GB1281819A - Scanning element and aperture wafer for electronic particle counting and sizing apparatus - Google Patents

Scanning element and aperture wafer for electronic particle counting and sizing apparatus

Info

Publication number
GB1281819A
GB1281819A GB52046/70A GB5204670A GB1281819A GB 1281819 A GB1281819 A GB 1281819A GB 52046/70 A GB52046/70 A GB 52046/70A GB 5204670 A GB5204670 A GB 5204670A GB 1281819 A GB1281819 A GB 1281819A
Authority
GB
United Kingdom
Prior art keywords
wafer
particle counting
aperture
sizing apparatus
scanning element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB52046/70A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coulter Electronics Ltd
Coulter Electronics Inc
Original Assignee
Coulter Electronics Ltd
Coulter Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics Ltd, Coulter Electronics Inc filed Critical Coulter Electronics Ltd
Publication of GB1281819A publication Critical patent/GB1281819A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13—Details pertaining to apertures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

1281819 Particle analyzing apparatus COULTER ELECTRONICS Ltd 2 Nov 1970 [6 Nov 1969] 52046/70 Heading G1N In particle counting and sizing apparatus of the Coulter type, the aperture wafer includes at least one conical recess 44, Fig.1, or 64 and 66, Fig.5, communicating as shown with the aperture 42 or 62. If only one recess, the unrecessed surface of the wafer faces upstream. The wafer is fused to glass tube 80, Fig. 8, with its surface slightly proud.
GB52046/70A 1969-11-06 1970-11-02 Scanning element and aperture wafer for electronic particle counting and sizing apparatus Expired GB1281819A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US87463269A 1969-11-06 1969-11-06

Publications (1)

Publication Number Publication Date
GB1281819A true GB1281819A (en) 1972-07-19

Family

ID=25364208

Family Applications (1)

Application Number Title Priority Date Filing Date
GB52046/70A Expired GB1281819A (en) 1969-11-06 1970-11-02 Scanning element and aperture wafer for electronic particle counting and sizing apparatus

Country Status (12)

Country Link
US (1) US3628140A (en)
BE (1) BE758383A (en)
CA (1) CA941905A (en)
CH (1) CH539271A (en)
DE (1) DE2053825C3 (en)
DK (1) DK140735B (en)
FR (1) FR2068358A5 (en)
GB (1) GB1281819A (en)
IL (1) IL35566A (en)
NL (1) NL7015978A (en)
SE (1) SE370461B (en)
ZA (1) ZA707410B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0068404A1 (en) * 1981-06-24 1983-01-05 Becton Dickinson and Company Analyzer for simultaneously determining volume and light emission characteristics of particles

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3771058A (en) * 1971-04-05 1973-11-06 Coulter Electronics Scanner element for coulter particle apparatus
US3739258A (en) * 1971-08-20 1973-06-12 Iit Res Inst Method and apparatus for detecting and sizing microscopic particles
US4818103A (en) * 1981-05-15 1989-04-04 Ratcom Flow cytometry
US4673288A (en) * 1981-05-15 1987-06-16 Ratcom, Inc. Flow cytometry
GB8505047D0 (en) * 1985-02-27 1985-03-27 Alcan Int Ltd Studying particles
US4778657A (en) * 1985-09-10 1988-10-18 Kernforschungszentrum Karlsruhe Gmbh Apparatus for determining the characteristics of particles suspended in liquids
US4760328A (en) * 1986-05-05 1988-07-26 Integrated Ionics, Inc. Particle counter having electrodes and circuitry mounted on the pane of the orifice
FR2600125B1 (en) * 1986-06-17 1990-07-06 Bronzavia Air Equipement JET AND DEVICE IMPLEMENTING SUCH A JET
ATE91789T1 (en) * 1987-02-17 1993-08-15 Ratcom Inc FLOW CYTOMETRY.
CA2077751A1 (en) * 1990-03-08 1991-09-09 Zoran Milijasevic Flow controllers for fluid infusion sets
US5918637A (en) * 1993-08-16 1999-07-06 Fleischman; William H. Plates perforated with venturi-like orifices
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
AU1258595A (en) * 1993-12-23 1995-07-10 Abbott Laboratories Method of making a stress relieved count probe
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles
US9423336B2 (en) 2013-01-24 2016-08-23 Beckman Coulter, Inc. Systems and methods for particle sensing and characterization

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR665776A (en) *
FR690214A (en) * 1929-06-04 1930-09-17 Glanzstoff Ag Nozzle for the production of artificial silk and in particular for viscose silk
US2105198A (en) * 1936-02-07 1938-01-11 Capstan Glass Co Heat control mechanism
US2190357A (en) * 1937-06-09 1940-02-13 Aro Equipment Corp Replaceable needle point adapter for lubricating devices
BE514770A (en) * 1951-11-08
US2790463A (en) * 1956-03-19 1957-04-30 Delano & Garner Mfg Co Flow regulator
US3264557A (en) * 1961-12-06 1966-08-02 Heeps Brian Hamilton Method and apparatus for detecting and measuring minute quantities of water presentin liquid hydrocarbon fuels
US3266526A (en) * 1962-11-26 1966-08-16 Robert H Berg Peripherally locked and sealed orifice disk and method
FR1517434A (en) * 1966-04-22 1968-03-15 Paul Aschenbrenner Pan Appbau Glass die, especially for high viscosity synthetic fiber solutions

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0068404A1 (en) * 1981-06-24 1983-01-05 Becton Dickinson and Company Analyzer for simultaneously determining volume and light emission characteristics of particles

Also Published As

Publication number Publication date
DK140735B (en) 1979-11-05
DE2053825A1 (en) 1971-05-19
NL7015978A (en) 1971-05-10
IL35566A0 (en) 1971-01-28
DE2053825B2 (en) 1974-04-11
BE758383A (en) 1971-04-16
DK140735C (en) 1980-03-24
CA941905A (en) 1974-02-12
ZA707410B (en) 1972-06-28
DE2053825C3 (en) 1974-11-14
IL35566A (en) 1973-01-30
US3628140A (en) 1971-12-14
CH539271A (en) 1973-07-15
FR2068358A5 (en) 1971-08-20
SE370461B (en) 1974-10-14

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee