GB0512945D0 - Method and apparatus for material identification - Google Patents
Method and apparatus for material identificationInfo
- Publication number
- GB0512945D0 GB0512945D0 GBGB0512945.7A GB0512945A GB0512945D0 GB 0512945 D0 GB0512945 D0 GB 0512945D0 GB 0512945 A GB0512945 A GB 0512945A GB 0512945 D0 GB0512945 D0 GB 0512945D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- material identification
- identification
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0512945.7A GB0512945D0 (en) | 2005-06-24 | 2005-06-24 | Method and apparatus for material identification |
| EP06252989A EP1736759A1 (en) | 2005-06-24 | 2006-06-09 | Simulation of X-ray emission spectra for material identification |
| JP2006199982A JP5264061B2 (ja) | 2005-06-24 | 2006-06-23 | 物質同定のための方法及び装置 |
| US11/427,284 US7595489B2 (en) | 2005-06-24 | 2006-06-28 | Method and apparatus for material identification |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0512945.7A GB0512945D0 (en) | 2005-06-24 | 2005-06-24 | Method and apparatus for material identification |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB0512945D0 true GB0512945D0 (en) | 2005-08-03 |
Family
ID=34856121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GBGB0512945.7A Ceased GB0512945D0 (en) | 2005-06-24 | 2005-06-24 | Method and apparatus for material identification |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7595489B2 (https=) |
| EP (1) | EP1736759A1 (https=) |
| JP (1) | JP5264061B2 (https=) |
| GB (1) | GB0512945D0 (https=) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7490009B2 (en) | 2004-08-03 | 2009-02-10 | Fei Company | Method and system for spectroscopic data analysis |
| GB0512945D0 (en) * | 2005-06-24 | 2005-08-03 | Oxford Instr Analytical Ltd | Method and apparatus for material identification |
| CN1995993B (zh) * | 2005-12-31 | 2010-07-14 | 清华大学 | 一种利用多种能量辐射扫描物质的方法及其装置 |
| GB0609744D0 (en) * | 2006-05-16 | 2006-06-28 | Oxford Instr Analytical Ltd | Method of determining the feasibility of a proposed x-ray structure analysis process |
| WO2008101088A2 (en) * | 2007-02-14 | 2008-08-21 | Bruker Biosciences Corporation | Handheld x-ray fluorescence spectrometer |
| GB0712052D0 (en) * | 2007-06-21 | 2007-08-01 | Oxford Instr Molecular Biotool | Method for quantitive analysis of a material |
| US7889335B2 (en) * | 2007-07-18 | 2011-02-15 | Bruker Biosciences Corporation | Handheld spectrometer including wireless capabilities |
| WO2009100404A2 (en) * | 2008-02-06 | 2009-08-13 | Fei Company | A method and system for spectrum data analysis |
| WO2009134924A1 (en) * | 2008-04-30 | 2009-11-05 | Thermo Niton Analyzers Llc | In vivo measurement of trace elements in bone by x-ray fluorescence |
| NL1036886A1 (nl) | 2008-05-12 | 2009-11-16 | Asml Netherlands Bv | A method of measuring a target, an inspection apparatus, a scatterometer, a lithographic apparatus and a data processor. |
| CA2725131C (en) * | 2008-08-20 | 2012-01-03 | Mintek | Identification of platinum group metals |
| GB201102614D0 (en) * | 2011-02-15 | 2011-03-30 | Oxford Instr Nanotechnology Tools Ltd | Material identification using multiple images |
| US11219927B2 (en) | 2011-06-29 | 2022-01-11 | Minesense Technologies Ltd. | Sorting materials using pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods |
| US9316537B2 (en) | 2011-06-29 | 2016-04-19 | Minesense Technologies Ltd. | Sorting materials using a pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods |
| EP3698889A1 (en) | 2011-06-29 | 2020-08-26 | Minesense Technologies Ltd. | Extracting mined ore, minerals or other materials using sensor-based sorting |
| FR2995688B1 (fr) * | 2012-09-20 | 2014-10-10 | Commissariat Energie Atomique | Procede d'analyse par diffractometrie et diffractometre associe, particulierement adaptes a des echantillons comportant plusieurs couches de materiaux |
