GB1471386A - Interferometer for testing telescope optics - Google Patents

Interferometer for testing telescope optics

Info

Publication number
GB1471386A
GB1471386A GB2890874A GB2890874A GB1471386A GB 1471386 A GB1471386 A GB 1471386A GB 2890874 A GB2890874 A GB 2890874A GB 2890874 A GB2890874 A GB 2890874A GB 1471386 A GB1471386 A GB 1471386A
Authority
GB
United Kingdom
Prior art keywords
telescope
interferometer
testing
mirror
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2890874A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Biosystems Inc
Original Assignee
Perkin Elmer Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Perkin Elmer Corp filed Critical Perkin Elmer Corp
Priority to GB2890874A priority Critical patent/GB1471386A/en
Publication of GB1471386A publication Critical patent/GB1471386A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

1471386 Interferometers PERKIN ELMER CORP 28 June 1974 28908/74 Heading G1A [Also in Divisions G2-3] An interferometer for testing the optics of a telescope for alignment and aberrations comprises means 15 for collimating light received by the telescope, e.g. from a star, into a beam 16 which is split by plate 19 into a reference beam 18, which is reflected by a reflective dot 17 on the plate, and a transmitted main beam 20. The path length of the reference beam 18 is varied, e.g. by Piezoelectric pusher 32 and cube-corner reflector 23, and the beam 18 is expanded by reflectors 24, 25 so that it can be superposed on the main beam 20 after reflection at 21, 22'. The two beams 18, 20 interfere and detectors, e.g. photo-multipliers, sample the interference fringes at plane 30. If the phase detectors 36, 37 detect a difference in phase between 34 and 35, the surface of mirror 12 is not perfect and difference signal from 38 may be amplified at 39 to control actuators which make corrections to the mirror.
GB2890874A 1974-06-28 1974-06-28 Interferometer for testing telescope optics Expired GB1471386A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB2890874A GB1471386A (en) 1974-06-28 1974-06-28 Interferometer for testing telescope optics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2890874A GB1471386A (en) 1974-06-28 1974-06-28 Interferometer for testing telescope optics

Publications (1)

Publication Number Publication Date
GB1471386A true GB1471386A (en) 1977-04-27

Family

ID=10283132

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2890874A Expired GB1471386A (en) 1974-06-28 1974-06-28 Interferometer for testing telescope optics

Country Status (1)

Country Link
GB (1) GB1471386A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0158505A2 (en) * 1984-04-13 1985-10-16 Trw Inc. Active mirror wavefront sensor
EP0189482A1 (en) * 1984-05-31 1986-08-06 Matsushita Electric Industrial Co., Ltd. Shape evaluating apparatus
US4682025A (en) * 1984-04-13 1987-07-21 Trw Inc. Active mirror wavefront sensor
US5420436A (en) * 1992-11-27 1995-05-30 Hitachi, Ltd. Methods for measuring optical system, and method and apparatus for exposure using said measuring method
CN103234452A (en) * 2013-04-16 2013-08-07 清华大学 Solid laser feedback interferometer
CN103292687A (en) * 2013-05-08 2013-09-11 清华大学 Laser feedback interferometer
CN109211934A (en) * 2018-08-29 2019-01-15 南京理工大学 Based on interference micro- microballoon planar defect detection device and its detection method
CN114252242A (en) * 2021-11-23 2022-03-29 中国航空工业集团公司洛阳电光设备研究所 Optical axis calibration tool and method for telescopic system and optical system comprising front telescope

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0158505A2 (en) * 1984-04-13 1985-10-16 Trw Inc. Active mirror wavefront sensor
EP0158505A3 (en) * 1984-04-13 1985-11-21 Trw Inc. Active mirror wavefront sensor
US4682025A (en) * 1984-04-13 1987-07-21 Trw Inc. Active mirror wavefront sensor
EP0189482A1 (en) * 1984-05-31 1986-08-06 Matsushita Electric Industrial Co., Ltd. Shape evaluating apparatus
EP0189482A4 (en) * 1984-05-31 1988-09-07 Matsushita Electric Ind Co Ltd Shape evaluating apparatus.
US5420436A (en) * 1992-11-27 1995-05-30 Hitachi, Ltd. Methods for measuring optical system, and method and apparatus for exposure using said measuring method
CN103234452A (en) * 2013-04-16 2013-08-07 清华大学 Solid laser feedback interferometer
CN103234452B (en) * 2013-04-16 2015-10-21 清华大学 solid laser feedback interferometer
CN103292687A (en) * 2013-05-08 2013-09-11 清华大学 Laser feedback interferometer
CN103292687B (en) * 2013-05-08 2015-11-25 清华大学 laser feedback interferometer
CN109211934A (en) * 2018-08-29 2019-01-15 南京理工大学 Based on interference micro- microballoon planar defect detection device and its detection method
CN109211934B (en) * 2018-08-29 2021-01-26 南京理工大学 Micro-sphere surface defect detection device and method based on interference microscopy
CN114252242A (en) * 2021-11-23 2022-03-29 中国航空工业集团公司洛阳电光设备研究所 Optical axis calibration tool and method for telescopic system and optical system comprising front telescope
CN114252242B (en) * 2021-11-23 2024-05-31 中国航空工业集团公司洛阳电光设备研究所 Optical axis calibration tool and method for telescopic system and optical system comprising front telescopic system

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee