GB1025177A - An etchant for semiconductor materials - Google Patents
An etchant for semiconductor materialsInfo
- Publication number
- GB1025177A GB1025177A GB43790/62A GB4379062A GB1025177A GB 1025177 A GB1025177 A GB 1025177A GB 43790/62 A GB43790/62 A GB 43790/62A GB 4379062 A GB4379062 A GB 4379062A GB 1025177 A GB1025177 A GB 1025177A
- Authority
- GB
- United Kingdom
- Prior art keywords
- methyl alcohol
- bromine
- chlorine
- etched
- etchant
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
- C23F1/16—Acidic compositions
- C23F1/30—Acidic compositions for etching other metallic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
- C23F3/04—Heavy metals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/60—Wet etching
- H10P50/64—Wet etching of semiconductor materials
- H10P50/642—Chemical etching
- H10P50/646—Chemical etching of Group III-V materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/402—Chemomechanical polishing [CMP] of semiconductor materials
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Weting (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- ing And Chemical Polishing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US163094A US3262825A (en) | 1961-12-29 | 1961-12-29 | Method for etching crystals of group iii(a)-v(a) compounds and etchant used therefor |
| US163126A US3156596A (en) | 1961-12-29 | 1961-12-29 | Method for polishing gallium arsenide |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1025177A true GB1025177A (en) | 1966-04-06 |
Family
ID=26859347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB43790/62A Expired GB1025177A (en) | 1961-12-29 | 1962-11-20 | An etchant for semiconductor materials |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3262825A (enExample) |
| BE (1) | BE625119A (enExample) |
| DE (2) | DE1278801B (enExample) |
| GB (1) | GB1025177A (enExample) |
| NL (1) | NL286503A (enExample) |
| SE (1) | SE307492B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4428795A (en) | 1982-06-18 | 1984-01-31 | Wacker-Chemitronic Gesellschaft Fur Electronik-Grundstoffe Mbh | Process for polishing indium phosphide surfaces |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1200422B (de) * | 1963-07-20 | 1965-09-09 | Siemens Ag | Verfahren zur Herstellung duennschichtiger magnetfeldabhaengiger Halbleiterkoerper, insbesondere Hallgeneratoren, aus Verbindungen des Typs A B |
| US3436284A (en) * | 1965-04-23 | 1969-04-01 | Bell Telephone Labor Inc | Method for the preparation of atomically clean silicon |
| US3629023A (en) * | 1968-07-17 | 1971-12-21 | Minnesota Mining & Mfg | METHOD OF CHEMICALLY POLISHING CRYSTALS OF II(b){14 VI(a) SYSTEM |
| US3772100A (en) * | 1971-06-30 | 1973-11-13 | Denki Onkyo Co Ltd | Method for forming strips on semiconductor device |
| US3775201A (en) * | 1971-10-26 | 1973-11-27 | Ibm | Method for polishing semiconductor gallium phosphide planar surfaces |
| FR2168936B1 (enExample) * | 1972-01-27 | 1977-04-01 | Labo Electronique Physique | |
| GB1446592A (en) * | 1973-01-09 | 1976-08-18 | English Electric Valve Co Ltd | Dynode structures |
| US4138262A (en) * | 1976-09-20 | 1979-02-06 | Energy Conversion Devices, Inc. | Imaging film comprising bismuth image-forming layer |
| US4184908A (en) * | 1978-10-05 | 1980-01-22 | The United States Of America As Represented By The Secretary Of The Navy | Method for polishing cadmium sulfide semiconductors |
| US4380490A (en) * | 1981-03-27 | 1983-04-19 | Bell Telephone Laboratories, Incorporated | Method of preparing semiconductor surfaces |
| DE3237235C2 (de) * | 1982-10-07 | 1986-07-10 | Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen | Verfahren zum Polieren von III-V-Halbleiteroberflächen |
| US4600469A (en) * | 1984-12-21 | 1986-07-15 | Honeywell Inc. | Method for polishing detector material |
| US7624742B1 (en) | 2004-04-05 | 2009-12-01 | Quantum Global Technologies, Llc. | Method for removing aluminum fluoride contamination from aluminum-containing surfaces of semiconductor process equipment |
| CN110788739A (zh) * | 2019-10-31 | 2020-02-14 | 云南北方昆物光电科技发展有限公司 | 一种锑化铟单晶片的抛光方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2640767A (en) * | 1951-02-12 | 1953-06-02 | Dow Chemical Co | Etching |
| US2806807A (en) * | 1955-08-23 | 1957-09-17 | Gen Electric | Method of making contacts to semiconductor bodies |
| US2827367A (en) * | 1955-08-30 | 1958-03-18 | Texas Instruments Inc | Etching of semiconductor materials |
| US2849296A (en) * | 1956-01-23 | 1958-08-26 | Philco Corp | Etching composition and method |
| NL111788C (enExample) * | 1956-06-18 | |||
| US2927011A (en) * | 1956-07-26 | 1960-03-01 | Texas Instruments Inc | Etching of semiconductor materials |
| US2984897A (en) * | 1959-01-06 | 1961-05-23 | Bell Telephone Labor Inc | Fabrication of semiconductor devices |
| US3031363A (en) * | 1959-09-24 | 1962-04-24 | Sylvania Electric Prod | Method and apparatus for treating bodies of semiconductor material |
| US3114088A (en) * | 1960-08-23 | 1963-12-10 | Texas Instruments Inc | Gallium arsenide devices and contact therefor |
| US3156596A (en) * | 1961-12-29 | 1964-11-10 | Bell Telephone Labor Inc | Method for polishing gallium arsenide |
-
1961
- 1961-12-29 US US163094A patent/US3262825A/en not_active Expired - Lifetime
-
1962
- 1962-11-20 GB GB43790/62A patent/GB1025177A/en not_active Expired
- 1962-11-21 BE BE625119D patent/BE625119A/xx unknown
- 1962-12-10 NL NL286503D patent/NL286503A/xx unknown
- 1962-12-14 DE DEW33527A patent/DE1278801B/de active Pending
- 1962-12-19 DE DE19621546063 patent/DE1546063B2/de active Pending
- 1962-12-28 SE SE14116/62A patent/SE307492B/xx unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4428795A (en) | 1982-06-18 | 1984-01-31 | Wacker-Chemitronic Gesellschaft Fur Electronik-Grundstoffe Mbh | Process for polishing indium phosphide surfaces |
Also Published As
| Publication number | Publication date |
|---|---|
| SE307492B (enExample) | 1969-01-07 |
| DE1546063B2 (de) | 1971-07-29 |
| US3262825A (en) | 1966-07-26 |
| BE625119A (enExample) | 1963-03-15 |
| NL286503A (enExample) | 1965-02-10 |
| DE1278801B (de) | 1968-10-26 |
| DE1546063A1 (de) | 1969-10-23 |
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