GB1288029A - - Google Patents
Info
- Publication number
- GB1288029A GB1288029A GB4816370A GB4816370A GB1288029A GB 1288029 A GB1288029 A GB 1288029A GB 4816370 A GB4816370 A GB 4816370A GB 4816370 A GB4816370 A GB 4816370A GB 1288029 A GB1288029 A GB 1288029A
- Authority
- GB
- United Kingdom
- Prior art keywords
- arsenic
- phosphorus
- boron
- march
- emitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910052785 arsenic Inorganic materials 0.000 abstract 7
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 abstract 7
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 abstract 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 5
- 229910052698 phosphorus Inorganic materials 0.000 abstract 5
- 239000011574 phosphorus Substances 0.000 abstract 5
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract 4
- 229910052796 boron Inorganic materials 0.000 abstract 4
- 238000009792 diffusion process Methods 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 2
- 239000000377 silicon dioxide Substances 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 229910052582 BN Inorganic materials 0.000 abstract 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 abstract 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 230000007547 defect Effects 0.000 abstract 1
- 230000003647 oxidation Effects 0.000 abstract 1
- 238000007254 oxidation reaction Methods 0.000 abstract 1
- 239000002244 precipitate Substances 0.000 abstract 1
- 229910000077 silane Inorganic materials 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
- 229910052814 silicon oxide Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
- H01L29/167—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table further characterised by the doping material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
- H01L21/2251—Diffusion into or out of group IV semiconductors
- H01L21/2254—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides
- H01L21/2255—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides the applied layer comprising oxides only, e.g. P2O5, PSG, H3BO3, doped oxides
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Bipolar Transistors (AREA)
Abstract
1288029 Semi-conductor devices TOKYO SHIBAURA ELECTRIC CO Ltd 9 Oct 1970 [7 Feb 1970 2 March 1970 13 March 1970 28 March 1970] 48163/70 Heading H1K A surface region of a silicon body is simultaneously diffused with arsenic and phosphorus or boron. At the surface of the region the ratio of the number of atoms of phosphorus or boron to that of arsenic is 100 : 3-40. The presence of arsenic reduces the number of lattice defects and precipitates formed in the region particularly if the semi-conductor substrate includes less than 1000 dislocations/c.c. and/or has its surface orientated in a 111 crystallographic plane. In described examples the arsenic and boron or phosphorus are diffused in simultaneously as from a suitably doped silicon oxide layer formed by oxidation of silane, and overlying an aperture in a silica mask. Such a process may be used to form a diode from an N-type Si body. To form a PNP transistor a P-type layer is first epitaxially grown on a P + substrate, phosphorus and arsenic doped silica deposited and then apertured at the emitter site and a second layer of boron and arsenic doped oxide deposited overall. The resulting wafer is then heated to cause diffusion. Methods of forming a P + NN + diode, a controlled rectifier, and a planar NPN transistor are also described, the last-mentioned involving diffusion from boron nitride to form the base zone followed by an emitter diffusion of phosphorus and arsenic as described above, which causes no appreciable "emitter dip".
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1037670A JPS504310B1 (en) | 1970-02-07 | 1970-02-07 | |
JP1710370A JPS505908B1 (en) | 1970-03-02 | 1970-03-02 | |
JP2082670A JPS4940111B1 (en) | 1970-03-13 | 1970-03-13 | |
JP2562770A JPS501871B1 (en) | 1970-03-28 | 1970-03-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1288029A true GB1288029A (en) | 1972-09-06 |
Family
ID=27455384
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB4816370A Expired GB1288029A (en) | 1970-02-07 | 1970-10-09 |
Country Status (4)
Country | Link |
---|---|
DE (1) | DE2049696C3 (en) |
FR (1) | FR2080965B1 (en) |
GB (1) | GB1288029A (en) |
NL (1) | NL162512C (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2200249A (en) * | 1984-02-02 | 1988-07-27 | Stanford Res Inst Int | Semiconductor circuit structure having dislocation-free substrate |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3821038A (en) * | 1972-05-22 | 1974-06-28 | Ibm | Method for fabricating semiconductor structures with minimum crystallographic defects |
FR2186734A1 (en) * | 1972-05-29 | 1974-01-11 | Radiotechnique Compelec | Microwave semiconductor component production - by simultaneous multiple diffusion from doped insulation films |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB953034A (en) * | 1961-07-13 | 1964-03-25 | Clevite Corp | Improvements in or relating to semiconductor devices |
AT243318B (en) * | 1962-09-21 | 1965-11-10 | Siemens Ag | Process for the production of high degrees of doping in semiconductor materials |
US3249831A (en) * | 1963-01-04 | 1966-05-03 | Westinghouse Electric Corp | Semiconductor controlled rectifiers with a p-n junction having a shallow impurity concentration gradient |
-
1970
- 1970-10-09 DE DE19702049696 patent/DE2049696C3/en not_active Expired
- 1970-10-09 FR FR7036629A patent/FR2080965B1/fr not_active Expired
- 1970-10-09 GB GB4816370A patent/GB1288029A/en not_active Expired
- 1970-10-09 NL NL7014842A patent/NL162512C/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2200249A (en) * | 1984-02-02 | 1988-07-27 | Stanford Res Inst Int | Semiconductor circuit structure having dislocation-free substrate |
GB2200250A (en) * | 1984-02-02 | 1988-07-27 | Stanford Res Inst Int | Semiconductor circuit structure having dislocation-free substrate |
GB2200251A (en) * | 1984-02-02 | 1988-07-27 | Stanford Res Inst Int | Semiconductor circuit structure having dislocation-free substrate |
Also Published As
Publication number | Publication date |
---|---|
DE2049696C3 (en) | 1982-02-18 |
DE2049696A1 (en) | 1971-08-26 |
NL162512C (en) | 1980-05-16 |
NL162512B (en) | 1979-12-17 |
DE2049696B2 (en) | 1981-06-11 |
NL7014842A (en) | 1971-08-10 |
FR2080965A1 (en) | 1971-11-26 |
FR2080965B1 (en) | 1976-05-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
435 | Patent endorsed 'licences of right' on the date specified (sect. 35/1949) | ||
PE20 | Patent expired after termination of 20 years |