US3752979A - Method and apparatus for matrix-effect-compensated continuous x-ray analysis of streams of solid particles - Google Patents
Method and apparatus for matrix-effect-compensated continuous x-ray analysis of streams of solid particles Download PDFInfo
- Publication number
- US3752979A US3752979A US00177413A US3752979DA US3752979A US 3752979 A US3752979 A US 3752979A US 00177413 A US00177413 A US 00177413A US 3752979D A US3752979D A US 3752979DA US 3752979 A US3752979 A US 3752979A
- Authority
- US
- United States
- Prior art keywords
- streams
- analyzer
- coarse
- density
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Definitions
- an X-ray fluorescence spectroscope is calibrated for a specific particle size and the sample of material subjected to analysis is as close as possible to that size.
- correction factors are obtained from calibration curves prepared for different particle sizes, and are applied mathematically on a statistical basis after a separate screen analysis of the sample stream has been make.
- OBJECTIVE In the making of the present invention, it was a primary object to provide automatic compensation for the matrix effect in X-ray fluorescence spectrogaphic analysis of a continuously flowing sample stream of the material concerned and to provide a matrix-effectcompensated readout.
- the sample stream of solid particles to be subjected to analysis is separated into a relatively tine fraction and a relatively coarse fraction, advantageously by means of a particle size classifier such as a cyclone, and the separate streams are sensed to provide respective continuous signals rep resentative of rate of flow. These signals are compared with each other, as by means of a standard electronic comparator, to provide a resultant continuous signal for feeding into the control circuitry of the X-ray analyzer as a corrective factor for the matrix effect. Corrected in this manner, the readout from the X-ray analyzer provides substantially accurate information as to chemical constituency of the material concerned.
- FIGURE of the drawing is a flowsheet showing the best mode presently contemplated of carrying out the invention.
- the flow meters 16 may be of any suitable type.
- a very satisfactory meter for the purpose is of electromagnetic type, e.g., as manufactured by Fischer & Porter Co., utilizing voltage induced in the slurry when flowing in a non-magnetic tube placed in a magnetic field, the voltage induced being proportional to the flow rate and the field intensity.
- One of the flow meters 16 delivers a continuous electrical signal, representative of the rate of flow of the fines fraction, to an electronic comparator, which may be of any suitable type, e.g., Type 19-501 manufactured by the Control Products Division of Bell 8:. Ho-
- a resultant continuous electrical signal, representative of the ratio of the flow rates of fine and coarse fractions, is transmitted to standard X- ray analyzer control circuitry 20, which is customarily part of the X-ray analyzer as purchased commercially.
- the operating unit of the X-ray analyzer includes a scintillometer for obtaining X-ray fluorescence information from the X-rayed sample stream passing through the assay channel of the X-ray analyzer and for providing an electrical signal proportional to the emissions given off by the excited sample.
- the electrical signal from the scintillometer is fed to an amplifier in control circuitry 20 where it is amplified and given a his: level by reason of the connection to the amplifier of separate bias networks (designated for sake of convenience "first" and second,” respectively), which supply voltages proportional to the density of the sample stream and to the ratio of the flow rates of the coarse and. tine fractions, respectively.
- the resulting signal is then applied to readout means, such as an analog or digital indicator, which indicates the percent of desired particular metal present in the sample.
- the density of the sample stream being fed to the density channel of the X-ray analyzer is measured by the density gauge of the X-ray analyzer.
- An electrical signal proportional to the measured density is applied to the first bias network in control circuitry 20, which, in turn, provides a bias signal to the amplifier.
- the second bias network also provides within the standard control circuitry 20, is provided with terminals to receive external connections.
- the resultant output signal from the electronic comparator is fed directly to such second bias network by way of these terminals (not specifically shown), and a second bias signal is fed into the amplifier from such second bias network.
- the signal from the scintillometer is thus provided with a bias level, which is effectively the sum of the first and second bias signals.
- the first bias signal is proportional to the measured density of the fines fraction .14, which is the stream that is fed to the density channel of the X-ray analyzer.
- the second bias signal is proportional to the electronic comparator output signal, which is itself proportional to the relative flow rates of the fines and coarse fractions from the classifier.
- the final bias level which is essentially the sume of the first and second bias signals, therefore takes into account the different particle sizes present in the analyzed sample.
- the application of this bias level to the signal from the scintillometer provides a signal that is corrected for the matrix effect of the analyzed sample, and, when applied to the read-out means, produces a substantially accurate indication of the chemical consistituency of the sample.
- the density gauge of the X-ray analyzer operating unit also delivers an electrical signal representative of density of the fines fraction to the density controller in the control circuit 20.
- Such controller provides a signal to a make-up water control valve 21 so an amount of water required to maintain a constant slurry density and constant hydraulic head is added to the sample stream. This makes for optimum performance of the classifier.
- a method for automaticaliy producing a continuous, matrix-effect-compensated, output signal from a standard X-ray fluorescence spectrographic analyzer having control circuitry and a density channel which comprises dividing a sample stream, that is substantially identical in consistituency to the sample stream being analyzed, into relatively coarse and relatively fine streams; sensing the relative mass-flows of the respective coarse and fine streams; comparing such relative mass flows with each other to obtain a resultant signal; applying said resultant signal to the control circuitry of said analyzer as a correction factor; and feeding only one of said fine and coarse streams to the density channel of said analyzer.
