GB1345973A - Stigmatically imaging mass spectrometer - Google Patents

Stigmatically imaging mass spectrometer

Info

Publication number
GB1345973A
GB1345973A GB2997971A GB2997971A GB1345973A GB 1345973 A GB1345973 A GB 1345973A GB 2997971 A GB2997971 A GB 2997971A GB 2997971 A GB2997971 A GB 2997971A GB 1345973 A GB1345973 A GB 1345973A
Authority
GB
United Kingdom
Prior art keywords
mass spectrometer
imaging mass
stigmatically
stigmatically imaging
spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2997971A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Original Assignee
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft zur Foerderung der Wissenschaften eV filed Critical Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Publication of GB1345973A publication Critical patent/GB1345973A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
GB2997971A 1970-06-26 1971-06-25 Stigmatically imaging mass spectrometer Expired GB1345973A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2031811A DE2031811B2 (de) 1970-06-26 1970-06-26 Doppelfokussierendes stigmatisch abbildendes Massenspektrometer

Publications (1)

Publication Number Publication Date
GB1345973A true GB1345973A (en) 1974-02-06

Family

ID=5775115

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2997971A Expired GB1345973A (en) 1970-06-26 1971-06-25 Stigmatically imaging mass spectrometer

Country Status (7)

Country Link
US (1) US3761707A (https=)
BE (1) BE769073A (https=)
DE (1) DE2031811B2 (https=)
FR (1) FR2099837A5 (https=)
GB (1) GB1345973A (https=)
LU (1) LU63411A1 (https=)
NL (1) NL7108831A (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3842269A (en) * 1971-10-05 1974-10-15 Max Planck Gesellschaft Mass spectrometer of high detection efficiency
DE2242987B2 (de) * 1972-09-01 1980-06-12 Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen Vorrichtung zur Trennung von neutralen Teilchen und schnellen Ionen von langsamen Ionen
DE2340372A1 (de) * 1973-08-09 1975-02-20 Max Planck Gesellschaft Doppelfokussierendes massenspektrometer hoher eingangsapertur
JPS5829577B2 (ja) * 1980-06-13 1983-06-23 日本電子株式会社 二重収束質量分析装置
DE3532698A1 (de) * 1985-09-13 1987-03-26 Zeiss Carl Fa Elektronenenergiefilter vom alpha-typ
DE3532699A1 (de) * 1985-09-13 1987-03-26 Zeiss Carl Fa Elektronenenergiefilter vom omega-typ
US5128543A (en) * 1989-10-23 1992-07-07 Charles Evans & Associates Particle analyzer apparatus and method
US5723862A (en) * 1996-03-04 1998-03-03 Forman; Leon Mass spectrometer utilizing high energy product density permanent magnets
US6184523B1 (en) 1998-07-14 2001-02-06 Board Of Regents Of The University Of Nebraska High resolution charged particle-energy detecting, multiple sequential stage, compact, small diameter, retractable cylindrical mirror analyzer system, and method of use
EP1657736B1 (en) * 2004-11-15 2016-12-14 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH High current density particle beam system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3517191A (en) * 1965-10-11 1970-06-23 Helmut J Liebl Scanning ion microscope with magnetic sector lens to purify the primary ion beam

Also Published As

Publication number Publication date
BE769073A (fr) 1971-11-03
LU63411A1 (https=) 1971-09-24
DE2031811A1 (de) 1971-12-30
NL7108831A (https=) 1971-12-28
DE2031811B2 (de) 1980-09-25
US3761707A (en) 1973-09-25
FR2099837A5 (https=) 1972-03-17

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee