GB1281132A - Improvements in or relating to corpuscular beam apparatus - Google Patents

Improvements in or relating to corpuscular beam apparatus

Info

Publication number
GB1281132A
GB1281132A GB45756/70A GB4575670A GB1281132A GB 1281132 A GB1281132 A GB 1281132A GB 45756/70 A GB45756/70 A GB 45756/70A GB 4575670 A GB4575670 A GB 4575670A GB 1281132 A GB1281132 A GB 1281132A
Authority
GB
United Kingdom
Prior art keywords
magnets
energization
magnet
shifting
pairs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB45756/70A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of GB1281132A publication Critical patent/GB1281132A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/023Means for mechanically adjusting components not otherwise provided for

Abstract

1281132 Electron beam apparatus; ion beam apparatus SIEMENS AG 25 Sept 1970 [30 Sept 1969 (2)] 45756/70 Heading H1D [Also in Division G4] Corpuscular beam apparatus (i.e. electron or ion microscopes or diffraction apparatus) in which magnetic means are provided for the positioning of a component (e.g. object table, diaphragm, Hoppe zoned diaphragm or phase shifting plate, or foil) comprises a plurality of shifting magnet pairs 14 to 17 and locating magnet pairs, e.g. 7, 8, at least one magnet of each pair being an electromagnet, and control circuits to the electromagnets to cause the locating magnets to effect relatively large or small frictional holding forces, the latter during selective energization of the shifting magnet pairs to effect positioning. The magnets on the components may be permanent magnets. During positioning the rear magnets of each pair in the direction of motion may exert a larger repulsive force than the forward pairs. Stabilizing magnet pairs (35, 36) (Fig. 2, not shown) may be included to prevent rotation, and mutually opposite stabilizing pairs may exert identical attractive forces smaller than the shifting magnet forces, the polepieces also being further spaced than those of the shifting magnets. During object table 5 movement, the locating magnets repel so that surfaces 10, 11 are guiding surfaces, and during de-energization of the shifting pairs, the repulsive forces may be further increased. Subsequently on de-energization, gaps 50 and 51 close and the table weight effects high friction which may be increased by attraction of the polepieces of the locating magnets. Magnet coils secured to the apparatus may be isolated from the evacuated space, and energizing currents wobbulated to eradicate remanent effects. In Fig. 3 (not shown), clockwise rotation of potentiometer arm (69) causes sequential energization of the locating magnet coils (60, 61, 62) prior to energization of shifting magnet coils (63, 64) at position (71), then increased energization of the former prior to de-energization of the latter at position (74). The magnets may be polarity switched during de-energization of magnets 14 to 17. The control circuit may include means such as a wedge filter (Fig. 6, not shown) to generate an electrical signal corresponding to particular shifting magnet energizing currents to identify specific component positions, storing means, and means to energize according to the stored signal, e.g. as in machining several objects, the electromagnets on one side preferably being non-variably energized. For instance, in Fig. 14 (not shown) converter (111) converts signals determined by D.C. coil current i to suitable storage signals, e.g. binary, for store (110). Automatic repositioning in Fig. 6 (not shown) may be effected by controller (134) including a servo motion performing follow-up during differences between stored set point values S2<SP>1</SP> and actual values S2.
GB45756/70A 1969-09-30 1970-09-25 Improvements in or relating to corpuscular beam apparatus Expired GB1281132A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19691950327 DE1950327B2 (en) 1969-09-30 1969-09-30 BODY BLAST DEVICE WITH MAGNETIC MEANS FOR TRANSVERSAL ADJUSTMENT OF PARTS
DE19691950320 DE1950320A1 (en) 1969-09-30 1969-09-30 Method for identifying positions of a part that is adjustably arranged in the vacuum space of a corpuscular beam device

Publications (1)

Publication Number Publication Date
GB1281132A true GB1281132A (en) 1972-07-12

Family

ID=25757975

Family Applications (1)

Application Number Title Priority Date Filing Date
GB45756/70A Expired GB1281132A (en) 1969-09-30 1970-09-25 Improvements in or relating to corpuscular beam apparatus

Country Status (4)

Country Link
US (1) US3678270A (en)
DE (2) DE1950320A1 (en)
GB (1) GB1281132A (en)
NL (1) NL7012346A (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2542360C2 (en) * 1975-09-19 1977-11-17 Siemens AG, 1000 Berlin und 8000 München Corpuscular beam device with a goniometer
US4374327A (en) * 1981-01-27 1983-02-15 George Christov Device for indicating specimen stage positions in an electron microscope
US4506154A (en) * 1982-10-22 1985-03-19 Scire Fredric E Planar biaxial micropositioning stage
US4532426A (en) * 1983-06-17 1985-07-30 Hughes Aircraft Company Wafer height correction system for focused beam system
DE3628170A1 (en) * 1986-08-20 1988-02-25 Max Planck Gesellschaft ADJUSTABLE PREPARATION BRACKET FOR A CARPULAR RAY MICROSCOPE
US4782236A (en) * 1987-02-17 1988-11-01 Anwar Chitayat Means for locking a workpiece to a beam-generating apparatus
NL8803101A (en) * 1988-12-19 1990-07-16 Philips Nv OBJECT HOLDER FOR POSITIONING AN OBJECT IN A BEAM.
US5323012A (en) * 1991-08-16 1994-06-21 The Regents Of The University Of California Apparatus for positioning a stage
JP3390318B2 (en) * 1996-02-13 2003-03-24 セイコーインスツルメンツ株式会社 Micro positioning mechanism, scanning probe microscope and micro area processing machine using the same
DE19722272A1 (en) 1997-05-28 1998-12-03 Leybold Systems Gmbh Device for generating plasma
US9435642B2 (en) * 2012-04-20 2016-09-06 Canon Kabushiki Kaisha Position measuring apparatus, pattern transfer apparatus, and method for manufacturing a device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2496051A (en) * 1948-04-28 1950-01-31 Rca Corp Positioning the specimen stage of optical apparatus

Also Published As

Publication number Publication date
NL7012346A (en) 1971-04-01
DE1950327B2 (en) 1972-07-06
DE1950320A1 (en) 1971-04-01
DE1950327A1 (en) 1971-04-08
US3678270A (en) 1972-07-18

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees