GB1405953A - Dimension comparison - Google Patents

Dimension comparison

Info

Publication number
GB1405953A
GB1405953A GB4620272A GB4620272A GB1405953A GB 1405953 A GB1405953 A GB 1405953A GB 4620272 A GB4620272 A GB 4620272A GB 4620272 A GB4620272 A GB 4620272A GB 1405953 A GB1405953 A GB 1405953A
Authority
GB
United Kingdom
Prior art keywords
patterns
lens
scanning lines
wire
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4620272A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of GB1405953A publication Critical patent/GB1405953A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

1405953 Comparing diffraction patterns from dimensions; measuring dimensions photo-electrically WESTERN ELECTRIC CO Inc 6 Oct 1972 [8 Oct 1971 46202/72 Heading G1A and G1M A filament or wire 10, Fig. 1, which may be stationary or drawn through a die 13 passes through substantially coherent radiation (laser or mercury vapour lamp) from a source 17 and beamsplitters 19, 23 so that a diffraction pattern is produced at 20a at the focal point of a lens 24. A portion 18a of the split beam impinges upon a reference or master wire 22 and produces a diffraction pattern 20b for comparison with the pattern 20a. By carefully adjusting mirrors 21, 27 and lens 24 the two patterns are formed slightly off the optical axis of 24 and are displayed side by side, and the distances of wires 10 and 22 from the lens are the same which simplifies calibration. Apart from optical sources, diffraction patterns can be produced by electron beams, and Fresnel patterns used instead of Frannhofer patterns. In Fig. 2 the patterns are not displayed on a screen but are imaged by the lens 31 of a television camera 32 arranged such that the horizintal scanning lines thereof are parallel to the images of the patterns so that one or more of the scanning lines sweep across the image of the patterns. In Fig. 3 the patterns a and b are identical, indicating that the wire is of correct diameter and so then are waveforms c and d representing the video output of scanning lines. If waveform d is inverted and added to c then waveform e will be zero. If the wire diameters and the resulting waveforms are not the same however then the net result will not be zero and a pulse proportional to the pattern difference will be generated and may be measured. Such a measuring means, Fig. 5, comprises an analyzing circuit as in Fig. 2 which has AND gates 41, 42 both receiving on one input thereof the amplified video signal from circuit 36 which contains scanning lines representative of the two patterns. A clock 43 generates a pulse which is fed via unequal time delay circuits 44, 46 to the AND gates which feed via a third delay circuit 47 and an inverter 49 to an adder 48 the output of which is fed to an analog-to-digital converter 5 1 and a display device 52.
GB4620272A 1971-10-08 1972-10-06 Dimension comparison Expired GB1405953A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18763271A 1971-10-08 1971-10-08

Publications (1)

Publication Number Publication Date
GB1405953A true GB1405953A (en) 1975-09-10

Family

ID=22689796

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4620272A Expired GB1405953A (en) 1971-10-08 1972-10-06 Dimension comparison

Country Status (5)

Country Link
JP (1) JPS4846352A (en)
BE (1) BE789819A (en)
CA (1) CA991397A (en)
CH (1) CH550381A (en)
GB (1) GB1405953A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2140603A (en) * 1983-05-27 1984-11-28 Pa Consulting Services Adaptive pattern recognition
US5076698A (en) * 1988-11-09 1991-12-31 Anstalt Gersan Sensing the shape of an object
US5206699A (en) * 1988-05-06 1993-04-27 Gersan Establishment Sensing a narrow frequency band of radiation and gemstones
EP2894461A1 (en) 2014-01-10 2015-07-15 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Measuring device and measuring method for measuring an indicator by means of a bend analysis
EP3293836A1 (en) * 2016-09-08 2018-03-14 Schleifring und Apparatebau GmbH Methods of making contact wires for slip rings, devices for manufacturing of structured contact wires for slip rings and slip ring brush wires

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52147460A (en) * 1976-06-02 1977-12-07 Toyo Boseki Measuring apparatus for outer diameter of wireeshaped material
FR2495765A1 (en) * 1980-12-09 1982-06-11 Osipov Ashot Optical measuring device for transparent filaments - uses parallel opaque filament to increase definition of diffraction pattern
CN102519373A (en) * 2011-12-19 2012-06-27 苏州大学 Method for measuring fineness of raw silks in real time and device of method
CN103162634B (en) * 2013-02-05 2016-04-20 东华大学 A kind of sensor-based diameter measuring method
CN105509646A (en) * 2016-02-25 2016-04-20 天津高盛钢丝绳有限公司 FPGA (field programmable gate array)-based infrared laser wire rope diameter measurement system

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2140603A (en) * 1983-05-27 1984-11-28 Pa Consulting Services Adaptive pattern recognition
US5206699A (en) * 1988-05-06 1993-04-27 Gersan Establishment Sensing a narrow frequency band of radiation and gemstones
US5076698A (en) * 1988-11-09 1991-12-31 Anstalt Gersan Sensing the shape of an object
EP2894461A1 (en) 2014-01-10 2015-07-15 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Measuring device and measuring method for measuring an indicator by means of a bend analysis
DE102014000311A1 (en) 2014-01-10 2015-07-16 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Measuring device and measuring method for measuring a measured variable by means of a diffraction measurement
EP3293836A1 (en) * 2016-09-08 2018-03-14 Schleifring und Apparatebau GmbH Methods of making contact wires for slip rings, devices for manufacturing of structured contact wires for slip rings and slip ring brush wires
US10505329B2 (en) 2016-09-08 2019-12-10 Schleifring Gmbh Method for making contact wires for sliprings

Also Published As

Publication number Publication date
JPS4846352A (en) 1973-07-02
CH550381A (en) 1974-06-14
BE789819A (en) 1973-02-01
CA991397A (en) 1976-06-22

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees