GB1032565A - Improvements in and relating to attenuated total reflection spectrometers - Google Patents

Improvements in and relating to attenuated total reflection spectrometers

Info

Publication number
GB1032565A
GB1032565A GB45905/63A GB4590563A GB1032565A GB 1032565 A GB1032565 A GB 1032565A GB 45905/63 A GB45905/63 A GB 45905/63A GB 4590563 A GB4590563 A GB 4590563A GB 1032565 A GB1032565 A GB 1032565A
Authority
GB
United Kingdom
Prior art keywords
block
face
total reflection
relating
entrance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB45905/63A
Inventor
Jamal Tadayon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GEN INSTR Co Ltd
Original Assignee
GEN INSTR Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GEN INSTR Co Ltd filed Critical GEN INSTR Co Ltd
Priority to GB45905/63A priority Critical patent/GB1032565A/en
Publication of GB1032565A publication Critical patent/GB1032565A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection

Abstract

1,032,565. Optical apparatus. GENERAL INSTRUMENTS CO. Ltd. Nov. 20, 1964 [Nov. 20, 1963], No. 45905/63. Heading G2J. An optical fitting for an alternated total reflection spectrometer comprises a block 1 with one or more surfaces 2-4 to receive a sample to be investigated and means for directing a beam of radiation on to the block so that the beam is incident normally on an entrance face 5, undergoes total internal reflection at two parallel plane surfaces 2, 3, and at perpendicular plane surface 4 at the remote end of the block 1 to emerge normally through an exit surface 5 at the same end of the block as the entrance face. As shown the face 5 is hemicylindrical and the radiation is preferably passed through the face so as to impinge on the side surfaces at 45 degrees. In a modification, Fig. 3, not shown, the entrance and exit surfaces are plane.
GB45905/63A 1963-11-20 1963-11-20 Improvements in and relating to attenuated total reflection spectrometers Expired GB1032565A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB45905/63A GB1032565A (en) 1963-11-20 1963-11-20 Improvements in and relating to attenuated total reflection spectrometers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB45905/63A GB1032565A (en) 1963-11-20 1963-11-20 Improvements in and relating to attenuated total reflection spectrometers

Publications (1)

Publication Number Publication Date
GB1032565A true GB1032565A (en) 1966-06-08

Family

ID=10439049

Family Applications (1)

Application Number Title Priority Date Filing Date
GB45905/63A Expired GB1032565A (en) 1963-11-20 1963-11-20 Improvements in and relating to attenuated total reflection spectrometers

Country Status (1)

Country Link
GB (1) GB1032565A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3211725A1 (en) * 1981-04-28 1982-11-11 Shimadzu Corp., Kyoto DETECTOR FOR USE IN OPTICAL MEASURING DEVICES
GB2234062A (en) * 1989-05-05 1991-01-23 Spectra Tech Inc Multiple internal reflection probe for sample analysis
WO1992019956A1 (en) * 1991-04-26 1992-11-12 British Technology Group Ltd. Optical probe heads

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3211725A1 (en) * 1981-04-28 1982-11-11 Shimadzu Corp., Kyoto DETECTOR FOR USE IN OPTICAL MEASURING DEVICES
GB2234062A (en) * 1989-05-05 1991-01-23 Spectra Tech Inc Multiple internal reflection probe for sample analysis
WO1992019956A1 (en) * 1991-04-26 1992-11-12 British Technology Group Ltd. Optical probe heads
US5440126A (en) * 1991-04-26 1995-08-08 British Technology Group Ltd. Optical probe heads

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