2017-05-18 2017-08-11 北京奥博泰科技有限公司 一种带自动校准功能的玻璃反射比测量装置及方法

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GB1401957A (en) * 1971-08-12 1975-08-06 Paint Research Ass Colourimeters
JPS5132376B2 (US20050065096A1-20050324-C00069.png) * 1972-05-16 1976-09-11
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4455090A (en) * 1979-07-26 1984-06-19 The Wiggins Teape Group Limited Apparatus for measuring surface reflectance characteristics
DE3036934A1 (de) * 1980-09-30 1982-05-13 Siemens AG, 1000 Berlin und 8000 München Zweistrahl-wechsellicht-kolorimeter
DE3339435A1 (de) * 1982-11-01 1984-05-03 Sentrol Systems Ltd., Downsview, Ontario Farbueberwachungsgeraet fuer eine laufende materialbahn

Also Published As

Publication number Publication date
JPS5634050B2 (US20050065096A1-20050324-C00069.png) 1981-08-07
FR2327524B1 (US20050065096A1-20050324-C00069.png) 1979-09-28
CA1059338A (en) 1979-07-31
DE2638398A1 (de) 1977-04-21
IT1077026B (it) 1985-04-27
FR2327524A1 (fr) 1977-05-06
US4029419A (en) 1977-06-14
JPS5247788A (en) 1977-04-15

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee