GB1405953A - Dimension comparison - Google Patents
Dimension comparisonInfo
- Publication number
- GB1405953A GB1405953A GB4620272A GB4620272A GB1405953A GB 1405953 A GB1405953 A GB 1405953A GB 4620272 A GB4620272 A GB 4620272A GB 4620272 A GB4620272 A GB 4620272A GB 1405953 A GB1405953 A GB 1405953A
- Authority
- GB
- United Kingdom
- Prior art keywords
- patterns
- lens
- scanning lines
- wire
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
- G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
1405953 Comparing diffraction patterns from dimensions; measuring dimensions photo-electrically WESTERN ELECTRIC CO Inc 6 Oct 1972 [8 Oct 1971 46202/72 Heading G1A and G1M A filament or wire 10, Fig. 1, which may be stationary or drawn through a die 13 passes through substantially coherent radiation (laser or mercury vapour lamp) from a source 17 and beamsplitters 19, 23 so that a diffraction pattern is produced at 20a at the focal point of a lens 24. A portion 18a of the split beam impinges upon a reference or master wire 22 and produces a diffraction pattern 20b for comparison with the pattern 20a. By carefully adjusting mirrors 21, 27 and lens 24 the two patterns are formed slightly off the optical axis of 24 and are displayed side by side, and the distances of wires 10 and 22 from the lens are the same which simplifies calibration. Apart from optical sources, diffraction patterns can be produced by electron beams, and Fresnel patterns used instead of Frannhofer patterns. In Fig. 2 the patterns are not displayed on a screen but are imaged by the lens 31 of a television camera 32 arranged such that the horizintal scanning lines thereof are parallel to the images of the patterns so that one or more of the scanning lines sweep across the image of the patterns. In Fig. 3 the patterns a and b are identical, indicating that the wire is of correct diameter and so then are waveforms c and d representing the video output of scanning lines. If waveform d is inverted and added to c then waveform e will be zero. If the wire diameters and the resulting waveforms are not the same however then the net result will not be zero and a pulse proportional to the pattern difference will be generated and may be measured. Such a measuring means, Fig. 5, comprises an analyzing circuit as in Fig. 2 which has AND gates 41, 42 both receiving on one input thereof the amplified video signal from circuit 36 which contains scanning lines representative of the two patterns. A clock 43 generates a pulse which is fed via unequal time delay circuits 44, 46 to the AND gates which feed via a third delay circuit 47 and an inverter 49 to an adder 48 the output of which is fed to an analog-to-digital converter 5 1 and a display device 52.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US18763271A | 1971-10-08 | 1971-10-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1405953A true GB1405953A (en) | 1975-09-10 |
Family
ID=22689796
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB4620272A Expired GB1405953A (en) | 1971-10-08 | 1972-10-06 | Dimension comparison |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS4846352A (en) |
BE (1) | BE789819A (en) |
CA (1) | CA991397A (en) |
CH (1) | CH550381A (en) |
GB (1) | GB1405953A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2140603A (en) * | 1983-05-27 | 1984-11-28 | Pa Consulting Services | Adaptive pattern recognition |
US5076698A (en) * | 1988-11-09 | 1991-12-31 | Anstalt Gersan | Sensing the shape of an object |
US5206699A (en) * | 1988-05-06 | 1993-04-27 | Gersan Establishment | Sensing a narrow frequency band of radiation and gemstones |
EP2894461A1 (en) | 2014-01-10 | 2015-07-15 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Measuring device and measuring method for measuring an indicator by means of a bend analysis |
EP3293836A1 (en) * | 2016-09-08 | 2018-03-14 | Schleifring und Apparatebau GmbH | Methods of making contact wires for slip rings, devices for manufacturing of structured contact wires for slip rings and slip ring brush wires |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52147460A (en) * | 1976-06-02 | 1977-12-07 | Toyo Boseki | Measuring apparatus for outer diameter of wireeshaped material |
FR2495765A1 (en) * | 1980-12-09 | 1982-06-11 | Osipov Ashot | Optical measuring device for transparent filaments - uses parallel opaque filament to increase definition of diffraction pattern |
CN102519373A (en) * | 2011-12-19 | 2012-06-27 | 苏州大学 | Method for measuring fineness of raw silks in real time and device of method |
CN103162634B (en) * | 2013-02-05 | 2016-04-20 | 东华大学 | A kind of sensor-based diameter measuring method |
CN105509646A (en) * | 2016-02-25 | 2016-04-20 | 天津高盛钢丝绳有限公司 | FPGA (field programmable gate array)-based infrared laser wire rope diameter measurement system |
-
0
- BE BE789819D patent/BE789819A/en unknown
-
1972
- 1972-05-25 CA CA142,994A patent/CA991397A/en not_active Expired
- 1972-10-05 JP JP9948772A patent/JPS4846352A/ja active Pending
- 1972-10-06 GB GB4620272A patent/GB1405953A/en not_active Expired
- 1972-10-06 CH CH1462272A patent/CH550381A/en not_active IP Right Cessation
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2140603A (en) * | 1983-05-27 | 1984-11-28 | Pa Consulting Services | Adaptive pattern recognition |
US5206699A (en) * | 1988-05-06 | 1993-04-27 | Gersan Establishment | Sensing a narrow frequency band of radiation and gemstones |
US5076698A (en) * | 1988-11-09 | 1991-12-31 | Anstalt Gersan | Sensing the shape of an object |
EP2894461A1 (en) | 2014-01-10 | 2015-07-15 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Measuring device and measuring method for measuring an indicator by means of a bend analysis |
DE102014000311A1 (en) | 2014-01-10 | 2015-07-16 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Measuring device and measuring method for measuring a measured variable by means of a diffraction measurement |
EP3293836A1 (en) * | 2016-09-08 | 2018-03-14 | Schleifring und Apparatebau GmbH | Methods of making contact wires for slip rings, devices for manufacturing of structured contact wires for slip rings and slip ring brush wires |
US10505329B2 (en) | 2016-09-08 | 2019-12-10 | Schleifring Gmbh | Method for making contact wires for sliprings |
Also Published As
Publication number | Publication date |
---|---|
JPS4846352A (en) | 1973-07-02 |
CH550381A (en) | 1974-06-14 |
BE789819A (en) | 1973-02-01 |
CA991397A (en) | 1976-06-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PLNP | Patent lapsed through nonpayment of renewal fees |