| WO2013163759A1 (en) | 2012-05-01 | 2013-11-07 | Minesense Technologies Ltd. | High capacity cascade-type mineral sorting machine and method |
| GB2502307A (en) * | 2012-05-22 | 2013-11-27 | Kromek Ltd | Radiation Detection |
| US8735815B2 (en) | 2012-06-22 | 2014-05-27 | Edax, Inc. | Method and apparatus for electron pattern imaging |
| US8664595B2 (en) | 2012-06-28 | 2014-03-04 | Fei Company | Cluster analysis of unknowns in SEM-EDS dataset |
| US9188555B2 (en) | 2012-07-30 | 2015-11-17 | Fei Company | Automated EDS standards calibration |
| US8937282B2 (en) | 2012-10-26 | 2015-01-20 | Fei Company | Mineral identification using mineral definitions including variability |
| US9091635B2 (en) | 2012-10-26 | 2015-07-28 | Fei Company | Mineral identification using mineral definitions having compositional ranges |
| US9778215B2 (en) * | 2012-10-26 | 2017-10-03 | Fei Company | Automated mineral classification |
| US9048067B2 (en) | 2012-10-26 | 2015-06-02 | Fei Company | Mineral identification using sequential decomposition into elements from mineral definitions |
| US9244028B2 (en) | 2012-11-07 | 2016-01-26 | Tribogenics, Inc. | Electron excited x-ray fluorescence device |
| US9194829B2 (en) | 2012-12-28 | 2015-11-24 | Fei Company | Process for performing automated mineralogy |
| US11187692B2 (en) | 2014-06-18 | 2021-11-30 | Texas Tech University System | Enhanced chemical characterization of solid matrices using x-ray fluorescence and optical color reflectance |
| US10697953B2 (en) * | 2014-06-18 | 2020-06-30 | Texas Tech University System | Portable apparatus for liquid chemical characterization |
| CN112536242B (zh) | 2014-07-21 | 2023-08-04 | 感矿科技有限公司 | 来自废物矿物的粗矿石矿物的高容量分离 |
| US9884346B2 (en) | 2014-07-21 | 2018-02-06 | Minesense Technologies Ltd. | High capacity separation of coarse ore minerals from waste minerals |
| FR3030043B1 (fr) * | 2014-12-12 | 2017-12-22 | Commissariat Energie Atomique | Procede d'etude d'une zone d'un objet pour en determiner une epaisseur massique et une composition en utilisant un faisceau d'electrons et des mesures d'intensite d'un rayonnement x |
| JP6503813B2 (ja) * | 2015-03-19 | 2019-04-24 | 日本電気株式会社 | 識別装置、識別方法およびトレーサビリティシステム |
| US9899185B1 (en) * | 2015-04-21 | 2018-02-20 | Applied Materials Israel Ltd. | Resolving ambiguities in an energy spectrum |
| CN106353828B (zh) * | 2015-07-22 | 2018-09-21 | 清华大学 | 在安检系统中估算被检查物体重量的方法和装置 |
| JP6377582B2 (ja) * | 2015-08-06 | 2018-08-22 | 株式会社リガク | X線分析の操作ガイドシステム、操作ガイド方法、及び操作ガイドプログラム |
| JP6637306B2 (ja) * | 2015-12-17 | 2020-01-29 | 日本電子株式会社 | 分析方法および分光装置 |
| JP6638537B2 (ja) * | 2016-04-21 | 2020-01-29 | 株式会社島津製作所 | 試料解析システム |
| US10300551B2 (en) * | 2016-11-14 | 2019-05-28 | Matthew Fagan | Metal analyzing plasma CNC cutting machine and associated methods |
| JP6683111B2 (ja) | 2016-11-28 | 2020-04-15 | 株式会社島津製作所 | 試料解析システム |
| EP3477289A1 (en) * | 2017-10-30 | 2019-05-01 | FEI Company | X-ray spectroscopy in a charged particle microscope |
| US10728462B2 (en) * | 2018-10-08 | 2020-07-28 | Pixart Imaging Inc. | Image sensor, image sensing system, image sensing method and material recognition system |
| JP7153324B2 (ja) * | 2018-10-25 | 2022-10-14 | 国立研究開発法人日本原子力研究開発機構 | 元素分析方法 |
| US11449708B2 (en) * | 2018-12-06 | 2022-09-20 | Industry Academy Cooperation Foundation Of Sejong University | Method of identification and analysis for materials |
| JP7228599B2 (ja) * | 2018-12-14 | 2023-02-24 | 株式会社堀場製作所 | X線分析装置、x線分析システム、分析方法、及びプログラム |
| EP3671485B1 (en) * | 2018-12-21 | 2023-05-24 | Dassault Systèmes | Method for retrieving similar virtual material appearances |
| JP2020153738A (ja) * | 2019-03-19 | 2020-09-24 | 住友金属鉱山株式会社 | 試料に含まれる鉱物の存在比率に関するデータ取得方法 |
| EP3825681B1 (en) * | 2019-11-20 | 2025-03-12 | Bruker Nano GmbH | Method for determining a material composition |
| WO2021243360A1 (en) * | 2020-05-29 | 2021-12-02 | Lam Research Corporation | Automated visual-inspection system |
