GB1183571A - Improvements relating to X-Ray Apparatus - Google Patents

Improvements relating to X-Ray Apparatus

Info

Publication number
GB1183571A
GB1183571A GB03585/66A GB1358566A GB1183571A GB 1183571 A GB1183571 A GB 1183571A GB 03585/66 A GB03585/66 A GB 03585/66A GB 1358566 A GB1358566 A GB 1358566A GB 1183571 A GB1183571 A GB 1183571A
Authority
GB
United Kingdom
Prior art keywords
window
ray
rays
slide
specimen chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB03585/66A
Inventor
Lambert George Marien Al Groos
Harold Proctor
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB03585/66A priority Critical patent/GB1183571A/en
Priority to FR100333A priority patent/FR1522580A/en
Priority to DE19671598014 priority patent/DE1598014A1/en
Priority to NL6704409A priority patent/NL6704409A/xx
Publication of GB1183571A publication Critical patent/GB1183571A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1,183,571. X-ray apparatus. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. 17 March, 1967 [28 March, 1966], No. 13585/66. Heading H5R. An X-ray analyser apparatus has a specimen chamber in which a specimen 3 can be bombarded to produce X-rays and which is provided with an X-ray window opening to the analyser apparatus which has a cover slidable between an open position in which it allows free passage of X-rays and a closed position in which it forms a vacuum seal between the specimen chamber and the chamber housing the analysing apparatus. Fig. 3 is an enlarged vertical section of the housing for the specimen chamber and Fig. 4 is a view of the X-ray window in the direction of the arrow IV in Fig. 3. An X-ray beam passes through a window aperture 7 in wall 8 which registers with a window 9 in an outer plate 10. A pair of plates each formed with a window 12 comprise a slide between the wall 8 and the plate 10. A sheet of material 13 transparent to the shorter wavelength X-rays is sandwiched between the said plates and extends across window 12 in the slide. In Fig. 4, the slide is positioned to the left and allows a free passage of X-rays through the windows 7 and 9. When the slide is moved to the right the window 12 will register with windows 7 and 9 so that the X-rays will now pass through the X-ray transparent sheet and the specimen chamber will be vacuum sealed. The. cover can be moved between its two positions by means of hydraulic or pneumatic, apparatus. In Fig. 4, the piston 15 is operated pneumatically by air admitted through the ducts 17 and 18.
GB03585/66A 1966-03-28 1966-03-28 Improvements relating to X-Ray Apparatus Expired GB1183571A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB03585/66A GB1183571A (en) 1966-03-28 1966-03-28 Improvements relating to X-Ray Apparatus
FR100333A FR1522580A (en) 1966-03-28 1967-03-24 X-ray and gamma ray analysis device
DE19671598014 DE1598014A1 (en) 1966-03-28 1967-03-25 X-ray analyzer
NL6704409A NL6704409A (en) 1966-03-28 1967-03-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB03585/66A GB1183571A (en) 1966-03-28 1966-03-28 Improvements relating to X-Ray Apparatus

Publications (1)

Publication Number Publication Date
GB1183571A true GB1183571A (en) 1970-03-11

Family

ID=10025654

Family Applications (1)

Application Number Title Priority Date Filing Date
GB03585/66A Expired GB1183571A (en) 1966-03-28 1966-03-28 Improvements relating to X-Ray Apparatus

Country Status (3)

Country Link
DE (1) DE1598014A1 (en)
GB (1) GB1183571A (en)
NL (1) NL6704409A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4450355A (en) * 1981-01-30 1984-05-22 U.S. Philips Corporation Electron microscope comprising an X-ray detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4450355A (en) * 1981-01-30 1984-05-22 U.S. Philips Corporation Electron microscope comprising an X-ray detector

Also Published As

Publication number Publication date
DE1598014A1 (en) 1971-09-02
NL6704409A (en) 1967-09-29

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees