GB1323496A - Reactor for measuring the impedance of active circuits at very high frequencies - Google Patents

Reactor for measuring the impedance of active circuits at very high frequencies

Info

Publication number
GB1323496A
GB1323496A GB2685571*A GB2685571A GB1323496A GB 1323496 A GB1323496 A GB 1323496A GB 2685571 A GB2685571 A GB 2685571A GB 1323496 A GB1323496 A GB 1323496A
Authority
GB
United Kingdom
Prior art keywords
reactor
impedance
measuring
high frequencies
active circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2685571*A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel CIT SA
Original Assignee
Alcatel CIT SA
Compagnie Industrielle de Telecommunication CIT Alcatel SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel CIT SA, Compagnie Industrielle de Telecommunication CIT Alcatel SA filed Critical Alcatel CIT SA
Publication of GB1323496A publication Critical patent/GB1323496A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00Coupling devices of the waveguide type
    • H01P5/04Coupling devices of the waveguide type with variable factor of coupling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/24Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

1323496 Variable reactance COMPAGNIE INDUSTRIELLE DES TELECOMMUNICATIONS CIT-ALCATEL 19 April 1971 [14 April 1970] 26855/71 Heading H1W [Also in Division G1] A variable reactor for transferring energy from a coaxial inlet socket 12, Fig. 1, to a bifurcated outlet 14, includes an inner conductor 11, Fig. 3, connected to both the central conductor of the coaxial socket 12 and the bifurcated outlet 14, and two U-shaped stirrups 15 (only one being visible) mounted for movement along and towards the conductor 11 by means of slides 5, 6, Fig. 1, and screws 1, 2. (For Figures see next column.)
GB2685571*A 1970-04-14 1971-04-19 Reactor for measuring the impedance of active circuits at very high frequencies Expired GB1323496A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7013440A FR2085367A1 (en) 1970-04-14 1970-04-14

Publications (1)

Publication Number Publication Date
GB1323496A true GB1323496A (en) 1973-07-18

Family

ID=9053937

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2685571*A Expired GB1323496A (en) 1970-04-14 1971-04-19 Reactor for measuring the impedance of active circuits at very high frequencies

Country Status (6)

Country Link
JP (1) JPS464938A (en)
BE (1) BE765404A (en)
DE (1) DE2117964A1 (en)
FR (1) FR2085367A1 (en)
GB (1) GB1323496A (en)
NL (1) NL7104726A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2053687A1 (en) * 2007-06-26 2009-04-29 Andrew Telecommunication Products S.r.l. System and Method for Tuning Multicavity Filters
WO2010062229A1 (en) * 2008-11-27 2010-06-03 Telefonaktiebolaget L M Ericsson (Publ) Method and arrangement for through-line mismatch rf testing

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2500218A1 (en) * 1981-02-19 1982-08-20 Auhfa Hyperfrequency applicator for drying, sterilising etc. - has two dielectric plates spaced in waveguide and axially movable by screw threaded adjuster to vary impedance

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2053687A1 (en) * 2007-06-26 2009-04-29 Andrew Telecommunication Products S.r.l. System and Method for Tuning Multicavity Filters
US7834721B2 (en) 2007-06-26 2010-11-16 Commscope Italy S.R.L. System and method for tuning multicavity filters
WO2010062229A1 (en) * 2008-11-27 2010-06-03 Telefonaktiebolaget L M Ericsson (Publ) Method and arrangement for through-line mismatch rf testing
US8803531B2 (en) 2008-11-27 2014-08-12 Telefonaktiebolaget L M Ericsson (Publ) Method and arrangement for through-line mismatch RF testing

Also Published As

Publication number Publication date
FR2085367A1 (en) 1971-12-24
BE765404A (en) 1971-10-07
NL7104726A (en) 1971-10-18
DE2117964A1 (en) 1971-10-28
JPS464938A (en) 1971-11-22

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Legal Events

Date Code Title Description
CSNS Application of which complete specification have been accepted and published, but patent is not sealed