GB1337273A - Interferometer thickness gauge - Google Patents

Interferometer thickness gauge

Info

Publication number
GB1337273A
GB1337273A GB1337273DA GB1337273A GB 1337273 A GB1337273 A GB 1337273A GB 1337273D A GB1337273D A GB 1337273DA GB 1337273 A GB1337273 A GB 1337273A
Authority
GB
United Kingdom
Prior art keywords
thickness
mirror
roller
strip
translator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Trade and Industry
Original Assignee
UK Secretary of State for Trade and Industry
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Trade and Industry filed Critical UK Secretary of State for Trade and Industry
Publication of GB1337273A publication Critical patent/GB1337273A/en
Expired legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
    • B21B38/04—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring thickness, width, diameter or other transverse dimensions of the product
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers

Abstract

1337273 Interferometer thickness gauge TRADE & INDUSTRY SECRETARY OF STATE FOR 19 April 1971 [9 Feb 1970] 6181/70 Heading G1A In a device, for measuring the thickness of strip of steel 1 moving over and in close contact with a roller 3, wide band infrared light from a mercury vapour lamp 7 is directed by a beam divider 9 (formed of polyethylene-terephthalate) along two paths as shown to be reflected off the roller 3 and the strip 1 and subsequently recombined by the divider 9 and passed to a golaycell 13, the two path lengths being equalised by moving a mirror 11 until all the radiation reaching the detector is in phase. The position of the mirror in the "in-phase" position provides a measure of the strip thickness. The mirror 11 is oscillated in a direction normal to its plane surface by a translator/transducer unit 14. An output from the translator/transducer unit is fed to an X input of an X-Y recorder 16 and the golay-cell output is fed to the Y input of the recorder 16 to produce a trace as shown in Fig.3. The X - co-ordinate on the screen is marked in dimension of thickness so that a continuous measurement is provided. The mirrors 17 and 18 are curved to focus the light beams on the axis of curvature of the roller and to reduce the scattering of the light beam.
GB1337273D 1970-02-09 1971-04-19 Interferometer thickness gauge Expired GB1337273A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB618170 1970-02-09

Publications (1)

Publication Number Publication Date
GB1337273A true GB1337273A (en) 1973-11-14

Family

ID=9809886

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1337273D Expired GB1337273A (en) 1970-02-09 1971-04-19 Interferometer thickness gauge

Country Status (3)

Country Link
DE (1) DE2104903A1 (en)
FR (1) FR2078325A5 (en)
GB (1) GB1337273A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9046412B2 (en) 2010-01-18 2015-06-02 The Science And Technology Facilities Council Compact interferometer spectrometer

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2842670A1 (en) * 1978-09-29 1980-04-10 Siemens Ag METHOD FOR DETERMINING THE THICKNESS OF TAPES WHICH ARE MOVED OVER ROLLERS
US4207003A (en) * 1978-11-16 1980-06-10 Rockwell International Corporation Sensing device for ink film thickness in printing presses
DE3701558A1 (en) * 1987-01-21 1988-08-04 Buehler Ag Geb Apparatus for determining the thickness of a layer
DE3843300A1 (en) * 1987-12-23 1989-07-13 Karl Veit Holger Dr Ing Measuring device for determining the thickness of films
CN102641962A (en) * 2012-05-09 2012-08-22 尹中平 Combined lofting positioning bracket component for punch positions of reinforcing plate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9046412B2 (en) 2010-01-18 2015-06-02 The Science And Technology Facilities Council Compact interferometer spectrometer

Also Published As

Publication number Publication date
DE2104903A1 (en) 1971-08-19
FR2078325A5 (en) 1971-11-05

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees