GB1092803A - Improvements in or relating to mass spectrometers - Google Patents

Improvements in or relating to mass spectrometers

Info

Publication number
GB1092803A
GB1092803A GB23023/64A GB2302364A GB1092803A GB 1092803 A GB1092803 A GB 1092803A GB 23023/64 A GB23023/64 A GB 23023/64A GB 2302364 A GB2302364 A GB 2302364A GB 1092803 A GB1092803 A GB 1092803A
Authority
GB
United Kingdom
Prior art keywords
shaft
sample
source
plunger
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB23023/64A
Inventor
John Stewart Heath
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB23023/64A priority Critical patent/GB1092803A/en
Priority to US460392A priority patent/US3440417A/en
Priority to DE1965A0049377 priority patent/DE1573970A1/en
Priority to FR19421A priority patent/FR1436995A/en
Publication of GB1092803A publication Critical patent/GB1092803A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

1,092,803. Ion sources. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. May 24, 1965 [June 3, 1964], No. 23023/64. Heading H1D. A vacuum lock system for the insertion and withdrawal of samples into and from the ion source of a mass spectrometer and for the insertion and withdrawal of different ionisation chambers 36 comprises a rotary valve 77 having a transverse bore 77A through which a sample carrying shaft may be passed, the transverse bore being permanently in communication with a pump 105. Sealing members 83, 85 on either side of the valve are biased towards the valve by springs 87, 97 and have parts 83A, 85A inwardly biased by encircling springs 89, 99 to engage the shaft (not shown) when inserted. An outer seal is provided by member 113 and the space between outer seal 113 and seal 85 is connected to pump 111. A sample insertion shaft in one embodiment, Fig. 4 (not shown), carries an alumina pillar containing a heater. The sample is in a container which is placed in a cavity in a solid rod mounted as an extension of the alumina pillar. In another embodiment, Fig. 5 (not shown), a shaft has an inner tube containing a magnetic plunger and a sample tube connected to the plunger, and a translatable magnet by means of which the plunger and thus the sample tube can be inserted into or withdrawn from the shaft. The shaft also contains a heater and a cooling pipe and carries a fixed reference sample holder. When the shaft is inserted through the vacuum lock into the ion source the test sample can be evaporated into the arc chamber of the source and the reference sample into a chamber behind the ion repeller plate of the source. Gaseous samples may also be introduced into the arc chamber of the source from a fixed inlet.
GB23023/64A 1964-06-03 1964-06-03 Improvements in or relating to mass spectrometers Expired GB1092803A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB23023/64A GB1092803A (en) 1964-06-03 1964-06-03 Improvements in or relating to mass spectrometers
US460392A US3440417A (en) 1964-06-03 1965-06-01 Vacuum lock sample insertion probe for a mass spectrometer
DE1965A0049377 DE1573970A1 (en) 1964-06-03 1965-06-02 Vacuum lock and probe for introducing samples into a mass spectrometer
FR19421A FR1436995A (en) 1964-06-03 1965-06-03 Improvements in mass spectrometers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB23023/64A GB1092803A (en) 1964-06-03 1964-06-03 Improvements in or relating to mass spectrometers

Publications (1)

Publication Number Publication Date
GB1092803A true GB1092803A (en) 1967-11-29

Family

ID=10188857

Family Applications (1)

Application Number Title Priority Date Filing Date
GB23023/64A Expired GB1092803A (en) 1964-06-03 1964-06-03 Improvements in or relating to mass spectrometers

Country Status (4)

Country Link
US (1) US3440417A (en)
DE (1) DE1573970A1 (en)
FR (1) FR1436995A (en)
GB (1) GB1092803A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU54494A1 (en) * 1967-09-18 1969-06-24
US3578969A (en) * 1968-11-25 1971-05-18 Electronic Associates Solid sample inlet system for a mass spectrometer
DE1900569C3 (en) * 1969-01-07 1976-01-08 Varian Mat Gmbh, 2800 Bremen Solid-state ion source
US3590243A (en) * 1969-06-30 1971-06-29 Avco Corp Sample insertion vacuum lock and probe assembly for mass spectrometers
GB2150289A (en) * 1983-11-22 1985-06-26 Prutec Ltd Introduction of samples into a mass spectrometer
US4791291A (en) * 1986-07-14 1988-12-13 The Dow Chemical Company Mass spectrometer sampling system for a liquid stream
EP0297548B1 (en) * 1987-06-29 1994-06-01 Sumitomo Electric Industries Limited Sample holder for glow discharge mass spectrometer
EP3392902A4 (en) * 2015-12-17 2018-12-26 Shimadzu Corporation Ion analyzing apparatus
CN114999892A (en) * 2022-06-09 2022-09-02 广州禾信仪器股份有限公司 Differential vacuum system control device and differential vacuum system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3117223A (en) * 1961-06-09 1964-01-07 Atlas Werke Ag Sample insertion vacuum lock for a mass spectrometer
GB957917A (en) * 1961-09-04 1964-05-13 Ass Elect Ind Improvements relating to mass spectrometer sample insertion devices
US3171958A (en) * 1962-03-30 1965-03-02 Rca Corp Heated specimen holder for the electron microscope

Also Published As

Publication number Publication date
DE1573970A1 (en) 1970-04-16
FR1436995A (en) 1966-04-29
US3440417A (en) 1969-04-22

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