GB1025091A - Method and apparatus for compensating an x-ray analyzing system - Google Patents

Method and apparatus for compensating an x-ray analyzing system

Info

Publication number
GB1025091A
GB1025091A GB1196/63A GB119663A GB1025091A GB 1025091 A GB1025091 A GB 1025091A GB 1196/63 A GB1196/63 A GB 1196/63A GB 119663 A GB119663 A GB 119663A GB 1025091 A GB1025091 A GB 1025091A
Authority
GB
United Kingdom
Prior art keywords
compensating
analyzing system
ray analyzing
ray
analyzing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1196/63A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of GB1025091A publication Critical patent/GB1025091A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB1196/63A 1962-03-05 1963-01-10 Method and apparatus for compensating an x-ray analyzing system Expired GB1025091A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US177549A US3150261A (en) 1962-03-05 1962-03-05 Method for compensating an X-ray analyzing system

Publications (1)

Publication Number Publication Date
GB1025091A true GB1025091A (en) 1966-04-06

Family

ID=22649030

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1196/63A Expired GB1025091A (en) 1962-03-05 1963-01-10 Method and apparatus for compensating an x-ray analyzing system

Country Status (4)

Country Link
US (1) US3150261A (enrdf_load_stackoverflow)
DE (1) DE1498758A1 (enrdf_load_stackoverflow)
GB (1) GB1025091A (enrdf_load_stackoverflow)
NL (1) NL289708A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2196113A (en) * 1986-09-12 1988-04-20 Nat Res Dev Ore analysis

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3412249A (en) * 1964-08-04 1968-11-19 Industrial Nucleonics Corp Backscatter thickness measuring gauge utilizing different energy levels of bremsstrahlung and two ionization chambers
GB1110284A (en) * 1965-06-22 1968-04-18 Nat Res Dev Improvements in or relating to the continuous analysis of the solid component of a slurry
FR1569830A (enrdf_load_stackoverflow) * 1967-05-05 1969-06-06
FR95959E (fr) * 1967-09-20 1972-05-19 Nat Res Dev Procédé et dispositif pour déterminer la grosseur de particules solides.
US3746874A (en) * 1969-10-08 1973-07-17 Yokogawa Electric Works Ltd Apparatus using x-rays for measuring the content of an element having a higher mass absorption coefficient than hydrogen and carbon in hydrocarbon compounds
US3731091A (en) * 1971-06-30 1973-05-01 Combustion Eng Method and means for monitoring the quantity of dispersed oil in water with means for wiping the sample cell
US3752979A (en) * 1971-09-02 1973-08-14 Kennecott Copper Corp Method and apparatus for matrix-effect-compensated continuous x-ray analysis of streams of solid particles
JPS6417369A (en) * 1987-07-10 1989-01-20 Jeol Ltd Spectrum display unit in x-ray microanalyzer and the like
USH922H (en) 1988-08-01 1991-05-07 United States Of America Method for analyzing materials using x-ray fluorescence
EA202092309A1 (ru) * 2018-04-20 2021-02-05 Оутотек (Финлэнд) Ой Рентгеновский флуоресцентный анализатор с несколькими каналами детектирования и способ выполнения флуоресцентного анализа
CA3097462C (en) 2018-04-20 2023-09-05 Outotec (Finland) Oy X-ray fluorescence analyser, and a method for performing x-ray fluorescence analysis
FI20206176A1 (en) 2018-04-20 2020-11-20 Outotec Finland Oy X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry
CA3097466A1 (en) 2018-04-20 2019-10-24 Outotec (Finland) Oy X-ray fluorescence analyzer, and a method for performing x-ray fluorescence analysis

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2316239A (en) * 1941-08-20 1943-04-13 Texas Co Method and apparatus for determining density of fluids
US2442752A (en) * 1945-04-20 1948-06-08 Bell Telephone Labor Inc Method of and apparatus for examining quartz
US2939960A (en) * 1955-11-21 1960-06-07 Exxon Research Engineering Co Method of quality control of catalysts by radiation scatter measurement
US2897367A (en) * 1956-04-25 1959-07-28 Applied Res Lab Inc Spectroscopy
US2959932A (en) * 1957-02-20 1960-11-15 Industrial Nucleonics Corp Density control apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2196113A (en) * 1986-09-12 1988-04-20 Nat Res Dev Ore analysis
GB2196113B (en) * 1986-09-12 1990-12-12 Nat Res Dev Ore analysis
US5020084A (en) * 1986-09-12 1991-05-28 National Research Development Corporation Ore analysis

Also Published As

Publication number Publication date
DE1498758A1 (de) 1968-11-28
US3150261A (en) 1964-09-22
NL289708A (enrdf_load_stackoverflow)

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