- apparatus for automatically producing a continuous matrix-effect-compensated, output signal from said analyzer comprising means for dividing a sample stream into two separate streams that are substantially identical in constituency, means for sending one of said sample streams through said analyzer for analysis, means for separating the other of said sample streams into relatively coarse and relatively fine sample streams; means for sensing the mass flows of the said coarse and said fine sample streams respectively, and for producing respective signals representative thereof; means for comparing with each other the said signal representations of such mass flows and for producing a resultant signal indicative of the ratio of one to the other; means for feeding said resultant signal to the control circuitry of said analyzer as a correction factor; and means for feeding only one of the relatively coarse and relatively fine streams to the density channel of said analyzer.
- a combination in accordance with claim 4, wherein the means for comparing the signals representative of the mass flows of the coarse and fine sample streams and for producing the resultant signal is an electronic comparator.
- the means for maintaining a constant density and constant static head comprise a mixing vessel, and means for adding make-up water to said mixing vessel.
- the means for adding make-up water comprises an electrically operated valve responsive to electrical signals from the density channel of the X-ray analyzer.
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (9)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US17741371A | 1971-09-02 | 1971-09-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
US3752979A true US3752979A (en) | 1973-08-14 |
Family
ID=22648500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US00177413A Expired - Lifetime US3752979A (en) | 1971-09-02 | 1971-09-02 | Method and apparatus for matrix-effect-compensated continuous x-ray analysis of streams of solid particles |
Country Status (1)
Country | Link |
---|---|
US (1) | US3752979A (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2860252A (en) * | 1954-05-07 | 1958-11-11 | Stamicarbon | Coal testing method |
US3150261A (en) * | 1962-03-05 | 1964-09-22 | Gen Electric | Method for compensating an X-ray analyzing system |
US3666943A (en) * | 1967-09-20 | 1972-05-30 | Nat Res Dev | Method of and apparatus for determining the mean size of given particles in a fluid |
-
1971
- 1971-09-02 US US00177413A patent/US3752979A/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2860252A (en) * | 1954-05-07 | 1958-11-11 | Stamicarbon | Coal testing method |
US3150261A (en) * | 1962-03-05 | 1964-09-22 | Gen Electric | Method for compensating an X-ray analyzing system |
US3666943A (en) * | 1967-09-20 | 1972-05-30 | Nat Res Dev | Method of and apparatus for determining the mean size of given particles in a fluid |
Non-Patent Citations (1)
Title |
---|
Performance of an On Stream Radioisotope X Ray Fluorescence Analyser by Carr Brion, Inst. of Mining & Mettalurg June 10/67 pages C 94 C 100. * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US2379158A (en) | Particle size determination | |
AU759426B2 (en) | X-ray fluorescence elemental analyzer | |
US4576736A (en) | Method of predicting and controlling the viscosity of conductive pastes | |
US2766421A (en) | Method and apparatus for geophysical exploration | |
US3150261A (en) | Method for compensating an X-ray analyzing system | |
US3198944A (en) | X-ray emission analyzer with standardizing system and novel switch means | |
CN110161067A (en) | A kind of concentrate tenor measuring method based on Portable X RF | |
US2898466A (en) | Density determining device | |
Bingham et al. | Accuracy of analysis by electrical detection in spark source mass spectrometry | |
Götze et al. | High-resolution cathodoluminescence combined with SHRIMP ion probe measurements of detrital zircons | |
US3752979A (en) | Method and apparatus for matrix-effect-compensated continuous x-ray analysis of streams of solid particles | |
US4088886A (en) | Radiation thickness gauge for sheet material | |
US2590827A (en) | Turbidimeter | |
US3448375A (en) | Process for continuously measuring the quality of an agglomerate | |
US2777111A (en) | Method of geophysical exploration | |
Reed | Determination of Ni, Ga, and Ge in iron meteorites by X‐ray fluorescence analysis | |
Watt | On-stream analysis of metalliferous ore slurries | |
US3745339A (en) | Particle size analysis | |
JPH023138B2 (en) | ||
Salmon | A Simple Multielement-Calibration System for Analysis of Minor and Major Elements in Minerals by Fluorescent X-ray Spectrography | |
US3913009A (en) | Method of inspecting powder-cored electrodes and device for effecting said method | |
Addink | A general method for quantitative spectrochemical analysis:(Preliminary communication) | |
US2478773A (en) | Magnetic measuring device and method | |
Cutmore et al. | Nuclear techniques for on-line analysis in mineral and coal processing | |
RU2584065C1 (en) | Method of calibrating batch x-ray spectrometers |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: KENNECOTT MINING CORPORATION Free format text: CHANGE OF NAME;ASSIGNOR:KENNECOTT CORPORATION;REEL/FRAME:004815/0036 Effective date: 19870220 Owner name: KENNECOTT CORPORATION Free format text: CHANGE OF NAME;ASSIGNOR:KENNECOTT COPPER CORPORATION;REEL/FRAME:004815/0016 Effective date: 19800520 Owner name: KENNECOTT CORPORATION, 200 PUBLIC SQUARE, CLEVELAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:KENNECOTT MINING CORPORATION;REEL/FRAME:004815/0063 Effective date: 19870320 |
|
AS | Assignment |
Owner name: GAZELLE CORPORATION, C/O CT CORPORATION SYSTEMS, C Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:RENNECOTT CORPORATION, A DE. CORP.;REEL/FRAME:005164/0153 Effective date: 19890628 |
|
AS | Assignment |
Owner name: KENNECOTT UTAH COPPER CORPORATION Free format text: CHANGE OF NAME;ASSIGNOR:GAZELLE CORPORATION;REEL/FRAME:005604/0237 Effective date: 19890630 |