JPS6420426A - Apparatus for measuring contrast of display screen as function of observing direction - Google Patents

Apparatus for measuring contrast of display screen as function of observing direction

Info

Publication number
JPS6420426A
JPS6420426A JP63087059A JP8705988A JPS6420426A JP S6420426 A JPS6420426 A JP S6420426A JP 63087059 A JP63087059 A JP 63087059A JP 8705988 A JP8705988 A JP 8705988A JP S6420426 A JPS6420426 A JP S6420426A
Authority
JP
Japan
Prior art keywords
objective lens
display screen
screen
detectors
luminance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63087059A
Other languages
Japanese (ja)
Other versions
JP2672563B2 (en
Inventor
Deyutsushie Jiyannkuroodo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=9349916&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JPS6420426(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS6420426A publication Critical patent/JPS6420426A/en
Application granted granted Critical
Publication of JP2672563B2 publication Critical patent/JP2672563B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

PURPOSE: To shorten the measuring time of the contrast of a display screen by projecting the Fourier transformation image of a parallel light beam transmitted through the display surface of the screen formed on the focal plane of a first objective lens upon a detector array through a second objective lens. CONSTITUTION: All light rays transmitted through the blank display surface 9 of a screen 6 are converged on the focal plane Fi of an objective lens 12 and form the Fourier transformation image 19 of the blank surface 9 and the image 19 is projected upon the array 16 in which detectors 18 are distributed in a matrix-like state through a second objective lens 14 composed of a group of several convergent lenses. Electric signals supplied from the detectors 18 are proportional to the light intensity on the surface 9 in a given direction and received by means of a memory 21 connected to a microcomputer 22 and the microcomputer 22 converts each signal into luminance and calculates the relation between the luminance of white points and that of black points corresponding to the contract of the display screen.
JP63087059A 1987-04-08 1988-04-08 Device for measuring display screen contrast as a function of viewing direction. Expired - Lifetime JP2672563B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8704944A FR2613830B1 (en) 1987-04-08 1987-04-08 DEVICE FOR DETERMINING THE CONTRAST OF A DISPLAY SCREEN BASED ON THE OBSERVATION DIRECTION
FR8704944 1987-04-08

Publications (2)

Publication Number Publication Date
JPS6420426A true JPS6420426A (en) 1989-01-24
JP2672563B2 JP2672563B2 (en) 1997-11-05

Family

ID=9349916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63087059A Expired - Lifetime JP2672563B2 (en) 1987-04-08 1988-04-08 Device for measuring display screen contrast as a function of viewing direction.

Country Status (5)

Country Link
US (1) US4870263A (en)
EP (1) EP0286529B1 (en)
JP (1) JP2672563B2 (en)
DE (1) DE3872428T2 (en)
FR (1) FR2613830B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007506082A (en) * 2003-09-17 2007-03-15 コミツサリア タ レネルジー アトミーク Use of optical Fourier transform for dimensional inspection in microelectronics.
JP2007271350A (en) * 2006-03-30 2007-10-18 Fujifilm Corp Reference planar setting method for planar representation type display, and visibility angle measuring method

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4110075C2 (en) * 1991-03-27 1996-05-02 Opel Adam Ag Method for the automatic optical inspection of LCD display instruments and device for carrying out the method
FR2729220B1 (en) * 1995-01-06 1997-04-04 Eldim COLORIMETRIC MEASUREMENT DEVICE OF A DISPLAY SCREEN
JP3594706B2 (en) * 1995-08-22 2004-12-02 浜松ホトニクス株式会社 Light source position adjustment device
DE19602862C1 (en) * 1996-01-28 1997-07-17 Autronic Melchers Gmbh Measuring device for detecting optical properties of an electro-optical display
FR2749388B1 (en) * 1996-05-31 1998-08-07 Eldim APPARATUS FOR MEASURING THE PHOTOMETRIC AND COLORIMETRIC CHARACTERISTICS OF AN OBJECT
DE19637131C2 (en) * 1996-09-12 2001-02-01 Autronic Melchers Gmbh Device for assessing the reflection behavior of an object, in particular a liquid crystal display
WO2001022029A1 (en) * 1999-09-20 2001-03-29 Otsuka Electronics Co., Ltd. Method and apparatus for measuring cell gap of va liquid crystal panel
FR2800163B1 (en) 1999-10-26 2002-01-18 Eldim DEVICE FOR MEASURING THE SPATIAL DISTRIBUTION OF THE SPECTRAL EMISSION OF AN OBJECT
US6678046B2 (en) * 2001-08-28 2004-01-13 Therma-Wave, Inc. Detector configurations for optical metrology
US7502104B2 (en) * 2006-08-10 2009-03-10 Kla-Tencor Corporation Probe beam profile modulated optical reflectance system and methods
CN105823623A (en) * 2016-03-14 2016-08-03 北川瑞辉科技有限公司 Test method for improved bright room contrast value of bright room contrast improved functional film
FR3079612B1 (en) 2018-03-29 2021-06-04 Eldim OPTICAL DEVICE ALLOWING SIMULTANEOUS MEASUREMENT OF THE ANGULAR AND SPECTRAL EMISSION OF AN OBJECT

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2017615C3 (en) * 1970-04-13 1974-12-12 Siemens Ag, 1000 Berlin Und 8000 Muenchen Arrangement for switching the intensity of directed light beams with high contrast
JPS56117106A (en) * 1980-02-20 1981-09-14 Dainippon Printing Co Ltd Inspecting device for pattern defect
JPS57175937A (en) * 1981-04-24 1982-10-29 Hitachi Ltd Testing of liquid crystal display element
JPS5847226A (en) * 1981-09-16 1983-03-18 Canon Inc Electronic device
JPS58155328A (en) * 1982-03-11 1983-09-16 Seiko Instr & Electronics Ltd Testing device for liquid crystal display unit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007506082A (en) * 2003-09-17 2007-03-15 コミツサリア タ レネルジー アトミーク Use of optical Fourier transform for dimensional inspection in microelectronics.
JP2007271350A (en) * 2006-03-30 2007-10-18 Fujifilm Corp Reference planar setting method for planar representation type display, and visibility angle measuring method

Also Published As

Publication number Publication date
DE3872428T2 (en) 1992-12-24
FR2613830B1 (en) 1990-11-02
FR2613830A1 (en) 1988-10-14
DE3872428D1 (en) 1992-08-06
EP0286529A2 (en) 1988-10-12
JP2672563B2 (en) 1997-11-05
US4870263A (en) 1989-09-26
EP0286529A3 (en) 1990-05-02
EP0286529B1 (en) 1992-07-01

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