| AT524288B1 (de) * | 2020-09-16 | 2024-05-15 | Gatan Inc | Computergestütztes Verfahren zur Bestimmung eines Elementanteiles eines Bestimmungselementes kleiner Ordnungszahl, insbesondere eines Li-Anteiles, und Vorrichtung zur Datenverarbeitung hierzu |
| CN113203764A (zh) * | 2021-05-07 | 2021-08-03 | 北京科技大学 | 一种利用扫描电镜及能谱仪的材料组织定量分析系统 |
| US20240339293A1 (en) * | 2021-07-23 | 2024-10-10 | Oxford Instruments Nanotechnology Tools Limited | Improved navigation for electron microscopy |
| US12345667B2 (en) * | 2021-10-11 | 2025-07-01 | Schlumberger Technology Corporation | X-ray fluorescence spectroscopy analysis |
| WO2023087118A1 (en) | 2021-11-22 | 2023-05-25 | Minesense Technologies Ltd. | Compositional multispectral and hyperspectral imaging systems for mining shovels and associated methods |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4260885A (en) * | 1978-02-24 | 1981-04-07 | Albert Richard D | Selectable wavelength X-ray source, spectrometer and assay method |
| JPS63108253A (ja) * | 1986-10-27 | 1988-05-13 | Hitachi Ltd | 物質同定装置 |
| JP2853261B2 (ja) * | 1989-05-16 | 1999-02-03 | 三菱マテリアル株式会社 | 金属分析方法および分析装置 |
| US5299138A (en) * | 1991-08-09 | 1994-03-29 | The United States Of America As Represented By The Secretary Of Commerce | Desk top spectrum analyzer |
| US6118850A (en) * | 1997-02-28 | 2000-09-12 | Rutgers, The State University | Analysis methods for energy dispersive X-ray diffraction patterns |
| JP3876070B2 (ja) * | 1998-04-16 | 2007-01-31 | 日本電子株式会社 | 表面分析機器による分析元素の同定方法 |
| US6140643A (en) * | 1999-03-09 | 2000-10-31 | Exxonmobil Upstream Research Company | Method for identification of unknown substances |
| JP2001305081A (ja) * | 2000-04-26 | 2001-10-31 | Nippon Light Metal Co Ltd | 検量線を用いたepma定量分析法 |
| JP2002131251A (ja) * | 2000-10-20 | 2002-05-09 | Seiko Instruments Inc | X線分析装置 |
| US6675106B1 (en) * | 2001-06-01 | 2004-01-06 | Sandia Corporation | Method of multivariate spectral analysis |
| WO2004034044A1 (en) * | 2002-10-08 | 2004-04-22 | Applied Materials Israel, Ltd. | Methods and systems for process monitoring using x-ray emission |
| JP2004151045A (ja) * | 2002-11-01 | 2004-05-27 | Hitachi High-Technologies Corp | 電子顕微鏡またはx線分析装置及び試料の分析方法 |
| US7016462B1 (en) * | 2002-11-08 | 2006-03-21 | Interscience, Inc. | Ionic pre-concentration XRF identification and analysis device, system and method |
| US6924484B1 (en) * | 2002-11-19 | 2005-08-02 | Kla-Tencor Corporation | Void characterization in metal interconnect structures using X-ray emission analyses |
| US6996492B1 (en) * | 2003-03-18 | 2006-02-07 | Kla-Tencor Technologies Corporation | Spectrum simulation for semiconductor feature inspection |
| US7132652B1 (en) * | 2003-03-25 | 2006-11-07 | Kla-Tencor Technologies Corporation | Automatic classification of defects using pattern recognition applied to X-ray spectra |
| JP2005114384A (ja) * | 2003-10-03 | 2005-04-28 | Hitachi High-Technologies Corp | 欠陥の元素分析方法およびその装置 |
| US7166838B1 (en) * | 2005-05-23 | 2007-01-23 | Kla-Tencor Technologies Corporation | X-ray imaging for patterned film measurement |
| GB0512945D0 (en) * | 2005-06-24 | 2005-08-03 | Oxford Instr Analytical Ltd | Method and apparatus for material identification |
-
2005
- 2005-06-24 GB GBGB0512945.7A patent/GB0512945D0/en not_active Ceased
-
2006
- 2006-06-09 EP EP06252989A patent/EP1736759A1/en not_active Ceased
- 2006-06-23 JP JP2006199982A patent/JP5264061B2/ja active Active
- 2006-06-28 US US11/427,284 patent/US7595489B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP1736759A1 (en) | 2006-12-27 |
| US20060291619A1 (en) | 2006-12-28 |
| JP2007003532A (ja) | 2007-01-11 |
| US7595489B2 (en) | 2009-09-29 |
| JP5264061B2 (ja) | 2013-08-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AT | Applications terminated before publication under section 16(1) |