GB1008473A - Improvements in or relating to temperature measurement - Google Patents

Improvements in or relating to temperature measurement

Info

Publication number
GB1008473A
GB1008473A GB2174763A GB2174763A GB1008473A GB 1008473 A GB1008473 A GB 1008473A GB 2174763 A GB2174763 A GB 2174763A GB 2174763 A GB2174763 A GB 2174763A GB 1008473 A GB1008473 A GB 1008473A
Authority
GB
United Kingdom
Prior art keywords
junction
temperature
circuit
current
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2174763A
Inventor
Norman Leonard Potter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
English Electric Co Ltd
Original Assignee
English Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by English Electric Co Ltd filed Critical English Electric Co Ltd
Priority to GB2174763A priority Critical patent/GB1008473A/en
Priority to CH682864A priority patent/CH413116A/en
Publication of GB1008473A publication Critical patent/GB1008473A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

1,008,473. Measuring temperature electrically. May 29, 1964 [May 30,1963], No. 21747/63, Heading G1N. The junction temperature of a semi-conductor device 10 is measured by adding two signals V 1 and V 2 , one of which, V 1 , represents the temperature of an external part of the device 10 as measured by a thermistor 12 mounted on the same heat sink 11 as the device, and the other of which, V 2 , is derived in a circuit, 9, from the output of a current transformer 16 whose primary 17 carries the current which flows through the junction. The signal V 2 is said to be proportional to the temperature difference between the outer parts of the device and its junction. The circuit 9, which represents an electrical analogue of the thermal circuit of the device, contains capacitors 21 to effectively short circuit any transients in the junction current, which would not affect the junction temperature because of the thermal inertia of the device and therefore are required not to produce any effect upon the signal V2. The voltage V3 may be compared with a reference voltage and used to operate a protection relay if it exceeds a predetermined value.
GB2174763A 1963-05-30 1963-05-30 Improvements in or relating to temperature measurement Expired GB1008473A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB2174763A GB1008473A (en) 1963-05-30 1963-05-30 Improvements in or relating to temperature measurement
CH682864A CH413116A (en) 1963-05-30 1964-05-26 Apparatus for measuring the temperature of a junction of a semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2174763A GB1008473A (en) 1963-05-30 1963-05-30 Improvements in or relating to temperature measurement

Publications (1)

Publication Number Publication Date
GB1008473A true GB1008473A (en) 1965-10-27

Family

ID=10168113

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2174763A Expired GB1008473A (en) 1963-05-30 1963-05-30 Improvements in or relating to temperature measurement

Country Status (2)

Country Link
CH (1) CH413116A (en)
GB (1) GB1008473A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2096444A1 (en) * 1970-06-23 1972-02-18 Gen Electric DEVICE FOR CONTROLLING THE TEMPERATURE OF THE JUNCTION OF A SEMICONDUCTOR DEVICE SUCH AS A THYRISTOR
EP0256715A2 (en) * 1986-08-18 1988-02-24 Siliconix Limited Temperature sensing apparatus
CN112964389A (en) * 2021-05-10 2021-06-15 国网江西省电力有限公司电力科学研究院 Elbow type cable head fault early warning method and system based on distributed temperature measurement

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2096444A1 (en) * 1970-06-23 1972-02-18 Gen Electric DEVICE FOR CONTROLLING THE TEMPERATURE OF THE JUNCTION OF A SEMICONDUCTOR DEVICE SUCH AS A THYRISTOR
EP0256715A2 (en) * 1986-08-18 1988-02-24 Siliconix Limited Temperature sensing apparatus
EP0256715A3 (en) * 1986-08-18 1989-08-09 Siliconix Limited Temperature sensing apparatus
CN112964389A (en) * 2021-05-10 2021-06-15 国网江西省电力有限公司电力科学研究院 Elbow type cable head fault early warning method and system based on distributed temperature measurement

Also Published As

Publication number Publication date
CH413116A (en) 1966-05-15

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