GB1176653A - Improvements in Apparatus for Determining the Operating Temperature of Semi-Conductors. - Google Patents

Improvements in Apparatus for Determining the Operating Temperature of Semi-Conductors.

Info

Publication number
GB1176653A
GB1176653A GB1446866A GB1446866A GB1176653A GB 1176653 A GB1176653 A GB 1176653A GB 1446866 A GB1446866 A GB 1446866A GB 1446866 A GB1446866 A GB 1446866A GB 1176653 A GB1176653 A GB 1176653A
Authority
GB
United Kingdom
Prior art keywords
thyristor
power
circuit
semi
analogue circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1446866A
Inventor
Barrie Thomas Jones
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
English Electric Co Ltd
Original Assignee
English Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by English Electric Co Ltd filed Critical English Electric Co Ltd
Priority to GB1446866A priority Critical patent/GB1176653A/en
Publication of GB1176653A publication Critical patent/GB1176653A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00Details of apparatus for conversion
    • H02M1/32Means for protecting converters other than automatic disconnection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06GANALOGUE COMPUTERS
    • G06G7/00Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/48Analogue computers for specific processes, systems or devices, e.g. simulators
    • G06G7/62Analogue computers for specific processes, systems or devices, e.g. simulators for electric systems or apparatus

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Mathematical Physics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

1,176,653. Semi-conductor simulation. ENGLISH ELECTRIC CO. Ltd. 20 March, 1967 [1 April, 1966], No. 14468/66. Heading G4G. [Also in Division G1] An apparatus for assessing the temperature developed at any part of a semi-conductor device, such as a thyristor 2, under given operating conditions, incorporates a monitoring circuit 3, 8, for deriving a signal related to the power developed in the device, this signal being applied to an analogue circuit 15 providing an electrical simulation of the thermal characteristics of the component parts of the device. Signals are tapped from appropriate parts of the analogue circuit to indicate the temperatures at the corresponding parts of the device under the given conditions. To derive the signal related to the power developed in the thyristor 2 a similar device, viz, thyristor 5, is connected in series with it. A voltage corresponding to the current through thyristor 5, detected across the series resistor 4, is applied to the differential field windings 9 of a Hall effect multiplier, while the voltage across thyristor 5 is applied to the Hall plate of the multiplier. The plate output, represening power, is applied to amplifier 11, in turn connected to amplifier 12 whose output provides a current signal, proportional to the power, to a point 16 in the analogue circuit 15, This directly represents the thermal characteristics of the thyristor 5 and consequently simulates those of the thyristor 2. The analogue circuit representing the therma characteristics of the thyristor incorporates a resistor capacitor array simulating heat transfer paths in the thyristor. The point 16 to which the input current is supplied corresponds to the silicon junction of the thyristor, where the highest power dissipation occurs. The terminals 17, 18 and 19 represent the cathode lead, mounting base and heat sink of the thyristor respectively. The effect of ambient temperature is taken into account by applying a voltage from an energized potentiometer 21 to the circuit.
GB1446866A 1966-04-01 1966-04-01 Improvements in Apparatus for Determining the Operating Temperature of Semi-Conductors. Expired GB1176653A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1446866A GB1176653A (en) 1966-04-01 1966-04-01 Improvements in Apparatus for Determining the Operating Temperature of Semi-Conductors.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1446866A GB1176653A (en) 1966-04-01 1966-04-01 Improvements in Apparatus for Determining the Operating Temperature of Semi-Conductors.

Publications (1)

Publication Number Publication Date
GB1176653A true GB1176653A (en) 1970-01-07

Family

ID=10041747

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1446866A Expired GB1176653A (en) 1966-04-01 1966-04-01 Improvements in Apparatus for Determining the Operating Temperature of Semi-Conductors.

Country Status (1)

Country Link
GB (1) GB1176653A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112824841A (en) * 2019-11-19 2021-05-21 许继集团有限公司 Valve tower temperature monitoring system and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112824841A (en) * 2019-11-19 2021-05-21 许继集团有限公司 Valve tower temperature monitoring system and method

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