GB1010697A - Improvements in or relating to methods for the manufacture of semi-conductive p-n junction diodes and diodes produced thereby - Google Patents

Improvements in or relating to methods for the manufacture of semi-conductive p-n junction diodes and diodes produced thereby

Info

Publication number
GB1010697A
GB1010697A GB4516262A GB4516262A GB1010697A GB 1010697 A GB1010697 A GB 1010697A GB 4516262 A GB4516262 A GB 4516262A GB 4516262 A GB4516262 A GB 4516262A GB 1010697 A GB1010697 A GB 1010697A
Authority
GB
United Kingdom
Prior art keywords
plate
enclosure
diodes
temperature
acid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4516262A
Inventor
Jean Messier
Jean Valin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of GB1010697A publication Critical patent/GB1010697A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02043Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H01L21/02052Wet cleaning only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Weting (AREA)

Abstract

1,010,697. PN diodes. COMMISSARIAT A L'ENERGIE ATOMIQUE. Nov. 29, 1962 [Nov. 29, 1961], No. 45162/62. Drawings to Specification. Heading H1K. A PN junction silicon diode is made by diffusing donor material into a polished silicon plate in a furnace with two enclosures containing the plate and some phosphoric anhydride respectively in a constantly renewed argon atmosphere, the temperature of the first enclosure being increased at the rate of 30‹ C. per minute to between 850‹ and 1000‹ C., at which it remains for less than 4 hours, the second enclosure being at 225‹ C., whereupon the argon atmosphere is replaced by oxygen and the first enclosure temperature is reduced by 20‹ C. per minute, while the phosphoric anhydride is withdrawn, cooling under oxygen being continued until ambient temperature is reached. In the embodiment the silicon plate is cleaned successively in trichlorethylene, acetone and a nitric and hydrofluoric acid mixture then rinsed successively in acetic acid, boiling nitric acid and water. Phosphorus is then diffused into the plate from phosphorus anhydride as outlined above to form a thin N-type region and after withdrawal from the furnace the plate is washed in hydrofluoric acid to remove any oxide film. After etching in a mixture of nitric acid and hydrofluoric acids, a gold or aluminium electrode is applied. The device is then etched to mesa form.
GB4516262A 1961-11-29 1962-11-29 Improvements in or relating to methods for the manufacture of semi-conductive p-n junction diodes and diodes produced thereby Expired GB1010697A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR880395A FR1314516A (en) 1961-11-29 1961-11-29 Semiconductor device manufacturing process and resulting product

Publications (1)

Publication Number Publication Date
GB1010697A true GB1010697A (en) 1965-11-24

Family

ID=8767681

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4516262A Expired GB1010697A (en) 1961-11-29 1962-11-29 Improvements in or relating to methods for the manufacture of semi-conductive p-n junction diodes and diodes produced thereby

Country Status (4)

Country Link
BE (1) BE625484A (en)
FR (1) FR1314516A (en)
GB (1) GB1010697A (en)
LU (1) LU42752A1 (en)

Also Published As

Publication number Publication date
FR1314516A (en) 1963-01-11
BE625484A (en)
LU42752A1 (en) 1963-01-24

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